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    • 9. 发明申请
    • OPTICAL MODULE MANUFACTURING AND TESTING SYSTEMS AND METHODS
    • 光学模块制造与测试系统及方法
    • US20110043896A1
    • 2011-02-24
    • US12542899
    • 2009-08-18
    • Jun BAO
    • Jun BAO
    • H01S3/00
    • H01S3/06704
    • The present disclosure relates to streamlining optical module and/or subassembly development, manufacturing, and testing through introducing a memory component within a module and/or subassembly that is utilized with a host module for system calibration and/or configuration. In an exemplary embodiment, the present invention can streamline optical amplifier (EDFA) module and/or subassembly development, manufacturing, and testing. The present invention includes an optical module/sub-assembly without control circuitry, i.e. a “dumb module”, but with a memory that is used to load relevant data from a supplier. This data is utilized to calibrate, test, and configure the optical module/sub-assembly in a host module. The host module includes control circuitry to access this memory in the optical module/sub-assembly and to calibrate, test, configure, and control the optical module/sub-assembly. Advantageously, this additional memory reduces manufacturing time without the disadvantage of adding complexity in the optical module/sub-assembly.
    • 本公开涉及通过在与主机模块一起用于系统校准和/或配置的模块和/或子组件内引入存储器组件来简化光学模块和/或子组件开发,制造和测试。 在示例性实施例中,本发明可以简化光放大器(EDFA)模块和/或子组件开发,制造和测试。 本发明包括没有控制电路的光学模块/子组件,即“哑模块”,但是具有用于从供应商加载相关数据的存储器。 该数据用于校准,测试和配置主机模块中的光模块/子组件。 主机模块包括用于访问光学模块/子组件中的该存储器并且校准,测试,配置和控制光学模块/子组件的控制电路。 有利地,该附加存储器减少了制造时间,而没有增加光学模块/子组件的复杂性的缺点。