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    • 4. 发明授权
    • Semiconductor amplifier
    • 半导体放大器
    • US5270668A
    • 1993-12-14
    • US856446
    • 1992-03-24
    • Yukio IkedaGen ToyoshimaKiyoharu SeinoTadashi Takagi
    • Yukio IkedaGen ToyoshimaKiyoharu SeinoTadashi Takagi
    • H03F3/60H03F3/193
    • H03F3/601
    • A small-sized, high-efficiency semiconductor amplifier exhibits a satisfactory efficiency characteristic over a wide band and a low output level for secondary and tertiary higher harmonics. The semiconductor amplifier is equipped with an output circuit which is composed of a parallel resonance circuit for the secondary higher harmonic of the fundamental-operation frequency, a first connection line, a second connection line, and an open-end line having a length corresponding to approximately 1/4 of the wavelength of the tertiary higher harmonic, the drain terminal of FETs leading to the output circuit being connected to one end of the parallel resonance circuit through the first connection line, an open point being formed at one end of the parallel resonance circuit, the other end of the parallel resonance circuit for the secondary higher harmonic being connected to the open-end line having a length corresponding to approximately 1/4 of the wavelength of the tertiary higher harmonic through the second connection line, the length and width of the first connection line being adjusted to determine the secondary-higher-harmonic load-reflection coefficient of the FETs as seen from the drain thereof to such a value as will maximize the efficiency of the amplifier, the length and width of the second connection line being appropriately adjusted so as to adjust the impedance matching conditions with respect to the fundamental wave.
    • 小型,高效率半导体放大器在宽频带上表现出令人满意的效率特性,对于二次和三次高次谐波具有低输出电平。 半导体放大器配备有输出电路,其由用于基波运算频率的次高次谐波的并联谐振电路,第一连接线,第二连接线和开口端线组成,长度对应于 三分之一高次谐波的波长的大约1/4,导通输出电路的FET的漏极端子通过第一连接线连接到并联谐振电路的一端,开口点形成在并联的一端 谐振电路,用于次级高次谐波的并联谐振电路的另一端连接到具有对应于通过第二连接线的三次高次谐波的波长的大约1/4的长度的开路线,长度和 第一连接线的宽度被调整以确定如图f所示的FET的二次高次谐波负载反射系数 将其漏极设定为使放大器的效率最大化的值,适当调整第二连接线的长度和宽度,以便调整相对于基波的阻抗匹配条件。
    • 6. 发明申请
    • MICROWAVE DEVICE, HIGH-FREQUENCY DEVICE, AND HIGH-FREQUENCY EQUIPMENT
    • 微波设备,高频设备和高频设备
    • US20100019870A1
    • 2010-01-28
    • US12523899
    • 2008-01-30
    • Kiyoharu SeinoMasahiko Hunada
    • Kiyoharu SeinoMasahiko Hunada
    • H01P1/00
    • H01P5/02H01P5/028H03F1/565H03F3/60
    • Since the loss of the conventional microwave device is large, when this device is applied to the microwave component, there are problems; for example, a low-noise amplifier, the noise figure is degraded, and when applied to a high-output amplifier, output and efficiency may be decreased. In particular, in the high-output amplifier of over 100W class, heat generation at a capacitor which forms the microwave device increases, which causes a problem that the reliability of the microwave device may be decreased. A structure is formed to include a capacitor loaded between two high impedance lines the length of which has ¼ wavelength in the desired frequency band and the characteristic impedance is higher than 50Ω.
    • 由于传统的微波装置的损耗大,所以当将该装置应用于微波部件时,存在问题; 例如,低噪声放大器,噪声系数降低,并且当应用于高输出放大器时,可以降低输出和效率。 特别是,在超过100W级的高输出放大器中,形成微波装置的电容器的发热增加,导致微波器件的可靠性降低的问题。 一种结构被形成为包括负载在两个高阻抗线之间的电容器,其长度在期望频带中具有1/4波长并且特征阻抗高于50mega。
    • 8. 发明授权
    • Microwave device, high-frequency device, and high-frequency equipment
    • 微波设备,高频设备和高频设备
    • US08085110B2
    • 2011-12-27
    • US12523899
    • 2008-01-30
    • Kiyoharu SeinoMasahiko Hunada
    • Kiyoharu SeinoMasahiko Hunada
    • H01P3/02H03H7/38
    • H01P5/02H01P5/028H03F1/565H03F3/60
    • Since the loss of the conventional microwave device is large, when this device is applied to the microwave component, there are problems; for example, a low-noise amplifier, the noise figure is degraded, and when applied to a high-output amplifier, output and efficiency may be decreased. In particular, in the high-output amplifier of over 100 W class, heat generation at a capacitor which forms the microwave device increases, which causes a problem that the reliability of the microwave device may be decreased. A structure is formed to include a capacitor loaded between two high impedance lines the length of which has ¼ wavelength in the desired frequency band and the characteristic impedance is higher than 50Ω.
    • 由于传统的微波装置的损耗大,所以当将该装置应用于微波部件时,存在问题; 例如,低噪声放大器,噪声系数降低,并且当应用于高输出放大器时,可以降低输出和效率。 特别地,在100W以上的高输出放大器中,形成微波装置的电容器的发热增加,导致微波器件的可靠性降低的问题。 一种结构被形成为包括负载在两个高阻抗线之间的电容器,其长度在期望频带中具有1/4波长,并且特征阻抗高于50Ω。