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1. 发明申请

US20130321802A1 SPECTRAL CHARACTERISTIC MEASURING DEVICE, METHOD FOR CORRECTING SPECTRAL CHARACTERISTIC MEASURING DEVICE AND PROGRAM 有权
标题翻译：光谱特性测量装置，校正光谱特性测量装置和程序的方法
公开(公告)号：US20130321802A1
公开(公告)日：2013-12-05
申请号：US14000366
申请日：2012-02-03
申请人： Kenji Imura
发明人： Kenji Imura
IPC分类号： G01J3/28
CPC分类号： G01J3/28 , G01J3/0297 , G01J3/18 , G01J2003/102
摘要： Wavelength information indicating a correspondence relationship between a plurality of light receiving elements of a light receiving unit and wavelengths of pieces of lights is stored. First and second intensity distributions of the light related to first and second dispersion images are acquired based on a signal outputted from each of the light receiving elements when a monochromatic light is passed through a opening of a light shielding body and first and second dispersion images related to primary and secondary diffracted light are formed on the light receiving unit. An estimated intensity distribution of the light related to the second dispersion image is calculated from the first intensity distribution according to a predetermined relational expression. A change amount related to the wavelength information is calculated based on the estimated intensity distribution and the second intensity distribution. The wavelength information is corrected according to the change amount.
摘要翻译：存储指示光接收单元的多个光接收元件与多个光的波长之间的对应关系的波长信息。基于从单个光通过遮光体的开口而从每个光接收元件输出的信号，获得与第一和第二色散图像相关的光的第一和第二强度分布，以及第一和第二色散图像在光接收单元上形成初级和次级衍射光。根据预定的关系式从第一强度分布计算与第二色散图像相关的光的估计强度分布。基于估计的强度分布和第二强度分布来计算与波长信息相关的变化量。根据变化量校正波长信息。

2. 发明授权

US08064133B2 Light receiving optical system, and spectrophotometer incorporated with the same 失效
标题翻译：光接收光学系统和分光光度计结合使用
公开(公告)号：US08064133B2
公开(公告)日：2011-11-22
申请号：US12217851
申请日：2008-07-09
申请人： Kenji Imura
发明人： Kenji Imura
IPC分类号： G02B23/14
CPC分类号： G01J3/02 , G01J3/0208 , G01J3/0218 , G01J3/0237 , G01J3/024 , G01J3/0289 , G01J3/04 , G02B23/24 , G02B26/0816
摘要： A light receiving optical system includes: a relay optical system for converging light to be measured which has been converged on an image plane of an objective optical system. The light receiving optical system has a relay optical system with a relay lens operable to be selectively switched between first and a second conjugate positions, and a first and a second light flux limiting aperture members selectively switched between the first and the second conjugate positions. The relay optical system selectively forms, on the image plane of the objective optical system, an enlarged image and a reduced image of a view angle defining aperture in the case where the relay lens is selectively switched between the first and the second conjugate positions to define an incident light flux through the view angle defining aperture by a first and a second light flux limiting apertures, respectively.
摘要翻译：光接收光学系统包括：用于会聚已被聚焦在物镜光学系统的像平面上的待测光的中继光学系统。光接收光学系统具有中继光学系统，其具有可操作以在第一和第二共轭位置之间有选择地切换的中继透镜，以及选择性地在第一和第二共轭位置之间切换的第一和第二光束限制孔径部件。在中继透镜在第一和第二共轭位置之间有选择地切换的情况下，中继光学系统在物镜光学系统的图像平面上选择性地形成放大图像和视角定义孔径的缩小图像，以限定分别通过第一和第二光通量限制孔径通过视角定义孔的入射光通量。

