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1. 发明授权

US09638673B2 Ultrasonic testing instrument with dithery pulsing 有权
公开(公告)号：US09638673B2
公开(公告)日：2017-05-02
申请号：US13654969
申请日：2012-10-18
申请人： Olympus NDT, Inc.
发明人： Pierre Langlois , Benoit Cournoyer
IPC分类号： G01N29/22 , G01N29/34 , G01N29/44
CPC分类号： G01N29/343 , G01N29/4463 , G01N29/449
摘要： Disclosed is an ultrasonic device optimized with both averaging and dithery pulsing techniques. The averaging technique significantly removes white noise; on the other hand, the dithery pulsing significantly removes acoustic noise, which is otherwise accumulated during conventional averaging processes.

2. 发明申请

US20140002072A1 EDDY CURRENT ARRAY CONFIGURATION WITH REDUCED LENGTH AND THICKNESS 有权
标题翻译： EDDY电流阵列配置具有减少的长度和厚度
公开(公告)号：US20140002072A1
公开(公告)日：2014-01-02
申请号：US13974422
申请日：2013-08-23
申请人： Olympus NDT Inc.
发明人： Benoit LEPAGE
IPC分类号： G01N27/90
CPC分类号： G01N27/904 , G01N27/9006
摘要： The invention herein disclosed provides a 2D coil and a method of using the 2D wound EC sensor for reproducing the Eddy Current Testing (ECT) response of a prior art 3D orthogonal sensor. The resulting thin-film eddy current array of coils configured to be placed parallel and against the test surface, and a corresponding eddy current circuitry operable to excite and receive eddy current from the array of coils. The array of coils forming at least a first inspection channel and a second inspection channel. The eddy current circuitry is configured and operable in a way that the one of the first pair of driver coils is usable as one of the second pair of driver coils; and one of the first pair of receiver coils is useable as one the second pair of receiver coils.
摘要翻译：本文公开的本发明提供了2D线圈和使用2D缠绕EC传感器来再现现有技术3D正交传感器的涡流测试（ECT）响应的方法。所得到的薄膜涡流阵列被配置为平行放置并与测试表面平行放置，以及相应的涡流电路可操作以从线圈阵列激发和接收涡流。所述线圈阵列至少形成第一检查通道和第二检查通道。涡流电路被构造和操作，使得第一对驱动器线圈中的一个可用作第二对驱动器线圈之一; 并且第一对接收器线圈中的一个可用作第二对接收器线圈中的一个。

3. 发明申请

US20150276371A1 APARATUS AND METHOD FOR CONDUCTING AND REAL-TIME APPLICATION OF EC PROBE CALIBRATION 有权
标题翻译：用于导引和实时应用EC探针校准的方法和方法
公开(公告)号：US20150276371A1
公开(公告)日：2015-10-01
申请号：US14227005
申请日：2014-03-27
申请人： Olympus NDT, Inc.
发明人： Xiangdeng XU , Paul DeANGELO
IPC分类号： G01B7/06 , G01N27/90
CPC分类号： G01B7/10 , G01B21/042 , G01N27/90 , G01N27/904
摘要： A system and method for carrying out non-destructive testing and inspection of test objects to inspect for anomaly using eddy current instruments, the instrument has an on-board calibration module configured to provide probe-specific conductivity or thickness correction data over a plurality of testing points of a standard block having known conductivity and thicknesses using the same physical probe as is used for the inspection measurements. When the same probe induces eddy current into a test object, the instrument having a processor or computing unit, computes a conductivity or thickness value, corrected by the above said correction data pertaining to the specific probe.
摘要翻译：一种用于对试验对象进行非破坏性测试和检查的系统和方法，以使用涡流仪器检查异常，该仪器具有车载校准模块，其被配置为在多个测试中提供探针特异性电导率或厚度校正数据使用与用于检查测量的相同物理探针的具有已知电导率和厚度的标准块的点。当相同的探针将涡电流引入测试对象时，具有处理器或计算单元的仪器计算通过上述与特定探针相关的校正数据校正的电导率或厚度值。

