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1. 发明授权

US4636648A Coating quality measuring device 失效
标题翻译：涂层质量测量装置
公开(公告)号：US4636648A
公开(公告)日：1987-01-13
申请号：US777680
申请日：1985-09-19
申请人： Tsuneyuki Egami , Tsutomu Saito , Mitosi Ando , Ryuzou Hori , Takashi Kamo , Kazunori Yoshida
发明人： Tsuneyuki Egami , Tsutomu Saito , Mitosi Ando , Ryuzou Hori , Takashi Kamo , Kazunori Yoshida
IPC分类号： G01N21/57 , G01B11/30 , G01N21/47 , G01N21/84 , G01V9/04
CPC分类号： G01B11/303
摘要： A coating quality measuring device has a pattern plate including one reference pattern portion having a larger pattern width and a plurality of strip pattern portions having different pattern widths which are smaller than that of the reference pattern portion and are decreased in order. The pattern plate is disposed opposite the coated surface. The pattern plate is reflected on the coated surface and a reflected image is formed on an image sensor. The image sensor successively outputs signals each corresponding to the lightness of each pattern portion on a line extending in a width direction of each pattern portion of the reflected image. A computing device calculates a difference between the peak value of the signal level of the output signal corresponding to each strip pattern portion in the reflected image and the signal level of the output signal corresponding to the ground portion, divides the calculated difference by the signal level of the output signal corresponding to the reference pattern portion and detects the pattern width of the strip pattern portion wherein the division value becomes not larger than a predetermined value, thereby to obtain the coating quality of the coated surface.
摘要翻译：涂层质量测量装置具有包括具有较大图案宽度的一个参考图案部分和具有小于参考图案部分的图案宽度不同的多个条形图案部分的图案板，并且依次减小。图案板与涂覆表面相对设置。图案板在涂覆表面上反射，并且在图像传感器上形成反射图像。图像传感器在反射图像的每个图案部分的宽度方向上连续地输出与每个图案部分的亮度相对应的信号。计算装置计算与反射图像中的每个带状图案部分相对应的输出信号的信号电平的峰值与对应于接地部分的输出信号的信号电平之间的差值，将计算出的差除以信号电平并且检测分割值不大于预定值的带状图案部分的图案宽度，从而获得涂覆表面的涂布质量。

2. 发明授权

US4682041A Coating quality measuring device and method 失效
标题翻译：涂层质量测量装置及方法
公开(公告)号：US4682041A
公开(公告)日：1987-07-21
申请号：US777682
申请日：1985-09-19
申请人： Tsuneyuki Egami , Tsutomu Saito , Mitosi Ando , Ryuzou Hori , Takashi Kamo , Kazunori Yoshida
发明人： Tsuneyuki Egami , Tsutomu Saito , Mitosi Ando , Ryuzou Hori , Takashi Kamo , Kazunori Yoshida
IPC分类号： G01N21/57 , G01B11/30 , G01N21/84 , G01N21/86
CPC分类号： G01B11/303
摘要： A coating quality measuring device and a pattern plate including one reference pattern portion having a large pattern width and a plurality of strip pattern portions each having a smaller pattern width. The pattern plate is disposed opposite the coated surface. The pattern plate is reflected off the coated surface and a reflected image is formed on an image sensor. The image sensor successively outputs signals each corresponding to the light level of each strip pattern portion on a line extending in a width direction of each strip pattern portion of the reflected image. A computing device calculates an average signal level of the signals outputted by the image sensor, divides the difference between the average signal level and the signal level of each signal by the signal level of the reference pattern portion and calculates a square average value of the obtained division value to obtain a measure of the coating quality of the coated surface.
摘要翻译：一种涂层质量测量装置和包括具有大图案宽度的一个参考图案部分和每个具有较小图案宽度的多个条形图案部分的图案板。图案板与涂覆表面相对设置。图案板从涂覆表面反射，并且在图像传感器上形成反射图像。图像传感器连续地在与反射图像的每个条图案部分的宽度方向上延伸的线上相应地输出与每个条形图案部分的光级对应的信号。计算装置计算由图像传感器输出的信号的平均信号电平，将平均信号电平与每个信号的信号电平之差除以参考图形部分的信号电平，并计算所获得的平均信号电平分割值以获得涂层表面的涂层质量的量度。

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