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    • 1. 发明申请
    • Detector array and device using the same
    • 检测器阵列和使用相同的设备
    • US20070286337A1
    • 2007-12-13
    • US11789095
    • 2007-04-23
    • Xuewu WangZhiqiang ChenYuanjing LiHuaqiang ZhongQingjun ZhangShuqing Zhao
    • Xuewu WangZhiqiang ChenYuanjing LiHuaqiang ZhongQingjun ZhangShuqing Zhao
    • G01N23/087G01N23/223
    • G01N23/087A61B6/482G01N2223/5015G01V5/0041
    • Disclosed is a detector array comprising a first linear array for detecting a first ray and a second ray which penetrate through a first plurality of parts of the inspected object to acquire first values and second values for the first plurality of parts, wherein the second ray is alternately emitted with the first ray; and a second linear array arranged parallel to the first linear array for detecting the first ray and the second ray which penetrate through a second plurality of parts of the inspected object to acquire third values and fourth values for the second plurality of parts, wherein the first plurality of parts is partly identical to the second plurality of parts. With the detector array, the efficiency and material discrimination accuracy can be improved in the scanning inspection of the inspected object by use of alternate dual-energy rays.
    • 公开了一种检测器阵列,其包括用于检测第一射线的第一线性阵列和穿透被检查对象的第一多个部分的第二射线,以获取第一多个部分的第一值和第二值,其中第二射线为 与第一根光线交替发射; 以及平行于所述第一线性阵列布置的第二线性阵列,用于检测所述第一射线,并且所述第二射线穿透所述被检查物体的第二多个部分,以获得所述第二多个部分的第三值和第四值,其中所述第一 多个部分与第二多个部分部分相同。 利用检测器阵列,通过使用替代的双能量射线,可以提高检查对象的扫描检查中的效率和材料辨别精度。
    • 2. 发明授权
    • Detector array and device using the same
    • 检测器阵列和使用相同的设备
    • US07724869B2
    • 2010-05-25
    • US11789095
    • 2007-04-23
    • Xuewu WangZhiqiang ChenYuanjing LiHuaqiang ZhongQingjun ZhangShuqing Zhao
    • Xuewu WangZhiqiang ChenYuanjing LiHuaqiang ZhongQingjun ZhangShuqing Zhao
    • G01N23/087
    • G01N23/087A61B6/482G01N2223/5015G01V5/0041
    • Disclosed is a detector array comprising a first linear array for detecting a first ray and a second ray which penetrate through a first plurality of parts of the inspected object to acquire first values and second values for the first plurality of parts, wherein the second ray is alternately emitted with the first ray; and a second linear array arranged parallel to the first linear array for detecting the first ray and the second ray which penetrate through a second plurality of parts of the inspected object to acquire third values and fourth values for the second plurality of parts, wherein the first plurality of parts is partly identical to the second plurality of parts. With the detector array, the efficiency and material discrimination accuracy can be improved in the scanning inspection of the inspected object by use of alternate dual-energy rays.
    • 公开了一种检测器阵列,其包括用于检测第一射线的第一线性阵列和穿透被检查对象的第一多个部分的第二射线,以获取第一多个部分的第一值和第二值,其中第二射线为 与第一根光线交替发射; 以及平行于所述第一线性阵列布置的第二线性阵列,用于检测所述第一射线,并且所述第二射线穿透所述被检查物体的第二多个部分,以获得所述第二多个部分的第三值和第四值,其中所述第一 多个部分与第二多个部分部分相同。 利用检测器阵列,通过使用替代的双能量射线,可以提高检查对象的扫描检查中的效率和材料辨别精度。