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    • 9. 发明授权
    • Dielectric element
    • 介电元件
    • US06720096B1
    • 2004-04-13
    • US09711512
    • 2000-11-14
    • Shigeharu MatsushitaMitsuaki Harada
    • Shigeharu MatsushitaMitsuaki Harada
    • B32B900
    • H01L28/75H01L28/55
    • A dielectric element employing an oxide-based dielectric film capable of suppressing oxidation of an electrode or deterioration of film characteristics of the oxide-based dielectric film is obtained. This dielectric element comprises an insulator film including the oxide-based dielectric film and the electrode including a first conductor film containing at least a metal and silicon. The aforementioned metal includes at least one metal selected from a group consisting of Ir, Pt, Ru, Re, Ni, Co and Mo. Thus, the aforementioned first conductor film serves as a barrier film for stopping diffusion of oxygen. In heat treatment for sintering the oxide-based dielectric film, therefore, oxygen is effectively inhibited from diffusing along grain boundaries of the electrode. Consequently, a conductive material located under the electrode can be inhibited from oxidation.
    • 可以获得使用能够抑制电极氧化的氧化物系电介质膜或氧化物类电介质膜的膜特性劣化的介质元件。 该电介质元件包括绝缘膜,该绝缘膜包括基于氧化物的电介质膜,该电极包括至少含有金属和硅的第一导体膜。 上述金属包括选自Ir,Pt,Ru,Re,Ni,Co和Mo中的至少一种金属。因此,上述第一导体膜用作阻止氧的扩散的阻挡膜。 因此,在用于烧结氧化物类电介质膜的热处理中,有效地抑制氧气沿着电极的晶界扩散。 因此,可以抑制位于电极下方的导电材料的氧化。