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    • 9. 发明授权
    • Write current compensation for temperature variations in memory arrays
    • 为存储器阵列中的温度变化写入电流补偿
    • US06577549B1
    • 2003-06-10
    • US10254559
    • 2002-09-25
    • Lung T. TranManoj K. Bhattacharyya
    • Lung T. TranManoj K. Bhattacharyya
    • G11C704
    • G11C11/16
    • A memory device includes a memory array having a substrate, an array of memory cells disposed over the substrate, row conductors coupled to the memory cells, and column conductors coupled to the memory cells. The memory device also includes current sources that generate variable write currents in response to temperature changes in the memory array. The variable write currents are generated to accommodate the change in coercivities of the memory cells as the temperature of the array changes. A current source can include a temperature sensor that provides a continuous, immediate output to the current sensor to ensure accurate adjustment of a write current generated by the current source. There is no need to halt operation of the memory device to calibrate the current source. In addition, the current source provides an accurate adjustment to the write current because the temperature used by the temperature sensor to generate the output may be taken contemporaneously with generation of the write current.
    • 存储器件包括具有衬底的存储器阵列,设置在衬底上的存储器单元阵列,耦合到存储器单元的行导体和耦合到存储器单元的列导体。 存储器件还包括响应于存储器阵列中的温度变化产生可变写入电流的电流源。 随着阵列温度的变化,产生可变写入电流以适应存储器单元的矫顽力变化。 电流源可以包括温度传感器,其向电流传感器提供连续的即时输出,以确保精确地调整由电流源产生的写入电流。 不需要停止存储器件的操作来校准电流源。 此外,电流源提供对写入电流的精确调整,因为温度传感器用于产生输出的温度可以同时产生写入电流。