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1. 发明申请

US20080043224A1 SCANNING SIMULTANEOUS PHASE-SHIFTING INTERFEROMETER 有权
标题翻译：扫描同步相移干扰仪
公开(公告)号：US20080043224A1
公开(公告)日：2008-02-21
申请号：US11770582
申请日：2007-06-28
申请人： Raymond Castonguay , Piotr Szwaykowski
发明人： Raymond Castonguay , Piotr Szwaykowski
IPC分类号： G01N21/00
CPC分类号： G01B9/02081 , G01B2290/45 , G01B2290/70 , G01J9/02 , G01J2009/0234 , G01J2009/0261
摘要： An optical measuring apparatus for comprising, in combination, a polarization type interferometer including a polarization type beam splitter in which a polarized beam of light is split into orthogonally polarized reference and test beams, an array of detectors arranged in a line for creating a plurality of phase shifting interferograms, and a scanning device for moving the object in a direction perpendicular to a long axis of the detectors.
摘要翻译：一种光学测量装置，其组合包括偏振型干涉仪，该偏振型干涉仪包括偏振光束分离器，其中偏振光束被分成正交偏振的参考和测试光束，检测器阵列布置成一行，用于创建多个相移干涉图，以及用于沿与检测器的长轴垂直的方向移动物体的扫描装置。

2. 发明申请

US20060146341A1 Interferometric system with reduced vibration sensitivity and realated method 有权
标题翻译：具有降低振动灵敏度和实现方法的干涉测量系统
公开(公告)号：US20060146341A1
公开(公告)日：2006-07-06
申请号：US10536576
申请日：2003-11-26
申请人： Piotr Szwaykowski , Federick Bushroe , Raymond Castonguay
发明人： Piotr Szwaykowski , Federick Bushroe , Raymond Castonguay
IPC分类号： G01B9/02
CPC分类号： G01B9/02072 , G01B9/02057 , G01B9/02081 , G01B2290/70
摘要： A source module (12) generates mutually orthogonally polarized beams of light as emanating from two spatially separated point sources (Sv, Sw) for use in a phase shifting interferometer.
摘要翻译：源模块（12）产生相互垂直偏振的光束，其从两个空间分离的点源（Sv，Sw）发出，用于相移干涉仪。

3. 发明授权

US09581437B2 Interferometric non-contact optical probe and measurement 有权
标题翻译：干涉非接触光学探头和测量
公开(公告)号：US09581437B2
公开(公告)日：2017-02-28
申请号：US14956355
申请日：2015-12-01
申请人： Robert Smythe , Artur Olszak , Piotr Szwaykowski
发明人： Robert Smythe , Artur Olszak , Piotr Szwaykowski
IPC分类号： G01B9/02 , G01B11/24 , G01B11/00
CPC分类号： G01B11/2441 , G01B9/02038 , G01B9/02057 , G01B9/0209 , G01B11/007
摘要： A non-contact optical probe utilizes an optical reference surface that projects a curved test wavefront toward the test surface and detects it by creating curved interferometric fringes localized in space in front of the reference surface. When a point to be measured on the test surface intersects the location of the fringes, the condition is detected by the probe. Because the fringes are localized at a known position in space with respect to a reference system, the precise coordinate of the surface point can be established. Such localized fringes are preferably produced by a spectrally controllable light source. The curvature of the fringes ensures a sufficiently large angle of acceptance for the probe to capture light reflected from points of high surface slope. The probe is particularly suitable for coordinate measurement machines.
摘要翻译：非接触光学探针利用光学参考表面，其将弯曲的测试波前投影到测试表面，并通过产生局部在参考表面前方的空间中的弯曲干涉条纹来检测它。当在测试表面上要测量的点与条纹的位置相交时，探测器检测该条件。因为边缘相对于参考系统位于空间中的已知位置，所以可以建立表面点的精确坐标。这样的局部条纹优选地由光谱可控的光源产生。条纹的曲率确保了探头足够大的接受角度来捕获从高斜率的点反射的光。探头特别适用于坐标测量机。

