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1. 发明授权

US07596736B2 Iterative process for identifying systematics in data 失效
标题翻译：用于识别数据中的系统的迭代过程
公开(公告)号：US07596736B2
公开(公告)日：2009-09-29
申请号：US11277422
申请日：2006-03-24
申请人： Maroun Kassab , Leah M. Pfeifer Pastel
发明人： Maroun Kassab , Leah M. Pfeifer Pastel
IPC分类号： G01R31/28
CPC分类号： G01R31/3183 , G01R31/31703
摘要： An iterative process for identifying systematics in data is provided. In general, a set of data is processed based on a signature definition to create a set of signature data. The set of signature data is then analyzed to identify common signatures. The set of signature data is modified, using knowledge of the common signature(s), creating a revised set of signature data. The revised set of signature data is then analyzed again to identify new common signatures, if any. The modifying and analyzing steps are repeated until no new common signatures are identified. When no new common signatures are identified, the identified common signatures are reported.
摘要翻译：提供了一种用于识别数据中的系统性的迭代过程。通常，基于签名定义处理一组数据以创建一组签名数据。然后分析该组签名数据以识别公共签名。使用公共签名的知识来修改签名数据集，创建修改后的签名数据集。然后再次分析经修订的签名数据集，以识别新的公共签名（如果有的话）。重复修改和分析步骤，直到找不到新的公共签名。当没有识别出新的共同签名时，报告所识别的共同签名。

2. 发明授权

US07558999B2 Learning based logic diagnosis 有权
标题翻译：基于学习的逻辑诊断
公开(公告)号：US07558999B2
公开(公告)日：2009-07-07
申请号：US10709672
申请日：2004-05-21
申请人： James W. Adkisson , John M. Cohn , Leendert M. Huisman , Maroun Kassab , Leah M. Pfeifer Pastel , David E. Sweenor
发明人： James W. Adkisson , John M. Cohn , Leendert M. Huisman , Maroun Kassab , Leah M. Pfeifer Pastel , David E. Sweenor
IPC分类号： G01R31/28 , G06F11/00 , G11C29/00
CPC分类号： G06F11/2252 , G06F11/261
摘要： A system and method for diagnosing a failure in an electronic device. A disclosed system comprises: a defect table that associates previously studied features with known failures; and a fault isolation system that compares an inputted set of suspected faulty device features with the previously studied features listed in the defect table in order to identify causes of the failure.
摘要翻译：一种用于诊断电子设备故障的系统和方法。所公开的系统包括：将先前研究的特征与已知故障相关联的缺陷表; 以及故障隔离系统，其将输入的可疑故障设备特征集合与缺陷表中列出的先前研究的特征进行比较，以识别故障原因。

3. 发明授权

US06671644B2 Using clock gating or signal gating to partition a device for fault isolation and diagnostic data collection 失效
公开(公告)号：US06671644B2
公开(公告)日：2003-12-30
申请号：US09930355
申请日：2001-08-15
申请人： Leendert M. Huisman , William V. Huott , Franco Motika , Leah M. Pfeifer Pastel
发明人： Leendert M. Huisman , William V. Huott , Franco Motika , Leah M. Pfeifer Pastel
IPC分类号： G06F1100
CPC分类号： G01R31/31725 , G01R31/318594 , G01R31/31922 , G01R31/31937
摘要： In one aspect, an electronic device that has been partitioned into segments by using clock gating or signal gating is tested. One of the segments that is a source of a failure is identified. Diagnostic procedures are applied to the identified segment to determine a cause of the failure.

4. 发明授权

US07434130B2 Using clock gating or signal gating to partition a device for fault isolation and diagnostic data collection 有权
标题翻译：使用时钟门控或信号门控对设备进行分区以进行故障隔离和诊断数据采集
公开(公告)号：US07434130B2
公开(公告)日：2008-10-07
申请号：US11006274
申请日：2004-12-07
申请人： Leendert M. Huisman , William V. Huott , Franco Motika , Leah M. Pfeifer Pastel
发明人： Leendert M. Huisman , William V. Huott , Franco Motika , Leah M. Pfeifer Pastel
IPC分类号： G01R31/28 , G11C29/00
CPC分类号： G01R31/31725 , G01R31/318594 , G01R31/31922 , G01R31/31937
摘要： In one aspect, an electronic device that has been partitioned into segments by using clock gating or signal gating is tested. One of the segments that is a source of a failure is identified. Diagnostic procedures are applied to the identified segment to determine a cause of the failure.
摘要翻译：在一个方面，测试了通过使用时钟门控或信号门控被划分成段的电子设备。识别出作为故障来源的细分之一。将诊断程序应用于识别的段以确定故障的原因。

5. 发明授权

US06865501B2 Using clock gating or signal gating to partition a device for fault isolation and diagnostic data collection 失效
公开(公告)号：US06865501B2
公开(公告)日：2005-03-08
申请号：US10697365
申请日：2003-10-30
申请人： Leendert M. Huisman , William V. Huott , Franco Motika , Leah M. Pfeifer Pastel
发明人： Leendert M. Huisman , William V. Huott , Franco Motika , Leah M. Pfeifer Pastel
IPC分类号： G01R31/319 , G01R31/3193 , G06F19/00
CPC分类号： G01R31/31725 , G01R31/318594 , G01R31/31922 , G01R31/31937
摘要： In one aspect, an electronic device that has been partitioned into segments by using clock gating or signal gating is tested. One of the segments that is a source of a failure is identified. Diagnostic procedures are applied to the identified segment to determine a cause of the failure.

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