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1. 发明授权

US5949901A Semiconductor device image inspection utilizing image subtraction and threshold imaging 失效
标题翻译：半导体器件图像检测利用图像减法和阈值成像
公开(公告)号：US5949901A
公开(公告)日：1999-09-07
申请号：US621190
申请日：1996-03-21
申请人： Sanjay Nichani , Joseph Scola
发明人： Sanjay Nichani , Joseph Scola
IPC分类号： G06T7/00 , G06T5/50
CPC分类号： G06T7/001 , G06T7/0097 , G06T2207/30148
摘要： Machine vision methods for inspection of semiconductor die surfaces include the steps of generating a first image of the die surface, generating a second image of the die surface and any defect thereon, and subtracting the second image from the first image. The methods are characterized in that the second image is generated such that subtraction of it from the first image emphasizes the defect with respect to the die surface.
摘要翻译：用于检查半导体管芯表面的机器视觉方法包括以下步骤：产生管芯表面的第一图像，产生管芯表面的第二图像和其上的任何缺陷，以及从第一图像中减去第二图像。该方法的特征在于，生成第二图像，使得从第一图像中减去第二图像强调相对于管芯表面的缺陷。

2. 发明授权

US06920241B1 System and method for bundled location and regional inspection 有权
标题翻译：捆绑定位和区域检查的系统和方法
公开(公告)号：US06920241B1
公开(公告)日：2005-07-19
申请号：US09672493
申请日：2000-09-29
申请人： Paul Dutta-Choudhury , Bradford Safford , Joseph Scola
发明人： Paul Dutta-Choudhury , Bradford Safford , Joseph Scola
IPC分类号： G06K9/00 , G06T7/00 , G09G3/34
CPC分类号： G06T7/001
摘要： A system and method for object inspection incorporates a level of hierarchy so that a single, primary alignment may be performed to generate a pose for multiple inspection regions. As a result, a Training mode may include the specification of a single alignment model window and a list of associated inspection region windows. Similarly, a Run-time Inspection Mode may also include specification of a single alignment model window and a list of associated inspection region windows. Such an implementation addresses the long standing problems associated with performing one or more types of inspection operations in one or more regions of a given sample-object image. By virtue of the hierarchical structure, operation of multiple inspection tools may be performed simultaneously or in any order and inspection of multiple inspection regions may be performed simultaneously or in any order.
摘要翻译：用于对象检查的系统和方法包括层次级别，使得可以执行单个主要对准以产生多个检查区域的姿势。结果，训练模式可以包括单个对齐模型窗口的指定和相关联的检查区域窗口的列表。类似地，运行时检查模式还可以包括单个对齐模型窗口的指定和相关联的检查区域窗口的列表。这样的实现解决了在给定样本对象图像的一个或多个区域中执行一种或多种类型的检查操作相关联的长期存在的问题。通过层次结构，可以同时或以任何顺序执行多个检查工具的操作，并且可以同时或以任何顺序执行多个检查区域的检查。

3. 发明申请

US20090302843A1 SYSTEM FOR MEASURING A MAGNETIC RESONANCE SIGNAL BASED ON A HYBRID SUPERCONDUCTIVE-MAGNETORESISTIVE SENSOR 有权
标题翻译：基于混合超导电磁传感器测量磁共振信号的系统
公开(公告)号：US20090302843A1
公开(公告)日：2009-12-10
申请号：US12305486
申请日：2007-06-22
申请人： Claude Fermon , Jacques Jacquinot , Myriam Pannetier-Lecoeur , Joseph Scola
发明人： Claude Fermon , Jacques Jacquinot , Myriam Pannetier-Lecoeur , Joseph Scola
IPC分类号： G01R33/44
CPC分类号： G01R33/32 , B82Y25/00 , G01R33/093 , G01R33/34023
摘要： The system for measuring a magnetic resonance signal within a sample (4) placed in a static external magnetic field (H) includes an excitation device (1 to 3, 6 to 10) for applying high-intensity radio-frequency pulses at a predetermined emission frequency fe in a measurement zone containing the sample (4). The excitation device includes an excitation coil (3) tuned to the predetermined emission frequency fe and disposed in the vicinity of the sample (4) in such a way as to produce an electromagnetic field essentially perpendicular to the static external magnetic field (H). The system further includes at least a superconductive-magnetoresistive hybrid sensor (5) including a superconductive loop having a constriction adapted to increase significantly the current density and at least a magnetoresistive sensor placed in the immediate vicinity of said constriction (72) and being separated therefrom by an insulative deposit.
摘要翻译：用于测量放置在静态外部磁场（H）中的样本（4）内的磁共振信号的系统包括用于以预定发射施加高强度射频脉冲的激励装置（1至3,6至10）在含有样品（4）的测量区中的频率fe。励磁装置包括调谐到预定发射频率fe并设置在样品（4）附近的激励线圈（3），以产生基本上垂直于静态外部磁场（H）的电磁场。该系统还包括至少一个超导 - 磁阻混合传感器（5），该超导磁阻混合传感器（5）包括具有适于显着增大电流密度的收缩线的超导环路和至少设置在所述收缩部分（72）附近并与之分离的磁阻传感器通过绝对存款。