4. 发明申请

US20160091299A1 INTERFEROMETRIC NON-CONTACT OPTICAL PROBE AND MEASUREMENT 有权
标题翻译：介质非接触式光学探头和测量
公开(公告)号：US20160091299A1
公开(公告)日：2016-03-31
申请号：US14956355
申请日：2015-12-01
申请人： ROBERT SMYTHE , ARTUR OLSZAK , PIOTR SZWAYKOWSKI
发明人： ROBERT SMYTHE , ARTUR OLSZAK , PIOTR SZWAYKOWSKI
IPC分类号： G01B11/00 , G01B11/24
CPC分类号： G01B11/2441 , G01B9/02038 , G01B9/02057 , G01B9/0209 , G01B11/007
摘要： A non-contact optical probe utilizes an optical reference surface that projects a curved test wavefront toward the test surface and detects it by creating curved interferometric fringes localized in space in front of the reference surface. When a point to be measured on the test surface intersects the location of the fringes, the condition is detected by the probe. Because the fringes are localized at a known position in space with respect to a reference system, the precise coordinate of the surface point can be established. Such localized fringes are preferably produced by a spectrally controllable light source. The curvature of the fringes ensures a sufficiently large angle of acceptance for the probe to capture light reflected from points of high surface slope. The probe is particularly suitable for coordinate measurement machines.
摘要翻译：非接触光学探针利用光学参考表面，其将弯曲的测试波前投影到测试表面，并通过产生局部在参考表面前方的空间中的弯曲干涉条纹来检测它。当在测试表面上要测量的点与条纹的位置相交时，探测器检测该条件。因为边缘相对于参考系统位于空间中的已知位置，所以可以建立表面点的精确坐标。这样的局部条纹优选地由光谱可控的光源产生。条纹的曲率确保了探头足够大的接受角度来捕获从高斜率的点反射的光。探头特别适用于坐标测量机。

5. 发明授权

US08482740B1 Computer generated reference for measurements of aspheric surfaces 有权
标题翻译：计算机生成非球面测量参考
公开(公告)号：US08482740B1
公开(公告)日：2013-07-09
申请号：US12828031
申请日：2010-06-30
申请人： Piotr Szwaykowski
发明人： Piotr Szwaykowski
IPC分类号： G01B11/02
CPC分类号： G01B11/02 , G01M11/005 , G01M11/0271
摘要： A computer generated phase map and corresponding set of interference fringes calculated from a theoretical prescription of a measured aspheric surface comprises a Computer Generated Reference (CGR) that is used in an interferometer equipped with a spherical and/or flat reference element. moiré fringes created between real interference fringes and the CGR describe the difference between the measured object and its prescription. The moiré fringes can be nulled making the measurement of the aspheric surface analogous to the measurements of the regular spherical and/or flat surfaces.
摘要翻译：计算机生成的相位图和从测量的非球面的理论处方计算出的相应的干涉条纹组包括用于配备有球形和/或平面参考元件的干涉仪中的计算机生成参考（CGR）。在实际干涉条纹和CGR之间产生的莫尔条纹描述了被测物体与其处方之间的差异。莫尔条纹可以无效，使得非球面表面的测量类似于规则球形和/或平坦表面的测量。

6. 发明授权

US08269980B1 White light scanning interferometer with simultaneous phase-shifting module 有权
标题翻译：白光扫描干涉仪同时移相模块
公开(公告)号：US08269980B1
公开(公告)日：2012-09-18
申请号：US12778009
申请日：2010-05-11
申请人： Piotr Szwaykowski
发明人： Piotr Szwaykowski
IPC分类号： G01B11/02
CPC分类号： G01B9/02081 , G01B9/02076 , G01B9/0209 , G01B11/2441 , G01B2290/45 , G01B2290/70
摘要： A simultaneous phase-shifting white light scanning interferometer comprises a white light scanning interferometer, a simultaneous phase-shifting module, and a scanner. Light from a short coherence length light source may be polarized and then split, by a polarization type beam-splitter, into orthogonally polarized reference and test beams. The simultaneous phase-shifting module comprises a plurality of detectors, allows for controlled phase shifts between the reference and test beams, and creates at least three independent interferograms, each with different phase shifts between the reference and test beams. The scanner translates the simultaneous phase-shifting module with respect to an object under measurement.
摘要翻译：同时移相白光扫描干涉仪包括白光扫描干涉仪，同时移相模块和扫描仪。来自短相干长度光源的光可以偏振，然后通过偏振型分束器分裂成正交偏振的参考和测试光束。同步移相模块包括多个检测器，允许参考和测试波束之间受控的相移，并且产生至少三个独立的干涉图，每个独立的干涉图在参考和测试光束之间具有不同的相移。扫描仪将同时移相模块相对于被测物体进行翻译。

