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    • 3. 发明申请
    • SURFACE MEASUREMENT, SELECTION, AND MACHINING
    • 表面测量,选择和加工
    • US20110085175A1
    • 2011-04-14
    • US12576615
    • 2009-10-09
    • George PETRESCUJames Edd WHEELER
    • George PETRESCUJames Edd WHEELER
    • G01B11/24G06F15/00
    • G01B11/005G01B11/24
    • Systems, processes, articles of manufacture, and techniques may be used to measure a surface to be machined. In particular implementations, a representation of a surface to be machined may be determined. Measuring the surface may include measuring a plurality of surface points at each of a plurality of surface measurement locations with a measurement system moving over a surface and measuring the position of the measurement system. Determining a representation of the surface to be machined may include determining an estimated shape for the surface based on the surface measurements at the surface measurement locations. The surface measurements, the surface measurement locations, and the estimated shape may be stored in computer memory for future retrieval and use.
    • 系统,工艺,制品和技术可用于测量待加工的表面。 在特定实施方式中,可以确定待加工表面的表示。 测量表面可以包括在多个表面测量位置的每一个处测量多个表面点,其中测量系统在表面上移动并测量测量系统的位置。 确定待加工表面的表示可以包括基于表面测量位置处的表面测量来确定表面的估计形状。 表面测量,表面测量位置和估计的形状可以存储在计算机存储器中以供将来检索和使用。