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    • 1. 发明授权
    • Variable sized aperture window of an analog-to-digital converter
    • 模数转换器的可变尺寸孔径窗口
    • US07573409B2
    • 2009-08-11
    • US11800708
    • 2007-05-07
    • Charles H. MooreLeslie O. SnivelyJohn Huie
    • Charles H. MooreLeslie O. SnivelyJohn Huie
    • H03M1/00
    • H03M1/1245H03M1/1215H03M1/60
    • An improvement in sampling a high frequency input analog signal and converting it to a digital output signal is disclosed. This is accomplished by using a multitude of analog-to-digital converters in conjunction with a distributed sampling system. This combination of multiple converters and a distributed sampling system allows use of conventional device processing, such as that of 0.18 micron silicon, and also provides accurate sampling of very high frequency input signals. The distributed sampling system provides multiple samplings of the input signal by using multiple ADCs for multiple samplings, wherein each sampling is sequentially offset a fixed amount of time from the most recent preceding sampling. Each ADC has a designated central processing unit (CPU) to obtain sufficient data transfer capabilities. The samplings from the multitude of ADCs are a series of sequential digital output values. The digital output values could be the result of samplings all at the same frequency, or at different frequencies. Types of distributed sampling systems include a multitude of elongated trace patterns interconnected in series, a multitude of inverter pairs interconnected in series, a specific permittivity material device, and a sequencer or multiplier. A second enhanced sampling system includes a variable sized aperture window, wherein a width of a sample pulse is narrowed through a variable clock mechanism to produce a faster sampling rate. This variable sized aperture window system can be used by itself, or in combination with any of the presently described multiple ADC distributed sampling systems.
    • 公开了对高频输入模拟信号进行采样并将其转换为数字输出信号的改进。 这是通过使用多个模数转换器与分布式采样系统结合来实现的。 多个转换器和分布式采样系统的组合允许使用诸如0.18微米硅的常规器件处理,并且还提供极高频率输入信号的精确采样。 分布式采样系统通过对多个采样使用多个ADC来提供输入信号的多次采样,其中每个采样从最近的先前采样顺序地偏移固定的时间量。 每个ADC都有一个指定的中央处理单元(CPU),以获得足够的数据传输能力。 来自多个ADC的采样是一系列顺序数字输出值。 数字输出值可能是以相同频率或不同频率进行采样的结果。 分布式采样系统的类型包括串联互连的多个细长迹线图案,串联互连的多个逆变器对,特定介电常数材料器件和定序器或乘法器。 第二增强采样系统包括可变大小的孔径窗口,其中采样脉冲的宽度通过可变时钟机构变窄以产生更快的采样率。 该可变尺寸的孔径窗系统可以自身使用,或与任何目前描述的多个ADC分布式采样系统组合使用。
    • 2. 发明授权
    • Method for determining information about the internal workings of a chip based on electro-magnetic emissions therefrom
    • 基于其电磁发射来确定关于芯片的内部工作的信息的方法
    • US07554352B2
    • 2009-06-30
    • US11592717
    • 2006-11-03
    • John Huie
    • John Huie
    • G01R31/311
    • G01R31/002G01R31/31727
    • A novel a method for determining the internal operation of an integrated circuit (IC) includes measuring electromagnetic (EM) emissions from the integrated circuit chip and analyzing the EM emissions. In a particular method, the EM emissions from the IC are measured using an RF close end probe. In a particular method, the electromagnetic emissions are measured with the IC configured in various ways. In the normal operating mode, the emissions are measured while the IC is provided with power and any external clock signal(s). After measuring the emissions of the IC in normal operating mode, the IC is reconfigured by disabling the external clock signal(s) to the IC and remeasuring the emissions. The external clock signal is disabled by disconnecting the power to the IC, disabling the external clock signal, and then reconnecting power to the IC. In yet a third test mode, the external clock signal is reenabled while power continues to be supplied to the IC. Information about the presence and/or proper functioning of internal clocks of the IC can be determined by analyzing the spectral scan data obtained in one or more of the three test modes.
