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    • 1. 发明授权
    • Method for correcting a high frequency measurement error
    • 校正高频测量误差的方法
    • US5862144A
    • 1999-01-19
    • US956913
    • 1997-10-23
    • Chang Seok LeeIngab HwangMin Gun KimJae Jin LeeKwang Eui Pyun
    • Chang Seok LeeIngab HwangMin Gun KimJae Jin LeeKwang Eui Pyun
    • G01R23/00G01R27/32G06F11/00
    • G01R27/32
    • A method for correcting a high frequency measurement error which can exactly correct the high frequency measurement error even with the use of a standard devices of which characteristic have not been verified by calculating the characteristic impedance of the correction device from the characteristics of an auxiliary measuring device calculated by using a general error correction method, and calculating again the once calculated characteristics of the auxiliary measuring device. The method in accordance with the present invention comprises the steps of modelling an auxiliary measuring device used for measuring a high frequency charateristics of the device under test by two transmission lines connected in series between two terminals and a parasitic component connected in parallel between a junction of the two transmission lines and a ground; and moving a reference measurement point to the junction of the two transmission lines by using a phase angle of each transmission line and calculating a reference impedance at the terminal of the auxiliary measuring device to which an object to be measured is connected by using the difference of the resultant reflection coefficients of each port.
    • 一种用于校正高频测量误差的方法,即使使用通过从辅助测量装置的特性计算校正装置的特性阻抗尚未验证其特性的标准装置,也可以精确地校正高频测量误差 通过使用通用误差校正方法计算,并再次计算辅助测量装置的一次计算的特性。 根据本发明的方法包括以下步骤:对用于测量被测器件的高频特性的两个传输线串联连接在两个端子之间的辅助测量装置和在两个端子之间并联连接的寄生元件进行建模, 两条传输线和一条地面; 并且通过使用每个传输线的相位角将参考测量点移动到两个传输线的结点,并且通过使用所述差异来计算被测量对象的辅助测量装置的端子处的基准阻抗 每个端口的反射系数。