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    • 2. 发明授权
    • Cache result register for quick cache information lookup
    • 缓存结果寄存器用于快速缓存信息查找
    • US08572323B2
    • 2013-10-29
    • US12982856
    • 2010-12-30
    • Robert EhrlichKevin C. HeuerRobert A. McGowan
    • Robert EhrlichKevin C. HeuerRobert A. McGowan
    • G06F12/08
    • G06F11/362G06F12/0897
    • Each level of cache within a memory hierarchy of a device is configured with a cache results register (CRR). The caches are coupled to a debugger interface via a peripheral bus. The device is placed in debug mode, and a debugger forwards a transaction address (TA) of a dummy transaction to the device. On receipt of the TA, the device processor forwards the TA via the system bus to the memory hierarchy to initiate an address lookup operation within each level of cache. For each cache in which the TA hits, the cache controller (debug) logic updates the cache's CRR with Hit, Way, and Index values, identifying the physical storage location within the particular cache at which the corresponding instruction/data is stored. The debugger retrieves information about the hit/miss status, the physical storage location and/or a copy of the data via direct requests over the peripheral bus.
    • 高速缓存结果寄存器(CRR)配置设备内存分层结构中的每个级别的高速缓存。 高速缓存通过外围总线耦合到调试器接口。 设备处于调试模式,调试器将虚拟事务的事务地址(TA)转发给设备。 在接收到TA时,设备处理器通过系统总线将TA转发到存储器层次结构,以在每个级别的缓存内启动地址查找操作。 对于TA命中的每个高速缓存,高速缓存控制器(调试)逻辑使用Hit,Way和Index值更新缓存的CRR,从而标识存储相应指令/数据的特定高速缓存内的物理存储位置。 调试器通过外围总线的直接请求检索有关命中/未命中状态,物理存储位置和/或数据副本的信息。
    • 7. 发明授权
    • Apparatus and method for test and debug of a processor/core having advanced power management
    • 具有高级电源管理的处理器/内核的测试和调试的装置和方法
    • US08181067B2
    • 2012-05-15
    • US12321248
    • 2009-01-20
    • Robert A. McGowan
    • Robert A. McGowan
    • G06F11/00
    • G06F11/2242
    • An interface unit is provided in a JTAG test and debug procedure involving a plurality of processor cores. The interface unit includes a TAP unit. A switch unit is coupled to the interface unit and switch units are coupled to each of the plurality of processor/cores. When the processor/cores have advanced power management systems, a sleep inhibit signal can be applied to the processor/core state machine preventing the state machine from entering a lower power state. The parameters of the processor/core can be tested to determine when the test and debug procedures can be implemented. When the (power) parameters are to low to permit test and debug, the test and debug unit can provide a command forcing the state machine into a state for which test and debug procedures can be implemented.
    • 接口单元被提供在涉及多个处理器核心的JTAG测试和调试过程中。 接口单元包括TAP单元。 开关单元耦合到接口单元,并且开关单元耦合到多个处理器/核中的每一个。 当处理器/内核具有先进的电源管理系统时,睡眠抑制信号可以应用于处理器/核心状态机,以防止状态机进入较低功率状态。 可以测试处理器/内核的参数,以确定何时可以实现测试和调试过程。 当(power)参数为低电平以允许测试和调试时,测试和调试单元可以提供一个命令,强制状态机进入可以实现测试和调试过程的状态。
    • 9. 发明授权
    • Apparatus and method for controlling power, clock, and reset during test and debug procedures for a plurality of processor/cores
    • 用于在多个处理器/核心的测试和调试过程期间控制功率,时钟和复位的装置和方法
    • US07536597B2
    • 2009-05-19
    • US11411683
    • 2006-04-26
    • Robert A. McGowan
    • Robert A. McGowan
    • G06F11/00
    • G06F11/2242G06F11/2236G06F11/261
    • An interface unit is provided for use with a JTAG test and debug procedure involving a plurality of processor cores. The interface unit is provided with a logic unit that can translate test and debug commands into control signals. The control signals are applied to a power state machine coupled to a processor/core. The state of the power state machine can thereby be controlled and therefore the parameters of the associated processor/core, i.e., the power and clock parameters of the processor/core. In addition, the logic unit can generate control signals for activating switches, switches that controllably selective apply the TRST signal and the TMS signal to the TAP unit of the processor/core. This capability permits the TAP units of each processor/core to be synchronized.
    • 提供接口单元,用于与涉及多个处理器核心的JTAG测试和调试过程一起使用。 接口单元设置有可将测试和调试命令转换为控制信号的逻辑单元。 控制信号被施加到耦合到处理器/核的电源状态机。 因此可以控制功率状态机的状态,并因此控制相关处理器/核心的参数,即处理器/核心的功率和时钟参数。 此外,逻辑单元可以产生用于激活开关的控制信号,可控地选择性地将TRST信号和TMS信号施加到处理器/核的TAP单元的开关。 该功能允许每个处理器/核心的TAP单元同步。