会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 1. 发明申请
    • METHOD FOR MANUFACTURING SEMICONDUCTOR LIGHT-EMITTING DEVICE
    • 制造半导体发光器件的方法
    • US20120070924A1
    • 2012-03-22
    • US12976492
    • 2010-12-22
    • Su Hyoung SONKyoung Jin KimWon Keun ChoEun Mi KoHyung Sun Hwang
    • Su Hyoung SONKyoung Jin KimWon Keun ChoEun Mi KoHyung Sun Hwang
    • H01L33/44H01L33/50
    • H01L33/007H01L33/22
    • Disclosed is a method for manufacturing a semiconductor light-emitting device, which carries out a wet-etching process after a dry-etching process so as to form protrusions in a surface of a substrate for growing a nitride semiconductor material thereon. The method comprises coating a substrate with photoresist; forming a mask pattern on the substrate by selectively removing the photoresist; forming protrusions on the substrate by dry-etching the substrate with the mask pattern through the use of etching gas; wet-etching the dry-etched substrate through the use of etching solution; forming a first semiconductor layer on the substrate including the protrusions; forming an active layer on the first semiconductor layer; forming a second semiconductor layer on the active layer; etching predetermined portions of the active layer and second semiconductor layer until the first semiconductor layer is exposed; and forming a first electrode on a predetermined portion of the first semiconductor layer, wherein the active layer and second semiconductor layer are not formed on the predetermined portion of the first semiconductor layer, and forming a second electrode on the second semiconductor layer.
    • 公开了一种半导体发光器件的制造方法,该半导体发光器件在干蚀刻工艺之后进行湿蚀刻工艺,以在其上形成氮化物半导体材料的衬底的表面中形成突起。 该方法包括用光刻胶涂覆基底; 通过选择性地除去光致抗蚀剂在衬底上形成掩模图案; 通过使用蚀刻气体通过用掩模图案干蚀刻基板在基板上形成突起; 通过使用蚀刻溶液湿法蚀刻干蚀刻基板; 在包括所述突起的所述基板上形成第一半导体层; 在所述第一半导体层上形成有源层; 在所述有源层上形成第二半导体层; 蚀刻有源层和第二半导体层的预定部分直到暴露第一​​半导体层; 以及在所述第一半导体层的预定部分上形成第一电极,其中所述有源层和所述第二半导体层未形成在所述第一半导体层的所述预定部分上,并且在所述第二半导体层上形成第二电极。
    • 2. 发明授权
    • Method for manufacturing semiconductor light-emitting device
    • 半导体发光元件的制造方法
    • US08298842B2
    • 2012-10-30
    • US12976492
    • 2010-12-22
    • Su Hyoung SonKyoung Jin KimWon Keun ChoEun Mi KoHyung Sun Hwang
    • Su Hyoung SonKyoung Jin KimWon Keun ChoEun Mi KoHyung Sun Hwang
    • H01L21/00
    • H01L33/007H01L33/22
    • Disclosed is a method for manufacturing a semiconductor light-emitting device, which carries out a wet-etching process after a dry-etching process so as to form protrusions in a surface of a substrate for growing a nitride semiconductor material thereon. The method comprises coating a substrate with photoresist; forming a mask pattern on the substrate by selectively removing the photoresist; forming protrusions on the substrate by dry-etching the substrate with the mask pattern through the use of etching gas; wet-etching the dry-etched substrate through the use of etching solution; forming a first semiconductor layer on the substrate including the protrusions; forming an active layer on the first semiconductor layer; forming a second semiconductor layer on the active layer; etching predetermined portions of the active layer and second semiconductor layer until the first semiconductor layer is exposed; and forming a first electrode on a predetermined portion of the first semiconductor layer, wherein the active layer and second semiconductor layer are not formed on the predetermined portion of the first semiconductor layer, and forming a second electrode on the second semiconductor layer.
    • 公开了一种半导体发光器件的制造方法,该半导体发光器件在干蚀刻工艺之后进行湿蚀刻工艺,以在其上形成氮化物半导体材料的衬底的表面中形成突起。 该方法包括用光刻胶涂覆基底; 通过选择性地除去光致抗蚀剂在衬底上形成掩模图案; 通过使用蚀刻气体通过用掩模图案干蚀刻基板在基板上形成突起; 通过使用蚀刻溶液湿法蚀刻干蚀刻基板; 在包括所述突起的所述基板上形成第一半导体层; 在所述第一半导体层上形成有源层; 在所述有源层上形成第二半导体层; 蚀刻有源层和第二半导体层的预定部分直到暴露第一​​半导体层; 以及在所述第一半导体层的预定部分上形成第一电极,其中所述有源层和所述第二半导体层未形成在所述第一半导体层的所述预定部分上,并且在所述第二半导体层上形成第二电极。