7. 发明申请

US20060146340A1 Simultaneous phase shifting module for use in interferometry 有权
标题翻译：用于干涉测量的同步相移模块
公开(公告)号：US20060146340A1
公开(公告)日：2006-07-06
申请号：US10536378
申请日：2003-11-26
申请人： Piotr Szwaykowski , Raymond Castonguay , Frederick Bushroe
发明人： Piotr Szwaykowski , Raymond Castonguay , Frederick Bushroe
IPC分类号： G01B9/02
CPC分类号： G01B9/02081 , G01B2290/45 , G01B2290/70
摘要： A back-end assembly for use with a front-end assembly in acquiring phase-shifted interferograms having a plurality of imaging modules (Ma, Mb, Mc). Each module (Ma, Mb, Mc) has a quarter wave plate (30a, 30b, 30c), a polarizer (32a, 32b, 32c), and an image sensor (34a, 34b, 34c) so that each polarizer has a different rotation orientation thus acquiring phase-shifted interferograms.
摘要翻译：一种用于前端组件的后端组件，用于获取具有多个成像模块（Ma，Mb，Mc）的相移干涉图。每个模块（Ma，Mb，Mc）具有四分之一波片（30a，30b，30c），偏振器（32a，32b，32c）和图像传感器（34a，34b，34b） c）使得每个偏振器具有不同的旋转取向，从而获得相移干涉图。

8. 发明申请

US20120026507A1 INTERFEROMETRIC SYSTEM WITH REDUCED VIBRATION SENSITIVITY AND RELATED METHOD 审中-公开
标题翻译：具有降低振动灵敏度和相关方法的干涉系统
公开(公告)号：US20120026507A1
公开(公告)日：2012-02-02
申请号：US13215071
申请日：2011-08-22
申请人： Piotr Szwaykowski , Federick N. Bushroe , Raymond J. Castonguay
发明人： Piotr Szwaykowski , Federick N. Bushroe , Raymond J. Castonguay
IPC分类号： G01B9/02
CPC分类号： G01B9/02072 , G01B9/02057 , G01B9/02081 , G01B2290/70
摘要： A source module (12) generates mutually orthogonally polarized beams of light as emanating from two spatially separated point sources (Sv, Sw) for use in a phase shifting interferometer.
摘要翻译：源模块（12）产生相互垂直偏振的光束，其从两个空间分离的点源（Sv，Sw）发出，用于相移干涉仪。

9. 发明授权

US08004687B2 Interferometric system with reduced vibration sensitivity and related method 有权
标题翻译：具有降低振动灵敏度的干涉测量系统及相关方法
公开(公告)号：US08004687B2
公开(公告)日：2011-08-23
申请号：US10536576
申请日：2003-11-26
申请人： Piotr Szwaykowski , Federick N. Bushroe , Raymond J. Castonguay
发明人： Piotr Szwaykowski , Federick N. Bushroe , Raymond J. Castonguay
IPC分类号： G01B9/02
CPC分类号： G01B9/02072 , G01B9/02057 , G01B9/02081 , G01B2290/70
摘要： A source module (12) generates mutually orthogonally polarized beams of light as emanating from two spatially separated point sources (Sv, Sw) for use in a phase shifting interferometer.
摘要翻译：源模块（12）产生相互垂直偏振的光束，其从两个空间分离的点源（Sv，Sw）发出，用于相移干涉仪。

10. 发明授权

US07561279B2 Scanning simultaneous phase-shifting interferometer 有权
标题翻译：扫描同时移相干涉仪
公开(公告)号：US07561279B2
公开(公告)日：2009-07-14
申请号：US11770582
申请日：2007-06-28
申请人： Raymond Castonguay , Piotr Szwaykowski
发明人： Raymond Castonguay , Piotr Szwaykowski
IPC分类号： G01B9/02
CPC分类号： G01B9/02081 , G01B2290/45 , G01B2290/70 , G01J9/02 , G01J2009/0234 , G01J2009/0261
摘要： An optical measuring apparatus for comprising, in combination, a polarization type interferometer including a polarization type beam splitter in which a polarized beam of light is split into orthogonally polarized reference and test beams, an array of detectors arranged in a line for creating a plurality of phase shifting interferograms, and a scanning device for moving the object in a direction perpendicular to a long axis of the detectors.
摘要翻译：一种光学测量装置，包括组合的偏振型干涉仪，其包括偏振光束分离器，其中偏振光束被分成垂直偏振的参考和测试光束，一组检测器布置成一行，用于创建多个相移干涉图，以及用于沿与检测器的长轴垂直的方向移动物体的扫描装置。

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