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    • 5. 发明申请
    • Repair bits for a low voltage cache
    • 修复低电压缓存的位
    • US20070168836A1
    • 2007-07-19
    • US11322988
    • 2005-12-30
    • Morgan DempseyJose Maiz
    • Morgan DempseyJose Maiz
    • G11C29/00
    • G11C29/808G11C15/00
    • A method and apparatus for repairing cache memories/arrays is described herein. A cache includes a plurality of lines and logically viewable in columns. A repair cache coupled to the cache includes a repair bit mapped to each logically viewable column. A repair module determines a bad bit to be repaired within a column based on any individual or combination of factors, such as the number of errors per line of the cache, the number of errors correctable per line of the cache due to error correction code (ECC), the failure rate of bits, or other considerations. The bad bit is transparently repaired by the repair bit mapped to the column including the bad bit, upon an access to a cache line including the bad bit.
    • 本文描述了用于修复高速缓冲存储器/阵列的方法和装置。 缓存包括多个行,并且可以在列中逻辑地查看。 耦合到高速缓存的修复缓存包括映射到每个逻辑可见列的修复位。 修复模块基于任何个体或因素组合来确定在列内修复的坏位,例如每个高速缓存行的错误数量,由于错误校正码每行高速缓存可纠错的数量( ECC),位的故障率或其他考虑。 在访问包括坏位的高速缓存行时,坏位被映射到包括坏位的列的修复位透明地修复。