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    • 2. 发明授权
    • Semiconductor photoelectric device with plural tin oxide heterojunctions
and common electrical connection
    • 具有多个锡氧化物异质结和通用电气连接的半导体光电器件
    • US4005468A
    • 1977-01-25
    • US347427
    • 1973-04-03
    • Shigeru TanimuraNobuaki MiuraMikizo Miyamoto
    • Shigeru TanimuraNobuaki MiuraMikizo Miyamoto
    • H01L27/146H01L31/00H01L29/90H01L27/14H01L31/12H01L33/00
    • H01L27/14643H01L31/00Y10S148/02Y10S148/051Y10S148/106Y10S148/12
    • A semiconductor photoelectric device of improved photoelectric and rectifying characteristics is provided by first forming a film of electrically insulating material such as silicon dioxide of a substantial thickness on a main surface of a semiconductor substrate so as to have a plurality of portions of said main surface exposed through a corresponding plurality of square or rectangle openings laid out at right angles, said openings being defined by said insulating material film, depositing a tin oxide film on the open areas of the semiconductor substrate, removing a portion of said tin oxide film just overlying the said insulating film for separating the respective barrier regions formed between the tin oxide film and the substrate, and providing a metal layer on said insulating film for connecting the end portion of the tin oxide film of the adjacent barrier regions. The resultant photoelectric device, even if a total light receiving area is increased, shows an improved photoelectric characteristic at low and high illumination.
    • 通过首先在半导体衬底的主表面上形成诸如二氧化硅等电绝缘材料的膜,从而使得所述主表面的多个部分露出,从而提供改进的光电和整流特性的半导体光电装置 通过相应的多个正方形或矩形开口以直角布置,所述开口由所述绝缘材料膜限定,在半导体衬底的开放区域上沉积氧化锡膜,将一部分氧化锡膜刚好覆盖 所述绝缘膜用于分离形成在氧化锡膜和衬底之间的各个阻挡区域,并且在所述绝缘膜上提供用于连接相邻阻挡区域的氧化锡膜的端部的金属层。 所得到的光电器件即使总光接收面积增加,在低照度和高照度下显示出改进的光电特性。
    • 4. 发明授权
    • Semiconductor device
    • 半导体器件
    • US4016589A
    • 1977-04-05
    • US455008
    • 1974-03-26
    • Shigeru TanimuraNobuaki MiuraOsamu Asano
    • Shigeru TanimuraNobuaki MiuraOsamu Asano
    • H01L27/00H01L27/144H01L29/94H01L31/00H01L31/06H01L27/14H01L29/48H01L29/56
    • H01L31/00H01L27/00H01L27/1443H01L29/94H01L31/06Y02E10/50
    • A semiconductor composite having a rectifying characteristic is provided by first forming an insulating film of a semiconductor compound such as SiO.sub.2 on a semiconductor substrate of N-type Si to a uniform thickness of 27A to 500A, for example, and then further depositing thereon a tin oxide film. The intermediate insulating film between the SnO.sub.2 film and the semiconductor substrate decreases the reverse leakage current, raises the reverse breakdown voltage and makes uniform the reverse breakdown voltage. The semiconductor composite of the present invention, as subjected to a predetermined value of light energy, shows an excellent switching characteristic with respect to a voltage applied to the composite in a reverse direction. Also the semiconductor composite of the present invention, as supplied with a certain value of reverse bias voltage or with no bias, shows an excellent switching characteristic with respect to light energy applied to the composite.
    • 具有整流特性的半导体复合体通过首先在N型Si的半导体衬底上形成诸如SiO 2的半导体化合物的绝缘膜至例如27A至500A的均匀厚度,然后在其上沉积锡 氧化膜。 SnO 2膜和半导体衬底之间的中间绝缘膜减小了反向漏电流,提高了反向击穿电压并使反向击穿电压均匀。 本发明的半导体复合体经历预定的光能值后,相对于向反方向施加到复合体上的电压显示出优异的切换特性。 此外,本发明的半导体复合材料,当提供有一定反向偏置电压值或无偏压时,表现出相对于施加到复合材料上的光能的优异的开关特性。