会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 2. 发明授权
    • Over-erase verification and repair methods for flash memory
    • 闪存的过度擦除验证和修复方法
    • US08462554B2
    • 2013-06-11
    • US13039692
    • 2011-03-03
    • Chung-Meng HuangIm-Cheol Ha
    • Chung-Meng HuangIm-Cheol Ha
    • G11C16/06G11C16/28
    • G11C16/28G11C16/3409G11C16/3445
    • Over-erase verification and repair methods for a flash memory. The flash memory is an NOR type stack flash. The disclosed method performs an over-erased column verification test on a sector of the NOR type stack flash column by column. An over-erased column repair process is individually performed on the columns which do not pass the over-erased column verification test. For the columns processed by the over-erased column repair process but still incapable of passing the over-erased column verification test, an over-erased bit verification test is performed on each bit thereof. The bits incapable of passing the over-erased bit verification test are further processed by an over-erased repair process individually.
    • 闪存的擦除验证和修复方法。 闪存是NOR型堆栈闪存。 所公开的方法在逐列的NOR型堆栈闪存的扇区上执行过擦除的列校验测试。 在不通过超过列验证测试的列上单独执行超擦除色谱柱修复过程。 对于由过度删除的列修复进程处理的列,但是仍然不能通过过擦除的列校验测试,对其每个位执行过擦除位验证测试。 无法通过过擦除位验证测试的位进一步通过过度擦除的修复过程单独进行处理。
    • 9. 发明授权
    • ESD protection apparatus and method for dual-polarity input pad
    • 用于双极性输入板的ESD保护装置和方法
    • US06933540B2
    • 2005-08-23
    • US10606922
    • 2003-06-27
    • Meng-Huang LiuChun-Hsiang LaiShin SuTao-Cheng Lu
    • Meng-Huang LiuChun-Hsiang LaiShin SuTao-Cheng Lu
    • H01L27/02H01L29/72
    • H01L27/0262H01L29/87
    • An ESD protection apparatus for dual-polarity input pad comprises a triple-well formed with a first, second and third regions to form an SCR structure. A first and second ground connection regions of opposite conductivity types are formed on the first region, a first and second input connection regions of opposite conductivity types are formed in the third region, and a bridge region is formed across the second region and extends to the first and third regions. Under normal operation, the first, second, and third regions form two back-to-back diodes. Under positive polarity ESD event, breakdown is occurred between the bridge and first regions to thereby trigger an SCR circuit for positive polarity ESD protection. Under negative polarity ESD event, breakdown is occurred between the bridge and third regions to thereby trigger an SCR circuit for negative polarity ESD protection.
    • 用于双极性输入焊盘的ESD保护装置包括形成有第一,第二和第三区域以形成SCR结构的三阱。 在第一区域上形成有相反导电类型的第一和第二接地连接区域,在第三区域中形成相反导电类型的第一和第二输入连接区域,跨越第二区域形成桥接区域并延伸到 第一和第三区域。 在正常操作下,第一,第二和第三区域形成两个背对背二极管。 在正极性ESD事件下,在桥与第一区之间发生击穿,从而触发用于正极性ESD保护的SCR电路。 在负极性ESD事件下,桥和第三区之间发生击穿,从而触发用于负极性ESD保护的SCR电路。