    • 用于确定集成电路(IC)的内部操作的新颖方法包括测量来自集成电路芯片的电磁(EM)发射并分析EM发射。 在特定的方法中,使用RF近端探针测量IC的EM发射。 在一种特定的方法中,电磁辐射是用各种方式配置的IC来测量的。 在正常工作模式下,在IC提供电源和任何外部时钟信号时测量发射。 在正常工作模式下测量IC的发射后,通过禁用IC的外部时钟信号和重新测量发射来重新配置IC。 通过断开IC的电源,禁用外部时钟信号,然后重新连接IC的电源来禁用外部时钟信号。 在第三种测试模式下,外部时钟信号在电源继续提供给IC时被重新使能。 可以通过分析在三个测试模式中的一个或多个获得的光谱扫描数据来确定关于IC的内部时钟的存在和/或正常功能的信息。
    • 4. 发明申请
    • DATA STORAGE SYSTEM
    • 数据存储系统
    • US20140330995A1
    • 2014-11-06
    • US14268283
    • 2014-05-02
    • Paul S. LevyWilliam N. GallasJohn Huie
    • Paul S. LevyWilliam N. GallasJohn Huie
    • G06F13/16G06F13/42
    • G06F13/1694G06F13/385G06F13/4282
    • In an embodiment, a storage device may include a tangible non-transitory physical storage for storing information. The storage device may also include an interface. The interface may be used to receive a signal that may be associated with one of a plurality of different protocols. The signal may be received serially. The storage device may include circuitry which may be used to identify a protocol associated with the received signal. The protocol may be identified based on an attribute associated with the received signal. Alternatively or in addition to, the protocol may be identified based on information encoded in the received signal. The information encoded in the received signal may include, for example, a data header that may be associated with the protocol.
    • 在一个实施例中,存储设备可以包括用于存储信息的有形非瞬态物理存储器。 存储设备还可以包括接口。 接口可以用于接收可能与多个不同协议之一相关联的信号。 该信号可以被串行接收。 存储设备可以包括可以用于识别与接收到的信号相关联的协议的电路。 可以基于与接收到的信号相关联的属性来识别该协议。 或者或除了可以基于在接收信号中编码的信息来识别协议。 在接收信号中编码的信息可以包括例如可以与协议相关联的数据报头。
    • 5. 发明申请
    • Analog-to-digital converter system with increased sampling frequency
    • 具有增加采样频率的模数转换器系统
    • US20080231489A1
    • 2008-09-25
    • US11726739
    • 2007-03-22
    • Charles H. MooreLeslie O. SnivelyJohn Huie
    • Charles H. MooreLeslie O. SnivelyJohn Huie
    • H03M1/12
    • H03M1/1245H03M1/1215
    • The present invention is an improvement in sampling a high frequency input analog signal and converting it to a digital output signal. This is accomplished by using a multitude of analog-to-digital converters in conjunction with a distributed sampling system. This combination of multiple converters and a distributed sampling system allows use of conventional device processing, such as that of 0.18 micron silicon, and also provides accurate sampling of very high frequency input signals. The distributed sampling system provides multiple samplings of the input signal by using a different ADC for each sampling, wherein each sampling is sequentially offset a certain amount of time from the most recent preceding sampling. The samplings from the multitude of ADCs are combined to form a single contiguous digital output signal. Types of distributed sampling systems include a multitude of elongated trace patterns interconnected in series, a specified permittivity material device, and a sequencer or multiplier.
