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1. 发明申请

US20080272481A1 Pin grid array package substrate including slotted pins 审中-公开
标题翻译：引脚格栅阵列封装衬底包括开槽引脚
公开(公告)号：US20080272481A1
公开(公告)日：2008-11-06
申请号：US11800223
申请日：2007-05-04
申请人： Rajendra Dias , Xinyan Zhao
发明人： Rajendra Dias , Xinyan Zhao
IPC分类号： H01L23/48
CPC分类号： H05K3/3426 , H01L23/49811 , H01L24/16 , H01L2224/0554 , H01L2224/05568 , H01L2224/05573 , H01L2224/16225 , H01L2924/00014 , H01L2924/01079 , H01L2924/14 , H01L2924/1433 , H01L2924/15311 , H01L2924/15312 , H05K2201/10318 , H05K2201/1084 , H05K2203/1178 , Y02P70/613 , H01L2224/05599 , H01L2224/0555 , H01L2224/0556
摘要： An electrically conductive pin comprising a pin stem and a pin head attached to the pin stem. The pin head is adapted to be mounted onto a surface of a microelectronic substrate to support the pin stem. The pin head defines at least one slot therein, the at least one slot being configured to allow gases to escape therethrough from a region at an underside of the pin head.
摘要翻译：导电销，其包括销杆和连接到销杆的销头。针头适于安装在微电子衬底的表面上以支撑销杆。销头在其中限定至少一个狭槽，所述至少一个狭槽被构造成允许气体从销头的下侧的区域从其中排出。

2. 发明授权

US07280190B1 Electro-optic time domain reflectometry 有权
标题翻译：电光时域反射仪
公开(公告)号：US07280190B1
公开(公告)日：2007-10-09
申请号：US11472640
申请日：2006-06-21
申请人： Zhiyong Wang , Rajendra Dias , Deepak Goyal
发明人： Zhiyong Wang , Rajendra Dias , Deepak Goyal
IPC分类号： G01N21/00
CPC分类号： G01R15/24
摘要： Apparatuses, methods, and systems associated with and/or having components capable of, isolating defects in microelectronic packages are disclosed herein. In various embodiments, a defect-isolation apparatus may include an optoelectronic module to convert an optical test signal to an electrical test signal and provide the electrical test signal to a device under test; an electro-optic probe including an electro-optic crystal to polarize an optical sampling signal upon application of an electrical test signal reflected from the device under test to the electro-optic crystal; and an output module configured to receive the polarized optical sampling signal, and produce an electrical output signal as a function of time based at least in part on the polarized optical sampling signal, the electrical output signal adapted to facilitate isolation of the location(s) of the defect(s) in the device under test.
摘要翻译：本文公开了与能够分离微电子封装中的缺陷的组件相关联和/或具有组件的设备，方法和系统。在各种实施例中，缺陷隔离装置可以包括光电子模块，用于将光学测试信号转换成电测试信号，并将电测试信号提供给被测设备; 电光探针，其包括电光晶体，以在将从被测器件反射的电测试信号应用于电光晶体时使光采样信号偏振; 以及输出模块，被配置为接收所述偏振光采样信号，并且至少部分地基于所述偏振光采样信号产生作为时间的函数的电输出信号，所述电输出信号适于促进所述位置的隔离，的被测设备中的缺陷。

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