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    • 9. 发明授权
    • Debug output loosely coupled with processor block
    • 调试输出与处理器块松动耦合
    • US06754599B2
    • 2004-06-22
    • US09740868
    • 2000-12-21
    • Gary L. SwobodaRobert A. McGowan
    • Gary L. SwobodaRobert A. McGowan
    • G01R2500
    • G06F11/3636G06F11/3656
    • An intergrated circuit constructed for easy debug and emulation includes a function clock circuit and an operation circuit operating in synchronism with a function clock. A trace trigger circuit triggers trace operation upon detection of a predetermined condition within the operation circuit. A FIFO buffer receives the trace data which is exported via a trace port. The integrated circuit includes an oscillator clock circuit which may be synchronized with the function clock or a reference clock. The trace trigger circuit and the FIFO input operate on the function clock. The FIFO output and the trace port operate on the oscillator clock. Thus the trace may operate all on the function clock or be split between the function clock and the reference clock. Accordingly, the trace export can operate at a frequency independent of the operation circuit.
    • 构成便于调试和仿真的集成电路包括功能时钟电路和与功能时钟同步工作的操作电路。 跟踪触发电路在检测到运算电路内的预定条件时触发跟踪操作。 FIFO缓冲区接收通过跟踪端口导出的跟踪数据。 集成电路包括可以与功能时钟或参考时钟同步的振荡器时钟电路。 跟踪触发电路和FIFO输入在功能时钟上工作。 FIFO输出和跟踪端口在振荡器时钟上工作。 因此,迹线可以全部在功能时钟上运行,或者在功能时钟和参考时钟之间分配。 因此,轨迹输出可以以与运行电路无关的频率工作。