4. 发明授权

US06714679B1 Boundary analyzer 有权
标题翻译：边界分析仪
公开(公告)号：US06714679B1
公开(公告)日：2004-03-30
申请号：US09245163
申请日：1999-02-05
申请人： Joseph Scola , Lowell Jacobson
发明人： Joseph Scola , Lowell Jacobson
IPC分类号： G06K948
CPC分类号： G06K9/6204 , G06K9/48
摘要： A method and apparatus are disclosed for analyzing a boundary of an object. An embodiment for determining defects of a boundary to sub-pixel precision and an embodiment for fast correlation scoring are disclosed. The boundary is analyzed by matching a first boundary, such as a model of an ideal object boundary, to a second boundary, such as the boundary of an object being produced at a factory. The boundaries are represented as a set of indexed vertices, which are generated by parsing the boundaries into a set of segments. One embodiment refines the parse through merging segments and reassigning data points near the endpoints of the segments. The model produced is very accurate and is useful in other applications. To analyze the boundaries, the sets of indexed vertices are matched, and optionally the segmentation of the second boundary is refined to increase the extent of matching. The extent of matching yields a correlation score and/or the matching allows a characteristic class of the first set of segments to be associated with the second set of segments. The class and data points of the runtime segments are used to measure defects in the second set of segments, and thus in the boundary of the object.
摘要翻译：公开了一种用于分析物体的边界的方法和装置。公开了一种用于确定边界到子像素精度的缺陷的实施例和用于快速相关评分的实施例。通过将诸如理想对象边界的模型的第一边界与诸如在工厂生产的对象的边界的第二边界进行匹配来分析边界。边界被表示为一组索引顶点，它们通过将边界解析为一组段来生成。一个实施例通过合并段并重新分配在段的端点附近的数据点来优化解析。所生产的模型非常准确，在其他应用中很有用。为了分析边界，索引顶点的集合被匹配，并且可选地，第二边界的分割被改进以增加匹配的程度。匹配的程度产生相关得分和/或匹配允许第一组段的特征类别与第二组段相关联。运行时段的类和数据点用于测量第二组段中的缺陷，从而在对象的边界中进行测量。

5. 发明授权

US5949905A Model-based adaptive segmentation 失效
标题翻译：基于模型的自适应分割
公开(公告)号：US5949905A
公开(公告)日：1999-09-07
申请号：US735628
申请日：1996-10-23
申请人： Sanjay Nichani , Joseph Scola
发明人： Sanjay Nichani , Joseph Scola
IPC分类号： G06K9/38 , G06T5/00 , H05K3/34 , G06K9/34
CPC分类号： G06K9/38 , G06T7/0008 , G06T7/0081 , G06T2207/30141 , H05K3/3484
摘要： A machine vision method is provided for segmenting an image based on an adaptive thresholding approach that exploits prior knowledge of the characteristics, such as area, of the object to be segmented. Adaptation to varying gray-values of the candidate object/background from scene-to-scene is obtained by using a sampling window which provides gray-value statistics of the candidate object to be segmented. Next, using these statistics, a characteristic of the image of the object to be segmented, such as its area or its gray-value standard deviation, and the histogram of the image, the segmentation is performed. The invention is especially useful for detecting the presence/absence of adhesive on printed circuit boards, where both the appearance of the printed circuit board and the solder paste commonly found thereon make segmentation difficult. In case of presence/absence determination, an additional step of shape matching is employed.
摘要翻译：提供了一种机器视觉方法，用于基于自适应阈值方法来分割图像，所述自适应阈值方法利用要分割的对象的特征（诸如面积）的先前知识。通过使用提供要分割的候选对象的灰度值统计的采样窗口来获得从场景到场景对候选对象/背景的变化灰度值的适应。接下来，使用这些统计，执行要分割的对象的图像的特征，例如其区域或其灰度值标准偏差，以及图像的直方图，执行分割。本发明特别可用于检测印刷电路板上的粘合剂的存在/不存在，其中印刷电路板的外观和通常在其上发现的焊膏都难以进行分割。在存在/不存在确定的情况下，采用形状匹配的附加步骤。