4. 发明授权

US08816680B2 Eddy current array configuration with reduced length and thickness 有权
标题翻译：具有减小长度和厚度的涡流阵列配置
公开(公告)号：US08816680B2
公开(公告)日：2014-08-26
申请号：US13974422
申请日：2013-08-23
申请人： Olympus NDT Inc.
发明人： Benoit LePage
IPC分类号： G01N27/72 , G01R33/12
CPC分类号： G01N27/904 , G01N27/9006
摘要： The invention herein disclosed provides a 2D coil and a method of using the 2D wound EC sensor for reproducing the Eddy Current Testing (ECT) response of a prior art 3D orthogonal sensor. The resulting thin-film eddy current array of coils configured to be placed parallel and against the test surface, and a corresponding eddy current circuitry operable to excite and receive eddy current from the array of coils. The array of coils forming at least a first inspection channel and a second inspection channel. The eddy current circuitry is configured and operable in a way that the one of the first pair of driver coils is usable as one of the second pair of driver coils; and one of the first pair of receiver coils is useable as one the second pair of receiver coils.
摘要翻译：本文公开的本发明提供了2D线圈和使用2D缠绕EC传感器来再现现有技术3D正交传感器的涡流测试（ECT）响应的方法。所得到的薄膜涡流阵列被配置为平行放置并与测试表面平行放置，以及相应的涡流电路可操作以从线圈阵列激发和接收涡流。所述线圈阵列至少形成第一检查通道和第二检查通道。涡流电路被构造和操作，使得第一对驱动器线圈中的一个可用作第二对驱动器线圈之一; 并且第一对接收器线圈中的一个可用作第二对接收器线圈中的一个。

5. 发明申请

US20140236499A1 SIZING OF A DEFECT USING PHASED ARRAY SYSTEM 有权
标题翻译：使用相位阵列系统的缺陷大小
公开(公告)号：US20140236499A1
公开(公告)日：2014-08-21
申请号：US13767925
申请日：2013-02-15
申请人： OLYMPUS NDT, INC.
发明人： Martin St-Laurent , Jinchi Zhang
IPC分类号： G01N29/44
CPC分类号： G01N29/0645 , G01N29/069 , G01N29/07 , G01N29/11 , G01N29/262 , G01N29/44 , G01N29/4454
摘要： Disclosed is an improved method of sizing a defect using a phased array system with a single probe orientation requiring only a simple one-pass scan. It is an improvement of the ADDT standard which is adapted to phased array systems with fixed probe orientations. Based on pre-configured parameters obtained from C-scans, the method as presently disclosed provides novel analysis on C-scans and more complete information on defects, including the orientation and sizes in length and depth or thickness of the defects. Phased array systems devised with the presently disclosed method can perform such inspection and complete sizing automatically for longitudinal, transverse and oblique defects in one pass of scan.
摘要翻译：公开了一种改进的使用具有单个探针取向的相控阵系统来确定缺陷的方法，仅需要简单的一遍扫描。这是ADDT标准的改进，适用于具有固定探针取向的相控阵列系统。基于从C扫描获得的预先配置的参数，目前公开的方法提供关于C扫描的新颖分析和关于缺陷的更完整的信息，包括缺陷的长度和深度或厚度的取向和尺寸。使用本公开的方法设计的相控阵系统可以在一次扫描过程中对纵向，横向和斜向缺陷自动执行这种检查和完成尺寸调整。

