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    • 1. 发明授权
    • Die-shear test fixture apparatus
    • 模切试验夹具装置
    • US06220102B1
    • 2001-04-24
    • US09389629
    • 1999-09-03
    • Kuang-Ho Liao
    • Kuang-Ho Liao
    • G01N308
    • G01N3/02G01N2203/0025
    • A new method and apparatus is provided for obtaining a quantitative reading of the strength of the chip bonding connections and for testing the quality of the bonding that is established between a chip and the chip pad or tapes on which the chip is mounted. The invention makes use of the fact that the lead frame, that is the frame that contains the leads to which the chip is connected, uses a material for the metal interconnects that can be controlled by a magnetic field. A metal alloy is commonly used to fabricate the interconnect leads on the lead frame. The alloy is typically selected based on considerations of thermal stress (between the chip and the chip pad or tapes or equivalent interface on which the chip is mounted) and on considerations of delamination between the lead frame and the encapsulating compound. Ni—Fe is an alloy that is frequently used as the material for the metal interconnects on the lead frame. A magnetic field is applied such that this magnetic field holds the lead frame firmly in place with respect to the fixture plate. The lead frame/die combination is mounted such that the chip faces upwards. The die-shear test can now be performed.
    • 提供了一种新的方法和装置,用于获得芯片接合连接的强度的定量读数,并且用于测试在芯片和芯片焊盘或其上安装芯片的带之间建立的接合质量。 本发明利用以下事实:引线框架,即包含与芯片连接的引线的框架使用可由磁场控制的金属互连材料。 金属合金通常用于制造引线框架上的互连引线。 该合金通常基于热应力(芯片与芯片焊盘或芯片或其上安装芯片的等效接口之间)的考虑以及引线框架和封装化合物之间的分层考虑。 Ni-Fe是经常用作引线框架上的金属互连材料的合金。 施加磁场使得该磁场将引线框架相对于固定板牢固地保持就位。 引线框架/管芯组合安装成使得芯片面向上。 现在可以进行模切试验。