6. 发明授权

US07944205B2 System for measuring a magnetic resonance signal based on a hybrid superconductive-magnetoresistive sensor 有权
标题翻译：基于混合超导磁阻传感器测量磁共振信号的系统
公开(公告)号：US07944205B2
公开(公告)日：2011-05-17
申请号：US12305486
申请日：2007-06-22
申请人： Claude Fermon , Jacques Jacquinot , Myriam Pannetier-Lecoeur , Joseph Scola
发明人： Claude Fermon , Jacques Jacquinot , Myriam Pannetier-Lecoeur , Joseph Scola
IPC分类号： G01V3/00
CPC分类号： G01R33/32 , B82Y25/00 , G01R33/093 , G01R33/34023
摘要： The system for measuring a magnetic resonance signal within a sample (4) placed in a static external magnetic field (H) includes an excitation device (1 to 3, 6 to 10) for applying high-intensity radio-frequency pulses at a predetermined emission frequency fe in a measurement zone containing the sample (4). The excitation device includes an excitation coil (3) tuned to the predetermined emission frequency fe and disposed in the vicinity of the sample (4) in such a way as to produce an electromagnetic field essentially perpendicular to the static external magnetic field (H). The system further includes at least a superconductive-magnetoresistive hybrid sensor (5) including a superconductive loop having a constriction adapted to increase significantly the current density and at least a magnetoresistive sensor placed in the immediate vicinity of said constriction (72) and being separated therefrom by an insulative deposit.
摘要翻译：用于测量放置在静态外部磁场（H）中的样本（4）内的磁共振信号的系统包括用于以预定发射施加高强度射频脉冲的激励装置（1至3,6至10）在含有样品（4）的测量区中的频率fe。励磁装置包括调谐到预定发射频率fe并设置在样品（4）附近的激励线圈（3），以产生基本上垂直于静态外部磁场（H）的电磁场。该系统还包括至少一个超导 - 磁阻混合传感器（5），该超导磁阻混合传感器（5）包括具有适于显着增大电流密度的收缩线的超导环路和至少设置在所述收缩部分（72）附近并与之分离的磁阻传感器通过绝对存款。

7. 发明授权

US06587582B1 Semiconductor device image inspection with contrast enhancement 有权
标题翻译：半导体器件图像检测与对比度增强
公开(公告)号：US06587582B1
公开(公告)日：2003-07-01
申请号：US09924902
申请日：2001-08-08
申请人： Sanjay J. Nichani , Joseph Scola
发明人： Sanjay J. Nichani , Joseph Scola
IPC分类号： G06T550
CPC分类号： G01N21/95684 , G01N21/95607
摘要： Machine vision methods for inspection of semiconductor die lead frames include the steps of generating a first image of the lead frame, generating a second image of the lead frame and any defect thereon, and subtracting the second image from the first image. The methods are characterized in that the second image is generated such that subtraction of it from the first image emphasizes the defect with respect to the lead frame.
摘要翻译：用于检查半导体管芯引线框架的机器视觉方法包括以下步骤：产生引线框架的第一图像，产生引线框架的第二图像和其上的任何缺陷，以及从第一图像中减去第二图像。所述方法的特征在于，生成第二图像，使得从第一图像中减去第二图像强调相对于引线框的缺陷。

8. 发明授权

US06298149B1 Semiconductor device image inspection with contrast enhancement 有权
标题翻译：半导体器件图像检测与对比度增强
公开(公告)号：US06298149B1
公开(公告)日：2001-10-02
申请号：US09184407
申请日：1998-08-25
申请人： Sanjay J. Nichani , Joseph Scola
发明人： Sanjay J. Nichani , Joseph Scola
IPC分类号： G06T550
CPC分类号： G01N21/95684 , G01N21/95607
摘要： Machine vision methods for inspection of semiconductor die lead frames include the steps of generating a first image of the lead frame, generating a second image of the lead frame and any defect thereon, and subtracting the second image from the first image. The methods are characterized in that the second image is generated such that subtraction of it from the first image emphasizes the defect with respect to the lead frame.
摘要翻译：用于检查半导体管芯引线框架的机器视觉方法包括以下步骤：产生引线框架的第一图像，产生引线框架的第二图像和其上的任何缺陷，以及从第一图像中减去第二图像。所述方法的特征在于，生成第二图像，使得从第一图像中减去第二图像强调相对于引线框的缺陷。

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