3. 发明申请

US20110222065A1 Reflection characteristic measuring apparatus for sheet specimen, method of calibrating reflection characteristic measuring apparatus for sheet specimen, and calibration reference plate for use in calibration of reflection characteristic measuring apparatus for sheet specimen 有权
标题翻译：用于片材试样的反射特性测量装置，用于片材试样的校正反射特性测量装置的方法和用于片材试样的反射特性测量装置的校准的校准参考板
公开(公告)号：US20110222065A1
公开(公告)日：2011-09-15
申请号：US13111324
申请日：2011-05-19
申请人： Kenji IMURA
发明人： Kenji IMURA
IPC分类号： G01N21/55
CPC分类号： G01N21/55
摘要： A reflection characteristic measuring apparatus capable of scanning a specimen surface of a sheet specimen at a high speed is provided. The reflection characteristic measuring apparatus includes a group of illuminating and light-receiving systems for directing illuminating light onto the specimen surface of the sheet specimen held by a specimen holding roller pair and for receiving reflected light from the specimen surface. The illuminating and light-receiving systems measure a spectral characteristic of the received reflected light. The illuminating and light-receiving systems are disposed over one-dimensional arrays of color samples which extend in the longitudinal direction of the sheet specimen, and scan the one-dimensional arrays in a direction opposite to a direction in which the sheet specimen is transported.
摘要翻译：提供了一种能够高速扫描片材试样表面的反射特性测量装置。反射特性测量装置包括一组照明和光接收系统，用于将照射光引导到由样本保持辊对保持的片材样本的表面上，并用于接收来自样品表面的反射光。照明和光接收系统测量所接收的反射光的光谱特性。照明和光接收系统设置在沿片材的纵向方向延伸的一维彩色样本阵列上，并沿与片材被传送方向相反的方向扫描一维阵列。

4. 发明申请

US20110019192A1 SPECTRAL CHARACTERISTIC MEASURING SYSTEM, SPECTRAL CHARACTERISTIC MEASURING INSTRUMENT, AND DATA PROCESSING DEVICE 有权
标题翻译：光谱特性测量系统，光谱特性测量仪器和数据处理设备
公开(公告)号：US20110019192A1
公开(公告)日：2011-01-27
申请号：US12934247
申请日：2009-03-16
申请人： Kenji Imura
发明人： Kenji Imura
IPC分类号： G01J3/46
CPC分类号： G01J3/50 , G01J3/10 , G01J3/2803 , G01J3/501 , G01J3/502 , G01J3/524
摘要： An object of the present invention is to provide a spectral characteristic measuring system, a spectral characteristic measuring instrument, a data processing apparatus, and a program, which make it possible to appropriately correct an influence of an illumination light variation caused by a temperature rise in a semiconductor light-emitting element due to light emission, in a scanning type color measurement system or the like which sequentially measures many color samples 1n and in which a semiconductor light-emitting element such as an LED is used as a light source and a reference system is not provided.Spectral distributions of illumination lights which are measured before and after the color sample is measured are interpolated, to thereby estimate a spectral distribution of an illumination light at the time when a spectral distribution of the color sample is obtained. Spectral characteristics of the color sample are identified based on the spectral distribution of the reflected light or the transmitted light reflected by or transmitted through the color sample and the estimated spectral distribution.
摘要翻译：本发明的目的是提供一种光谱特性测量系统，光谱特征测量仪器，数据处理设备和程序，其可以适当地校正由温度升高引起的照明光变化的影响在扫描型色彩测量系统等中，由于发光而导致的半导体发光元件，其顺序地测量许多颜色样本1n，并且其中诸如LED的半导体发光元件用作光源和参考系统不提供。内插测量颜色样本之前和之后测量的照明光的光谱分布，从而估计获得彩色样本的光谱分布时的照明光的光谱分布。基于反射光的光谱分布或由颜色样本反射或透射的透射光的光谱分布和估计的光谱分布来识别颜色样本的光谱特性。

5. 发明申请

US20100277728A1 ILLUMINATION APPARATUS AND REFLECTIVE CHARACTERISTICS MEASURING APPARATUS EMPLOYING THE SAME 有权
标题翻译：照明装置和反射特性测量装置
公开(公告)号：US20100277728A1
公开(公告)日：2010-11-04
申请号：US12768206
申请日：2010-04-27
申请人： Kenji Imura
发明人： Kenji Imura
IPC分类号： G01J3/28 , G01N21/55
CPC分类号： G01N21/55 , G01J3/02 , G01J3/021 , G01J3/28 , G01J3/524 , G01N21/25
摘要： An illumination apparatus to illuminate a sample surface with excellent illumination efficiency and a reflective characteristics measuring apparatus using the illumination apparatus. The illumination apparatus includes a plane light source positioned on a normal at a center of the sample surface and a mirror having an internal reflective surface positioned between the plane light source and the sample surface. The internal reflective surface has a circular or polygonal shape in a section perpendicular to the normal and the circular or polygonal shape substantially corresponds to an imaginary circle centered on the normal and having a radius equal to half a distance between the plane light source and the sample surface. In place of the mirror, a plurality of reflective faces may be positioned.
摘要翻译：照明装置，以照明效率优异的照明装置和使用该照明装置的反射特性测定装置。照明装置包括位于样品表面的中心的法线上的平面光源和具有位于平面光源和样品表面之间的内部反射表面的反射镜。内部反射表面在垂直于法线的部分中具有圆形或多边形形状，并且圆形或多边形形状基本上对应于以法线为中心的假想圆，其半径等于平面光源和样品之间的距离的一半表面。代替反射镜，可以定位多个反射面。

