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    • 6. 发明授权
    • Method for making asymmetric double-gate transistors by which asymmetric and symmetric double-gate transistors can be made on the same substrate
    • 制造不对称双栅极晶体管的方法,通过该方法可以在同一衬底上制造不对称和对称双栅极晶体管
    • US08232168B2
    • 2012-07-31
    • US12521311
    • 2007-12-28
    • Maud VinetOlivier ThomasOlivier RozeauThierry Poiroux
    • Maud VinetOlivier ThomasOlivier RozeauThierry Poiroux
    • H01L21/336
    • H01L27/1104G11C11/412H01L27/11H01L29/78645
    • A method for fabricating a microelectronic device with one or plural double-gate transistors, including: a) forming one or plural structures on a substrate including at least a first block configured to form a first gate of a double-gate transistor, and at least a second block configured to form the second gate of said double-gate, the first block and the second block being located on opposite sides of at least one semiconducting zone and separated from the semiconducting zone by a first gate dielectric zone and a second gate dielectric zone respectively, and b) doping at least one or plural semiconducting zones in the second block of at least one given structure among the structures, using at least one implantation selective relative to the first block, the second block being covered by a hard mask, a critical dimension of the hard mask being larger than the critical dimension of the second block.
    • 一种用于制造具有一个或多个双栅极晶体管的微电子器件的方法,包括:a)在至少包括构成为形成双栅极晶体管的第一栅极的第一块的至少一个衬底上形成一个或多个结构,并且至少 第二块,其被配置为形成所述双栅极的第二栅极,所述第一块和所述第二块位于至少一个半导体区的相对侧上,并且通过第一栅极介电区和第二栅极电介质与所述半导体区分离 并且b)使用相对于第一块选择性的至少一种植入,在所述结构中掺杂至少一个给定结构的第二块中的至少一个或多个半导体区域,所述第二块被硬掩模覆盖, 硬掩模的临界尺寸大于第二块的临界尺寸。
    • 7. 发明授权
    • Device for measuring metal/semiconductor contact resistivity
    • 用于测量金属/半导体接触电阻率的装置
    • US08115503B2
    • 2012-02-14
    • US12123758
    • 2008-05-20
    • Maud Vinet
    • Maud Vinet
    • G01R27/08G01R31/26
    • H01L22/34H01L2924/0002Y10T29/49004H01L2924/00
    • A device for measuring the resistivity ρc of an interface between a semiconductor and a metal, including at least: one dielectric layer, at least one semiconductor-based element of a substantially rectangular shape, which is arranged on the dielectric layer, having a lengthwise L and widthwise W face in contact with the dielectric layer and having a thickness t, and at least two interface portions containing the metal or an alloy of said semiconductor and said metal, wherein each of two opposing faces of the semiconductor element, having a surface equal to t×W and being perpendicular to the face in contact with the dielectric layer, being completely covered by one of the interface portions.
    • 一种用于测量半导体和金属之间的界面的电阻率的装置,包括至少一个电介质层,至少一个基本矩形形状的基于半导体的元件,其布置在电介质层上,具有 纵向L和宽度方向W表面与电介质层接触并具有厚度t,以及至少两个界面部分,其包含所述半导体和所述金属的金属或合金,其中半导体元件的两个相对面中的每一个具有 表面等于t×W并垂直于与介电层接触的面,被其中一个界面部分完全覆盖。
    • 9. 发明授权
    • Suspended-gate MOS transistor with non-volatile operation
    • 具有非易失性操作的悬挂栅极MOS晶体管
    • US07812410B2
    • 2010-10-12
    • US12168417
    • 2008-07-07
    • Michael CollongeMaud VinetOlivier Thomas
    • Michael CollongeMaud VinetOlivier Thomas
    • H01L27/20H01L41/04H01L41/083
    • G11C23/00B82Y10/00G11C2213/17H01L29/515H01L29/78654
    • A microelectronic device, including at least one transistor including: on a substrate, a semiconductor zone with a channel zone covered with a gate dielectric zone, a mobile gate, suspended above the gate dielectric zone and separated from the gate dielectric zone by an empty space, which the gate is located at an adjustable distance from the gate dielectric zone, and a piezoelectric actuation device including a stack formed by at least one layer of piezoelectric material resting on a first biasing electrode, and a second biasing electrode resting on the piezoelectric material layer, wherein the gate is attached to the first biasing electrode and is in contact with the first biasing electrode, and the piezoelectric actuation device is configured to move the gate with respect to the channel zone.
    • 一种微电子器件,包括至少一个晶体管,其包括:在衬底上,具有覆盖有栅极介电区的沟道区的半导体区,悬浮在栅极介电区上方的移动栅极,并与栅极介电区隔开空位 栅极位于与栅极介电区域可调节的距离处,以及压电致动装置,其包括由至少一层静电在第一偏置电极上的压电材料形成的叠层,以及沉积在压电材料上的第二偏置电极 层,其中所述栅极附接到所述第一偏置电极并且与所述第一偏置电极接触,并且所述压电致动装置被配置为相对于所述沟道区移动所述栅极。
    • 10. 发明申请
    • SRAM MEMORY CELL HAVING TRANSISTORS INTEGRATED AT SEVERAL LEVELS AND THE THRESHOLD VOLTAGE VT OF WHICH IS DYNAMICALLY ADJUSTABLE
    • 具有集成在几个级别的晶体管的SRAM存储单元和动态调整的阈值电压VT
    • US20090294861A1
    • 2009-12-03
    • US12466733
    • 2009-05-15
    • Olivier THOMASPerrine BatudeArnaud PouydebasqueMaud Vinet
    • Olivier THOMASPerrine BatudeArnaud PouydebasqueMaud Vinet
    • H01L27/11
    • H01L27/1104H01L27/0688H01L27/11H01L27/1108H01L27/1203
    • A non-volatile random access memory cell which, on a substrate surmounted by a stack of layers, comprises:a first plurality of transistors situated at a given level of the stack of which at least one first access transistor and at least one second access transistor, which are arranged between a first bit line and a first storage node, and between a second bit line and a second storage node, respectively, the first access transistor and the second access transistor having a gate connected to a word line,a second plurality of transistors forming a flip-flop and situated at, at least one other level of the stack, beneath said given level,the transistors of the second plurality of transistors each comprising a gate electrode situated opposite a channel region of a transistor of the first plurality of transistors and separated from this channel region by means of an insulating region provided to enable coupling of said gate electrode and said channel region.
    • 一种非易失性随机存取存储单元,其在由层叠层所覆盖的衬底上,包括:第一多个晶体管,位于堆叠的给定电平处,其中至少一个第一存取晶体管和至少一个第二存取晶体管 ,其分别布置在第一位线和第一存储节点之间,以及第二位线和第二存储节点之间,第一存取晶体管和第二存取晶体管具有连接到字线的栅极,第二多个 形成触发器并且位于所述堆叠的至少另一个层级下面的所述给定电平以下的所述第二多个晶体管的晶体管分别包括与所述第一多个晶体管的沟道区相对的栅电极 的晶体管,并且通过提供用于使得所述栅极电极和所述沟道区域耦合的绝缘区域与该沟道区域分离。