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    • 1. 发明授权
    • Apparatus for testing driving circuit for display
    • 用于测试显示驱动电路的装置
    • US07948482B2
    • 2011-05-24
    • US11942444
    • 2007-11-19
    • Chuan-Che LeeJiun-Lang HuangJui-Jer Huang
    • Chuan-Che LeeJiun-Lang HuangJui-Jer Huang
    • G06F3/038G09G5/00
    • H03M1/56G09G3/006G09G2310/027H03M1/109Y10S345/904
    • An apparatus for testing a driving circuit for a display is disclosed. The apparatus includes a selecting circuit, a reference voltage generator and an analog-to-digital converter (ADC). The selecting circuit includes many input terminals and an output terminal. The input terminals are respectively coupled to many output pins of the driving circuit, while the selecting circuit is used for selecting one of the output pins to electrically connect the output terminal of the selecting circuit. The reference voltage generator is coupled to at least one of the output pins for generating a reference voltage. The ADC is coupled to the output terminal of the selecting circuit for outputting a digital value based on a difference between an output voltage outputted from the output terminal of the selecting circuit and the reference voltage produced by the reference voltage generator.
    • 公开了一种用于测试显示器的驱动电路的装置。 该装置包括选择电路,参考电压发生器和模数转换器(ADC)。 选择电路包括许多输入端子和输出端子。 输入端子分别耦合到驱动电路的许多输出引脚,而选择电路用于选择输出引脚之一以电连接选择电路的输出端。 参考电压发生器耦合到至少一个输出引脚,用于产生参考电压。 ADC耦合到选择电路的输出端,用于基于从选择电路的输出端输出的输出电压与由参考电压发生器产生的参考电压之差来输出数字值。
    • 2. 发明申请
    • SUCCESSIVE APPROXIMATION REGISTER ADC AND METHOD OF LINEARITY CALIBRATION THEREIN
    • 随机逼近寄存器ADC及其线性校准方法
    • US20130127647A1
    • 2013-05-23
    • US13343725
    • 2012-01-05
    • Xuan-Lun HuangJiun-Lang Huang
    • Xuan-Lun HuangJiun-Lang Huang
    • H03M1/10H03M1/38
    • H03M1/1061H03M1/468
    • A successive approximation register analog to digital converter (SAR ADC) and a method of linearity calibration therein are provided. Each composed element Ei in a part of the composed elements includes a main constructed element Ei0 and wi sub constructed element Ei1, Ei2, . . . , Eiwi. The SAR ADC selects a part of the sub constructed elements Ei1, Ei2, . . . , Eiwi and make them non-functional when a missing decision level is caused by the composed element Ei. An overlap cancellation to the obtained missing code numbers is performed, compensation coefficients are updated according to the missing code numbers after the overlap cancellation, and a compensation to the corresponding digital value is performed according to the compensation coefficients. The present disclosure prevents the necessity of matching each composed element of the DAC in the SAR ADC.
    • 提供逐次逼近寄存器模数转换器(SAR ADC)及其线性校准方法。 组成元件的一部分中的每个组成元素Ei包括主构造元素Ei0和wi子构造元素Ei1,Ei2。 。 。 i i SAR ADC选择子构造元素Ei1,Ei2的一部分。 。 。 ,Eiwi,并且当组合元素Ei导致丢失的决策级别时,它们不起作用。 执行对所获得的丢失码号的重叠取消,根据重叠消除之后的丢失码号来更新补偿系数,并根据补偿系数对相应的数字值进行补偿。 本公开防止在SAR ADC中匹配DAC的每个组成元件的必要性。
    • 5. 发明申请
    • GENERATION DEVICE, CLASSIFICATION METHOD, GENERATION METHOD, AND PROGRAM
    • 生成装置,分类方法,生成方法和程序
    • US20110209024A1
    • 2011-08-25
    • US13124783
    • 2009-10-05
    • Meng-Fan WuJiun-Lang HuangXiaoqing WenKohei Miyase
    • Meng-Fan WuJiun-Lang HuangXiaoqing WenKohei Miyase
    • G06F11/00G01R31/3183
    • G01R31/318547
    • Provided are a generation device and the like for generating a new vector whose volume can be reduced rapidly when an output pattern derived from a decompressor of a logic circuit under test includes an unspecified bit in relation to the logic circuit under test.The output pattern includes unspecified bits. In step SS1, classification unit classifies the unspecified bits and determines if an unspecified bit is an implied bit or not. The implied bit is an unspecified bit if its value is a logic value determined as logic value 0 or 1 relating to logic bits in the initial vector and according to a predetermined condition (such as compressibility) among bits in the initial vector derived from the upstream logic circuit 1. In step SS1, the unspecified bits which are not implied bits are classified as free bits. The classification unit classifies free bit sets in step SS2, and further classifies free bits to identify compatible free bit sets. The compatible free bits of output pattern can be assigned with logic values independently of each other under the predetermined condition (such as compressibility) in relation to input pattern in step SS3.