    • 本发明是对高频输入模拟信号进行采样并将其转换为数字输出信号的改进。 这是通过使用多个模数转换器与分布式采样系统结合来实现的。 多个转换器和分布式采样系统的组合允许使用诸如0.18微米硅的常规器件处理,并且还提供极高频率输入信号的精确采样。 分布式采样系统通过对每个采样使用不同的ADC来提供输入信号的多次采样,其中每个采样从最近的先前采样顺序地偏移一定量的时间。 来自多个ADC的采样被组合以形成单个相邻的数字输出信号。 分布式采样系统的类型包括串联互连的多个细长迹线图案,指定的介电常数材料器件和定序器或乘法器。
    • 6. 发明申请
    • Method for determining information about the internal workings of a chip based on electro-magnetic emissions therefrom
    • 基于其电磁发射来确定关于芯片的内部工作的信息的方法
    • US20070120571A1
    • 2007-05-31
    • US11592717
    • 2006-11-03
    • John Huie
    • John Huie
    • G01R31/311
    • G01R31/002G01R31/31727
    • A novel a method for determining the internal operation of an integrated circuit (IC) includes measuring electromagnetic (EM) emissions from the integrated circuit chip and analyzing the EM emissions. In a particular method, the EM emissions from the IC are measured using an RF close end probe. In a particular method, the electromagnetic emissions are measured with the IC configured in various ways. In the normal operating mode, the emissions are measured while the IC is provided with power and any external clock signal(s). After measuring the emissions of the IC in normal operating mode, the IC is reconfigured by disabling the external clock signal(s) to the IC and remeasuring the emissions. The external clock signal is disabled by disconnecting the power to the IC, disabling the external clock signal, and then reconnecting power to the IC. In yet a third test mode, the external clock signal is reenabled while power continues to be supplied to the IC. Information about the presence and/or proper functioning of internal clocks of the IC can be determined by analyzing the spectral scan data obtained in one or more of the three test modes.
    • 用于确定集成电路(IC)的内部操作的新颖方法包括测量来自集成电路芯片的电磁(EM)发射并分析EM发射。 在特定的方法中,使用RF近端探针测量IC的EM发射。 在一种特定的方法中,电磁辐射是用各种方式配置的IC来测量的。 在正常工作模式下,在IC提供电源和任何外部时钟信号时测量发射。 在正常工作模式下测量IC的发射后,通过禁用IC的外部时钟信号和重新测量发射来重新配置IC。 通过断开IC的电源,禁用外部时钟信号,然后重新连接IC的电源来禁用外部时钟信号。 在第三种测试模式下,外部时钟信号在电源继续提供给IC时被重新使能。 可以通过分析在三个测试模式中的一个或多个获得的光谱扫描数据来确定关于IC的内部时钟的存在和/或正常功能的信息。
    • 7. 发明申请
    • Variable sized aperture window of an analog-to-digital converter
    • 模数转换器的可变尺寸孔径窗口
    • US20100117880A1
    • 2010-05-13
    • US12462828
    • 2009-08-10
    • Charles H. MooreLeslie O. SnivelyJohn Huie
    • Charles H. MooreLeslie O. SnivelyJohn Huie
    • H03M1/00H03M1/12
    • H03M1/1245H03M1/1215H03M1/60
    • An improvement in sampling a high frequency input analog signal and converting it to a digital output signal is disclosed. This is accomplished by using a multitude of analog-to-digital converters in conjunction with a distributed sampling system. This combination of multiple converters and a distributed sampling system allows use of conventional device processing, such as that of 0.18 micron silicon, and also provides accurate sampling of very high frequency input signals. The distributed sampling system provides multiple samplings of the input signal by using multiple ADCs for multiple samplings, wherein each sampling is sequentially offset a fixed amount of time from the most recent preceding sampling. Each ADC has a designated central processing unit (CPU) to obtain sufficient data transfer capabilities. The samplings from the multitude of ADCs are a series of sequential digital output values. The digital output values could be the result of samplings all at the same frequency, or at different frequencies. Types of distributed sampling systems include a multitude of elongated trace patterns interconnected in series, a multitude of inverter pairs interconnected in series, a specific permittivity material device, and a sequencer or multiplier. A second enhanced sampling system includes a variable sized aperture window, wherein a width of a sample pulse is narrowed through a variable clock mechanism to produce a faster sampling rate. This variable sized aperture window system can be used by itself, or in combination with any of the presently described multiple ADC distributed sampling systems.