6. 发明授权

US09243883B2 Apparatus and method for conducting and real-time application of EC probe calibration 有权
标题翻译：用于进行和实时应用EC探针校准的设备和方法
公开(公告)号：US09243883B2
公开(公告)日：2016-01-26
申请号：US14227005
申请日：2014-03-27
申请人： Olympus NDT, Inc.
发明人： Xiangdeng Xu , Paul DeAngelo
IPC分类号： G01R35/00 , G01B7/06 , G01N27/90
CPC分类号： G01B7/10 , G01B21/042 , G01N27/90 , G01N27/904
摘要： A system and method for carrying out non-destructive testing and inspection of test objects to inspect for anomaly using eddy current instruments, the instrument has an on-board calibration module configured to provide probe-specific conductivity or thickness correction data over a plurality of testing points of a standard block having known conductivity and thicknesses using the same physical probe as is used for the inspection measurements. When the same probe induces eddy current into a test object, the instrument having a processor or computing unit, computes a conductivity or thickness value, corrected by the above said correction data pertaining to the specific probe.
摘要翻译：一种用于对试验对象进行非破坏性测试和检查的系统和方法，以使用涡流仪器检查异常，该仪器具有车载校准模块，其被配置为在多个测试中提供探针特异性电导率或厚度校正数据使用与用于检查测量的相同物理探针的具有已知电导率和厚度的标准块的点。当相同的探针将涡电流引入测试对象时，具有处理器或计算单元的仪器计算通过上述与特定探针相关的校正数据校正的电导率或厚度值。

7. 发明授权

US09222918B2 Sizing of a defect using phased array system 有权
标题翻译：使用相控阵系统对缺陷进行调整
公开(公告)号：US09222918B2
公开(公告)日：2015-12-29
申请号：US13767925
申请日：2013-02-15
申请人： Olympus NDT, Inc.
发明人： Martin St-Laurent , Jinchi Zhang
IPC分类号： G01B21/18 , G01N29/06 , G01N29/44 , G01N29/07 , G01N29/11 , G01N29/26
CPC分类号： G01N29/0645 , G01N29/069 , G01N29/07 , G01N29/11 , G01N29/262 , G01N29/44 , G01N29/4454
摘要： Disclosed is an improved method of sizing a defect using a phased array system with a single probe orientation requiring only a simple one-pass scan. It is an improvement of the ADDT standard which is adapted to phased array systems with fixed probe orientations. Based on pre-configured parameters obtained from C-scans, the method as presently disclosed provides novel analysis on C-scans and more complete information on defects, including the orientation and sizes in length and depth or thickness of the defects. Phased array systems devised with the presently disclosed method can perform such inspection and complete sizing automatically for longitudinal, transverse and oblique defects in one pass of scan.
摘要翻译：公开了一种改进的使用具有单个探针取向的相控阵系统来确定缺陷的方法，仅需要简单的一遍扫描。这是ADDT标准的改进，适用于具有固定探针取向的相控阵列系统。基于从C扫描获得的预先配置的参数，目前公开的方法提供关于C扫描的新颖分析和关于缺陷的更完整的信息，包括缺陷的长度和深度或厚度的取向和尺寸。使用本公开的方法设计的相控阵系统可以在一次扫描过程中对纵向，横向和斜向缺陷自动执行这种检查和完成尺寸调整。

8. 发明申请

US20140109675A1 ULTRASONIC TESTING INSTRUMENT WITH DITHERY PULSING 有权
标题翻译：超声波检测仪器
公开(公告)号：US20140109675A1
公开(公告)日：2014-04-24
申请号：US13654969
申请日：2012-10-18
申请人： OLYMPUS NDT, INC.
发明人： Pierre Langlois , Benoit Cournoyer
IPC分类号： G01N29/22
CPC分类号： G01N29/343 , G01N29/4463 , G01N29/449
摘要： Disclosed is an ultrasonic device optimized with both averaging and dithery pulsing techniques. The averaging technique significantly removes white noise; on the other hand, the dithery pulsing significantly removes acoustic noise, which is otherwise accumulated during conventional averaging processes.
摘要翻译：公开了一种使用平均和抖动脉冲技术进行优化的超声波设备。平均技术显着消除了白噪声; 另一方面，抖动脉冲显着地消除了在常规平均过程中积累的声学噪声。

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