6. 发明申请

US20100103407A1 Optical characteristic measuring apparatus 有权
标题翻译：光学特性测量仪器
公开(公告)号：US20100103407A1
公开(公告)日：2010-04-29
申请号：US12589410
申请日：2009-10-22
申请人： Kenji Imura
发明人： Kenji Imura
IPC分类号： G01N21/00
CPC分类号： G01N21/25 , G01N21/64
摘要： An optical characteristic measuring apparatus of the invention includes a sequentially-readable charge storage sensor array having a plurality of light receiving elements. Irradiation of first illumination light and second illumination light is controlled in such a manner that a period for irradiating the second illumination light onto a sample containing a fluorescent material is included in an integration period of each of the light receiving elements for receiving a wavelength component of fluoresced light from the sample in measuring an optical characteristic of the sample. The optical characteristic measuring apparatus having the above arrangement enables to accurately measure the optical characteristics of samples containing a fluorescent material in a short time by scanning the samples.
摘要翻译：本发明的光学特性测量装置包括具有多个光接收元件的顺序可读电荷存储传感器阵列。控制第一照明光和第二照明光的照射，使得将用于将第二照明光照射到含有荧光材料的样品的周期包括在用于接收波长成分的每个光接收元件的积分期间在测量样品的光学特性时，来自样品的荧光发光。具有上述结构的光学特性测量装置能够通过扫描样品来在短时间内精确地测量含有荧光材料的样品的光学特性。

7. 发明授权

US07705983B2 Wavelength displacement correcting system 有权
标题翻译：波长位移校正系统
公开(公告)号：US07705983B2
公开(公告)日：2010-04-27
申请号：US12020797
申请日：2008-01-28
申请人： Kenji Imura , Takeshi Matsumoto
发明人： Kenji Imura , Takeshi Matsumoto
IPC分类号： G01J3/28
CPC分类号： G01J3/18 , G01J3/02 , G01J3/027 , G01J3/28 , G01J3/2803 , G01J2003/2866
摘要： A wavelength displacement correcting system and method where a monochromatic beam from an LED is incident through an incident slit of a spectral device and is diffracted on a diffraction grating to form a dispersed light image. Information relating to the dispersed light image is outputted and a wavelength displacement is calculated, using a forward voltage value corresponding to the constant current, and a forward voltage initial value. Wavelength displacement amounts of at least two diffracted beams are calculated, using output values of the at least two diffracted beams, and diffracted beam output initial values with respect to the dispersed light image. A dispersion width is calculated, using the calculated wavelength displacement amount of the beam, and the calculated wavelength displacement amounts of at least two diffracted beams.
摘要翻译：一种波长位移校正系统和方法，其中来自LED的单色光束通过光谱器件的入射狭缝入射并衍射在衍射光栅上以形成分散的光图像。输出与分散的光图像相关的信息，并且使用与恒定电流对应的正向电压值和正向电压初始值来计算波长位移。使用至少两个衍射光束的输出值和相对于分散光图像的衍射光束输出初始值来计算至少两个衍射光束的波长位移量。使用计算出的波束位移量和至少两个衍射光束的计算波长位移量来计算色散宽度。

