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    • 2. 发明授权
    • Photoresist compositions
    • 光刻胶组合物
    • US06258507B1
    • 2001-07-10
    • US09276715
    • 1999-03-26
    • Koshiro OchiaiNobuhito Fukui
    • Koshiro OchiaiNobuhito Fukui
    • G03C173
    • G03F7/039Y10S430/106Y10S430/115
    • A photoresist composition which is particularly useful as a chemical amplification type photoresist is provided, wherein the photoresist composition contains a resin having a structural unit represented by the following formula (I): wherein R1, R2 ad R3 each independently represents a hydrogen atom or an alkyl group having 1 to 4 carbon atoms; R4 represents a hydrogen atom, an alkyl group having 1 to 4 carbon atoms or an alkoxy group having 1 to 4 carbon atoms and R5 represents a hydrogen atom, alkyl group or aryl group, or R4 and R5 join together to form a ring, which may be heterocyclic; and R6 represents a hydrogen atom, an alkyl group having 1 to 4 carbon atoms, an alkoxy group having 1 to 4 carbon atoms or a hydroxyl group.
    • 提供特别可用作化学放大型光致抗蚀剂的光致抗蚀剂组合物,其中光致抗蚀剂组合物含有具有由下式(I)表示的结构单元的树脂:其中R1,R2和R3各自独立地表示氢原子或 具有1-4个碳原子的烷基; R 4表示氢原子,碳原子数1〜4的烷基或碳原子数1〜4的烷氧基,R 5表示氢原子,烷基或芳基,或者,R 4,R 5连接在一起形成环, 可以是杂环的; R6表示氢原子,碳原子数1〜4的烷基,碳原子数1〜4的烷氧基或羟基。
    • 5. 发明授权
    • Photo resist composition
    • 光刻胶组合物
    • US6153349A
    • 2000-11-28
    • US307036
    • 1999-05-07
    • Koji IchikawaNobuhito FukuiKoshiro Ochiai
    • Koji IchikawaNobuhito FukuiKoshiro Ochiai
    • H01L21/027G03F7/004G03F7/039
    • G03F7/039G03F7/0045Y10S430/106Y10S430/11
    • A photoresist composition comprising a resin having structural units represented by the following formulas (I), (II) and (III): ##STR1## wherein R.sup.1, R.sup.2, R.sup.3, R.sup.11, R.sup.12, R.sup.13, R.sup.21, R.sup.22 and R.sup.23 each independently represents hydrogen or an alkyl; one of R.sup.14, R.sup.15 and R.sup.16 represents an aliphatic hydrocarbon residue and the rest each independently represents hydrogen or an aliphatic hydrocarbon residue, or two or three of R.sup.14, R.sup.15 and R.sup.16 form a hydrocarbon ring; and R represents a group cleavable by an action of an acid; and the photoresist composition affords excellent resolution, excellent profile and wide focus margin even on a substrate provided with an organic anti-reflective film.
    • 一种光致抗蚀剂组合物,其包含具有由下式(I),(II)和(III)表示的结构单元的树脂:其中R1,R2,R3,R11,R12,R13,R21,R22和R23各自独立地表示氢或 烷基; R14,R15和R16之一表示脂族烃残基,其余各自独立地表示氢或脂族烃残基,或者R14,R15和R16中的两个或三个形成烃环; 并且R表示可通过酸的作用而切割的基团; 并且即使在具有有机抗反射膜的基板上,光致抗蚀剂组合物也提供优异的分辨率,优异的轮廓和宽的聚焦余量。