    • 公开了对高频输入模拟信号进行采样并将其转换为数字输出信号的改进。 这是通过使用多个模数转换器与分布式采样系统结合来实现的。 多个转换器和分布式采样系统的组合允许使用诸如0.18微米硅的常规器件处理,并且还提供极高频率输入信号的精确采样。 分布式采样系统通过对多个采样使用多个ADC来提供输入信号的多次采样,其中每个采样从最近的先前采样顺序地偏移固定的时间量。 每个ADC都有一个指定的中央处理单元(CPU),以获得足够的数据传输能力。 来自多个ADC的采样是一系列顺序数字输出值。 数字输出值可能是以相同频率或不同频率进行采样的结果。 分布式采样系统的类型包括串联互连的多个细长迹线图案,串联互连的多个逆变器对,特定介电常数材料器件和定序器或乘法器。 第二增强采样系统包括可变大小的孔径窗口,其中采样脉冲的宽度通过可变时钟机构变窄以产生更快的采样率。 该可变尺寸的孔径窗系统可以自身使用,或与任何目前描述的多个ADC分布式采样系统组合使用。
    • 8. 发明授权
    • Analog-to-digital converter system with increased sampling frequency
    • 具有增加采样频率的模数转换器系统
    • US07528756B2
    • 2009-05-05
    • US11726739
    • 2007-03-22
    • Charles H. MooreLeslie O. SnivelyJohn Huie
    • Charles H. MooreLeslie O. SnivelyJohn Huie
    • H03M1/12
    • H03M1/1245H03M1/1215
    • An improvement in sampling a high frequency input analog signal and converting it to a digital output signal is accomplished by using a multitude of analog-to-digital converters in conjunction with a distributed sampling system. This combination of multiple converters and a distributed sampling system allows use of conventional device processing, such as that of 0.18 micron silicon, and also provides accurate sampling of very high frequency input signals. The distributed sampling system provides multiple samplings of the input signal by using a different ADC for each sampling, wherein each sampling is sequentially offset a certain amount of time from the most recent preceding sampling. The samplings from the multitude of ADCs are combined to form a single contiguous digital output signal. Types of distributed sampling systems include a multitude of elongated trace patterns interconnected in series, a specified permittivity material device, and a sequencer or multiplier.
    • 通过使用多个模数转换器与分布式采样系统结合,实现对高频输入模拟信号进行采样并将其转换为数字输出信号的改进。 多个转换器和分布式采样系统的组合允许使用诸如0.18微米硅的常规器件处理,并且还提供极高频率输入信号的精确采样。 分布式采样系统通过对每个采样使用不同的ADC来提供输入信号的多次采样,其中每个采样从最近的先前采样顺序地偏移一定量的时间。 来自多个ADC的采样被组合以形成单个相邻的数字输出信号。 分布式采样系统的类型包括串联互连的多个细长迹线图案,指定的介电常数材料器件和定序器或乘法器。
    • 9. 发明授权
    • Definable radio and method of operating a wireless network of same
    • 可定义的无线电和操作无线网络的方法
    • US07457299B2
    • 2008-11-25
    • US10606883
    • 2003-06-25
    • Bruce Alan FetteJoseph Richard MillerPrice Andrew D'AntonioMark Lawrence WormleyJohn Huie
    • Bruce Alan FetteJoseph Richard MillerPrice Andrew D'AntonioMark Lawrence WormleyJohn Huie
    • H04L12/54
    • H04B7/04H04B1/0064H04L1/206H04W24/00H04W72/00H04W76/10H04W88/04H04W88/06
    • A wireless network (100) includes a number of definable radio systems (102) in communication with one another via a wideband backbone (108). Each of the systems (102) includes a first software programmable transceiver (200) for extra-network communication using a narrowband channel defined by a radio frequency capability (106). Each of the radios (102) further includes a second transceiver for intra-network communication using wideband backbone (108). Methods for operating the network (100) enable the radios (102) to engage in communication over narrowband channels to carry a signal between multiple radios (102) and an extra-network location, and for communicating the signal as distinct bitstreams between the radios (102) and another of the radios (102) using the wideband backbone (108). In addition, methods enable the radios (102) to monitor multiple external networks concurrently by having each of the radios (102) use a different RF capability (106), and to combine their independently received signals to improve performance and suppress interference.