8. 发明授权

US07502099B2 Measuring method and apparatus for measuring an optical property of a fluorescent sample 有权
标题翻译：用于测量荧光样品的光学性质的测量方法和装置
公开(公告)号：US07502099B2
公开(公告)日：2009-03-10
申请号：US11398911
申请日：2006-04-06
申请人： Kenji Imura
发明人： Kenji Imura
IPC分类号： G01N21/00
CPC分类号： G01N21/64
摘要： The method and the apparatus measures the total spectral radiance factor Bxs (λ) of a fluorescent sample illuminated by a specified illumination for testing Is without a fluorescent standard and a bothersome UV correction using it. The method and the apparatus calculates Bxs(λ) based on the spectral intensity Is(λ) of the illumination for testing, the measured spectral intensities I1(λ) and I2(λ) of actual illuminations I1 and I2 which are different from each other, a bi-spectral luminescent radiance factor F(μ,λ) or a bi-spectral radiance factor B(μ,λ) which is close to either of the sample, and the measured spectral intensities Sx1 (λ) and Sx2(λ) of the light emitted from the sample illuminated by illuminations I1 and I2.
摘要翻译：该方法和装置测量由用于测试的指定照明照射的荧光样品的总光谱辐射系数Bxs（λ），不使用荧光标准和使用它的麻烦的UV校正。该方法和装置基于用于测试的照明的光谱强度Is（λ）来计算Bxs（λ），测量的彼此不同的实际照明I1和I2的光谱强度I1（λ）和I2（λ）接近任一样本的双光谱发光辐射系数F（mu，λ）或双光谱辐射系数B（mu，λ）和测量的光谱强度Sx1（λ）和Sx2（λ）由照明I1和I2照射的样品发出的光。

9. 发明申请

US20080212092A1 WAVELENGTH DISPLACEMENT CORRECTING SYSTEM 有权
标题翻译：波长偏移校正系统
公开(公告)号：US20080212092A1
公开(公告)日：2008-09-04
申请号：US12020797
申请日：2008-01-28
申请人： Kenji IMURA , Takeshi Matsumoto
发明人： Kenji IMURA , Takeshi Matsumoto
IPC分类号： G01J3/28
CPC分类号： G01J3/18 , G01J3/02 , G01J3/027 , G01J3/28 , G01J3/2803 , G01J2003/2866
摘要： In a wavelength displacement correcting system and method of the invention, a monochromatic beam from a light emitting diode driven by a constant current is incident through an incident slit of a spectral device. The incident beam is diffracted on a diffraction grating to form a dispersed light image, and information relating to the dispersed light image of the incident slit is outputted from the spectral device. A wavelength displacement amount of the monochromatic beam is calculated, using a forward voltage value corresponding to the constant current, and a forward voltage initial value. Wavelength displacement amounts of at least two diffracted beams are calculated, using output values of the at least two diffracted beams, and diffracted beam output initial values with respect to the dispersed light image. A dispersion width displacement amount of the spectral device is calculated, using the calculated wavelength displacement amount of the monochromatic beam, and the calculated wavelength displacement amounts of at least two diffracted beams, whereby a wavelength displacement of the spectral device is corrected.
摘要翻译：在本发明的波长位移校正系统和方法中，来自由恒定电流驱动的发光二极管的单色光束通过光谱器件的入射狭缝入射。入射光束在衍射光栅上衍射以形成分散的光图像，并且从光谱装置输出与入射狭缝的分散光图像有关的信息。使用与恒定电流对应的正向电压值和正向电压初始值来计算单色光束的波长位移量。使用至少两个衍射光束的输出值和相对于分散光图像的衍射光束输出初始值来计算至少两个衍射光束的波长位移量。使用所计算的单色光束的波长位移量和所计算的至少两个衍射光束的波长位移量来计算光谱器件的色散宽度位移量，从而校正光谱器件的波长位移。

10. 发明授权

US07262854B2 Multi-angle colorimeter 有权
标题翻译：多角度比色计
公开(公告)号：US07262854B2
公开(公告)日：2007-08-28
申请号：US11159666
申请日：2005-06-23
申请人： Kenji Imura
发明人： Kenji Imura
IPC分类号： G01J3/46
CPC分类号： G01J3/02 , G01J3/0218 , G01J3/0267 , G01J3/0278 , G01J3/504 , G01N21/57 , G01N2021/575
摘要： In a multi-angle colorimeter having an illumination system that illuminates a sample surface and a plurality of light receiving systems that receive reflected light therefrom, an illumination system for orientation error detection is provided that illuminates the sample surface from substantially close direction to the normal of the sample surface. Actual measured reflectance factor is corrected based on the specific approximation function obtained from the measured reflectance factor and detected orientation error.
摘要翻译：在具有照射样品表面的照明系统和从其接收反射光的多个光接收系统的多角度比色计中，提供了一种用于定向误差检测的照明系统，其从基本上靠近方向的样品表面。基于从测量的反射系数和检测到的取向误差获得的特定近似函数来校正实际测量的反射系数。

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