    • 提供一种用于生成新矢量的生成装置等,当从被测逻辑电路的解压缩器导出的输出模式包括关于被测逻辑电路的未指定位时,其体积可以迅速减小。 输出模式包括未指定的位。 在步骤SS1中,分类单元对未指定的比特进行分类,并确定未指定的比特是否是隐含比特。 如果其值是确定为与初始向量中的逻辑比特相关的逻辑值0或1的逻辑值,并且根据从上游导出的初始向量中的比特之间的预定条件(诸如可压缩性),则隐含比特是未指定比特 逻辑电路1.在步骤SS1中,未指定位的未指定位被分类为空闲位。 分类单元将步骤SS2中的空闲位集合进行分类,并进一步对空闲位进行分类以识别兼容的空闲位集合。 可以在步骤SS3中相对于输入模式的预定条件(诸如可压缩性)之间彼此独立地分配输出模式的兼容的空闲位。
    • 6. 发明申请
    • APPARATUS FOR TESTING DRIVING CIRCUIT FOR DISPLAY
    • 用于测试显示驱动电路的装置
    • US20090040199A1
    • 2009-02-12
    • US11942444
    • 2007-11-19
    • Chuan-Che LeeJiun-Lang HuangJui-Jer Huang
    • Chuan-Che LeeJiun-Lang HuangJui-Jer Huang
    • G09G5/00
    • H03M1/56G09G3/006G09G2310/027H03M1/109Y10S345/904
    • An apparatus for testing a driving circuit for a display is disclosed. The apparatus includes a selecting circuit, a reference voltage generator and an analog-to-digital converter (ADC). The selecting circuit includes many input terminals and an output terminal. The input terminals are respectively coupled to many output pins of the driving circuit, while the selecting circuit is used for selecting one of the output pins to electrically connect the output terminal of the selecting circuit. The reference voltage generator is coupled to at least one of the output pins for generating a reference voltage. The ADC is coupled to the output terminal of the selecting circuit for outputting a digital value based on a difference between an output voltage outputted from the output terminal of the selecting circuit and the reference voltage produced by the reference voltage generator.
    • 公开了一种用于测试显示器的驱动电路的装置。 该装置包括选择电路,参考电压发生器和模数转换器(ADC)。 选择电路包括许多输入端子和输出端子。 输入端子分别耦合到驱动电路的许多输出引脚,而选择电路用于选择输出引脚之一以电连接选择电路的输出端。 参考电压发生器耦合到至少一个输出引脚以产生参考电压。 ADC耦合到选择电路的输出端,用于基于从选择电路的输出端输出的输出电压与由参考电压发生器产生的参考电压之差来输出数字值。
    • 8. 发明授权
    • Analog-to-digital converter
    • 模数转换器
    • US07616147B2
    • 2009-11-10
    • US12145759
    • 2008-06-25
    • Jiun-Lang HuangJui-Jer HuangChuan-Che Lee
    • Jiun-Lang HuangJui-Jer HuangChuan-Che Lee
    • H03M1/12
    • H03M1/56G09G3/006G09G2310/027H03M1/109Y10S345/904
    • An analog-to-digital converter (ADC) is presented. The ADC includes an error amplifier, a ramp generator, and a counting circuit. The error amplifier is used for receiving an output voltage and a reference voltage, and amplifying a difference between the output voltage and the reference voltage, so as to obtain a first voltage and a second voltage. The ramp generator is used for generating a ramp voltage which is increased along with time. The counting circuit is used for starting counting a digital value when the ramp voltage is larger than or equal to the first voltage, and stopping counting and outputting the digital value when the ramp voltage is larger than or equal to the second voltage.
    • 提出了一种模数转换器(ADC)。 ADC包括误差放大器,斜坡发生器和计数电路。 误差放大器用于接收输出电压和参考电压,并且放大输出电压和参考电压之间的差,以获得第一电压和第二电压。 斜坡发生器用于产生随时间增加的斜坡电压。 当斜坡电压大于或等于第一电压时,计数电路用于开始计数数字值,并且当斜坡电压大于或等于第二电压时停止计数并输出数字值。
    • 9. 发明授权
    • Successive approximation register ADC and method of linearity calibration therein
    • 逐次逼近寄存器ADC及其线性校准方法
    • US08487794B2
    • 2013-07-16
    • US13343725
    • 2012-01-05
    • Xuan-Lun HuangJiun-Lang Huang
    • Xuan-Lun HuangJiun-Lang Huang
    • H03M1/10
    • H03M1/1061H03M1/468
    • A successive approximation register analog to digital converter (SAR ADC) and a method of linearity calibration therein are provided. Each composed element Ei in a part of the composed elements includes a main constructed element Ei0 and wi sub constructed element Ei1, Ei2, . . . , Eiwi. The SAR ADC selects a part of the sub constructed elements Ei1, Ei2, . . . , Eiwi and make them non-functional when a missing decision level is caused by the composed element Ei. An overlap cancellation to the obtained missing code numbers is performed, compensation coefficients are updated according to the missing code numbers after the overlap cancellation, and a compensation to the corresponding digital value is performed according to the compensation coefficients. The present disclosure prevents the necessity of matching each composed element of the DAC in the SAR ADC.
    • 提供逐次逼近寄存器模数转换器(SAR ADC)及其线性校准方法。 组成元件的一部分中的每个组成元素Ei包括主构造元素Ei0和wi子构造元素Ei1,Ei2。 。 。 i i SAR ADC选择子构造元素Ei1,Ei2的一部分。 。 。 ,Eiwi,并且当组合元素Ei导致丢失的决策级别时,它们不起作用。 执行对所获得的丢失码号的重叠取消,根据重叠消除之后的丢失码号来更新补偿系数,并根据补偿系数对相应的数字值进行补偿。 本公开防止在SAR ADC中匹配DAC的每个组成元件的必要性。