    • 无线网络(100)包括经由宽带骨干(108)彼此通信的多个可定义的无线电系统(102)。 每个系统(102)包括用于使用由射频能力(106)限定的窄带信道进行网络外通信的第一软件可编程收发器(200)。 每个无线电设备(102)还包括用于使用宽带主干(108)进行网络内通信的第二收发器。 用于操作网络(100)的方法使得无线电设备(102)能够通过窄带信道进行通信以在多个无线电(102)和网络外位置之间传送信号,并且用于将信号作为不同位流传送到无线电 102)和使用宽带主干(108)的无线电设备(102)中的另一个。 此外,方法使得无线电设备(102)能够通过使无线电设备(102)中的每一个使用不同的RF能力(106)同时监视多个外部网络,并且组合其独立接收的信号以提高性能并抑制干扰。
    • 10. 发明申请
    • Variable sized aperture window of an analog-to-digital converter
    • 模数转换器的可变尺寸孔径窗口
    • US20080231484A1
    • 2008-09-25
    • US11800708
    • 2007-05-07
    • Charles H. MooreLeslie O. SnivelyJohn Huie
    • Charles H. MooreLeslie O. SnivelyJohn Huie
    • H03M1/12H03M1/00
    • H03M1/1245H03M1/1215H03M1/60
    • An improvement in sampling a high frequency input analog signal and converting it to a digital output signal is disclosed. This is accomplished by using a multitude of analog-to-digital converters in conjunction with a distributed sampling system. This combination of multiple converters and a distributed sampling system allows use of conventional device processing, such as that of 0.18 micron silicon, and also provides accurate sampling of very high frequency input signals. The distributed sampling system provides multiple samplings of the input signal by using multiple ADCs for multiple samplings, wherein each sampling is sequentially offset a fixed amount of time from the most recent preceding sampling. Each ADC has a designated central processing unit (CPU) to obtain sufficient data transfer capabilities. The samplings from the multitude of ADCs are a series of sequential digital output values. The digital output values could be the result of samplings all at the same frequency, or at different frequencies. Types of distributed sampling systems include a multitude of elongated trace patterns interconnected in series, a multitude of inverter pairs interconnected in series, a specific permittivity material device, and a sequencer or multiplier. A second enhanced sampling system includes a variable sized aperture window, wherein a width of a sample pulse is narrowed through a variable clock mechanism to produce a faster sampling rate. This variable sized aperture window system can be used by itself, or in combination with any of the presently described multiple ADC distributed sampling systems.
    • 公开了对高频输入模拟信号进行采样并将其转换为数字输出信号的改进。 这是通过使用多个模数转换器与分布式采样系统结合来实现的。 多个转换器和分布式采样系统的组合允许使用诸如0.18微米硅的常规器件处理,并且还提供极高频率输入信号的精确采样。 分布式采样系统通过对多个采样使用多个ADC来提供输入信号的多次采样,其中每个采样从最近的先前采样顺序地偏移固定的时间量。 每个ADC都有一个指定的中央处理单元(CPU),以获得足够的数据传输能力。 来自多个ADC的采样是一系列顺序数字输出值。 数字输出值可能是以相同频率或不同频率进行采样的结果。 分布式采样系统的类型包括串联互连的多个细长迹线图案,串联互连的多个逆变器对,特定介电常数材料器件和定序器或乘法器。 第二增强采样系统包括可变大小的孔径窗口,其中采样脉冲的宽度通过可变时钟机构变窄以产生更快的采样率。 该可变尺寸的孔径窗系统可以自身使用,或与任何目前描述的多个ADC分布式采样系统组合使用。