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    • 1. 发明授权
    • Beam homogenizer, laser irradiation apparatus, and method for manufacturing semiconductor device
    • 光束均化器,激光照射装置以及半导体装置的制造方法
    • US07916987B2
    • 2011-03-29
    • US12149969
    • 2008-05-12
    • Koichiro TanakaHirotada Oishi
    • Koichiro TanakaHirotada Oishi
    • G02B6/12G02B6/26
    • H01L21/02617G02B6/001G02B6/0048G02B6/0055G02B6/262G02B27/0927G02B27/095G02B27/0977G02B27/0994
    • The present invention is to provide a beam homogenizer, a laser irradiation apparatus, and a method for manufacturing a semiconductor device, which can suppress the loss of a laser beam and form a beam spot having homogeneous energy distribution constantly on an irradiation surface without being affected by beam parameters of a laser beam. A deflector is provided at an entrance of an optical waveguide or a light pipe used for homogenizing a laser beam emitted from a laser oscillator. A pair of reflection planes of the deflector is provided so as to have a tilt angle to an optical axis of the laser beam, whereby the entrance of the optical waveguide or the light pipe is expanded. Accordingly, the loss of the laser beam can be suppressed. Moreover, by providing an angle adjusting mechanism to the deflector, a beam spot having homogeneous energy distribution can be formed at an exit of the optical waveguide.
    • 本发明提供一种光束均化器,激光照射装置和半导体装置的制造方法,其能够抑制激光束的损失,并且在照射面上不间断地形成具有均匀的能量分布的束斑而不受影响 通过激光束的光束参数。 在用于使从激光振荡器发射的激光束均匀化的光波导或光管的入口处设置偏转器。 偏转器的一对反射面被设置为具有与激光束的光轴的倾斜角,从而扩大了光波导或光管的入射。 因此,可以抑制激光束的损失。 此外,通过向偏转器设置角度调节机构,可以在光波导的出口处形成具有均匀能量分布的束斑。
    • 2. 发明申请
    • Method for manufacturing a semiconductor device and laser irradiation method and laser irradiation apparatus
    • 半导体装置的制造方法及激光照射方法及激光照射装置
    • US20070184590A1
    • 2007-08-09
    • US10792797
    • 2004-03-05
    • Koichiro TanakaHirotada OishiShunpei Yamazaki
    • Koichiro TanakaHirotada OishiShunpei Yamazaki
    • H01L21/84H01L21/00
    • H01L21/02683H01L21/2026H01L27/1285H01L27/1296
    • [Object]When the CW laser is employed for annealing the semiconductor film, a device having a high characteristic can be expected. On the other hand, when the beam shaped to be elliptical is scanned on the semiconductor film, a proportion of excimer-like crystal grain region becomes large and this is a problem in point of high integration. The present invention is to make the excimer-like crystal grain region formed over the semiconductor film as small as possible. [Solution]In the present invention, a fundamental wave having a wavelength of approximately 1 μm is irradiated supplementarily to the semiconductor film, which is the irradiated surface, simultaneously with a harmonic emitted from a CW laser. In addition, the fundamental wave is irradiated with a large amount of energy to a region irradiated by the harmonic with a small amount of energy, and the fundamental wave is irradiated with a small amount of energy to a region irradiated by the harmonic with a large amount of energy. Thus it becomes possible to form the long crystal grain region in the semiconductor film while suppressing the formation of the excimer-like crystal grain region.
    • [对象]当使用CW激光来退火半导体膜时,可以期望具有高特性的器件。 另一方面,当在半导体膜上扫描成为椭圆形的光束时,受激准体样晶粒区域的比例变大,这是高集成度的问题。 本发明是使半导体膜上形成的准分子状晶粒区域尽可能地小。 在本发明中,与从CW激光发出的谐波同时地,将照射表面的半导体膜附加地照射波长约1μm的基波。 此外,用大量的能量照射到由谐波照射的区域,以大量的能量照射基波,并且将基波以少量的能量照射到具有大的谐波的照射区域 能量的数量。 因此,可以在抑制准分子样晶粒区域的形成的同时,在半导体膜中形成长晶粒区域。
    • 3. 发明申请
    • Laser irradiation apparatus, laser irradiation method, and manufacturing method of semiconductor device
    • 激光照射装置,激光照射方法以及半导体装置的制造方法
    • US20070138151A1
    • 2007-06-21
    • US11636596
    • 2006-12-11
    • Koichiro TanakaHirotada Oishi
    • Koichiro TanakaHirotada Oishi
    • B23K26/00B23K26/06H01L21/268
    • H01L21/268B23K26/066B23K26/082H01L21/0237H01L21/0268H01L21/02691
    • To provide a laser irradiation apparatus and a laser irradiation method in which a region formed with microcrystals in a region irradiated with laser beams is decreased by disposing a slit in an optical system using a deflector, and laser processing can be favorably conducted to a semiconductor film. Further to provide a semiconductor manufacturing apparatus using the above-described laser irradiation apparatus and the laser irradiation method. In the optical system, an f-θ lens having an image space telecentric characteristic or a slit the shape of which is changed in accordance with the incidence angle of a laser beam, is used. The slit is disposed between the f-θ lens and an irradiation surface, and an image at a slit opening portion is projected onto the irradiation surface by a projection lens. By the above-described structure, laser irradiation can be uniformly conducted to a whole region scanned with laser beams.
    • 为了提供一种激光照射装置和激光照射方法,其中通过在使用偏转器的光学系统中设置狭缝来减少在激光束照射的区域中形成微晶的区域,并且可以有利地对半导体膜进行激光加工 。 此外,提供使用上述激光照射装置的半导体制造装置和激光照射方法。 在光学系统中,使用具有图像空间远心特性的f-theta透镜或其形状根据激光束的入射角而改变的狭缝。 狭缝设置在f-theta透镜和照射面之间,并且通过投影透镜将狭缝开口部分的图像投影到照射表面上。 通过上述结构,可以将激光照射均匀地传导到用激光束扫描的整个区域。
    • 6. 发明授权
    • Photomask
    • 光掩模
    • US08512917B2
    • 2013-08-20
    • US13093974
    • 2011-04-26
    • Hideaki ShishidoYuto YakuboHirotada Oishi
    • Hideaki ShishidoYuto YakuboHirotada Oishi
    • G03F1/26G03F1/36
    • G03F1/36
    • A photomask is provided, with which the roundness of a corner portion of a resist mask can be reduced in a photolithography step. Further, a method for manufacturing a semiconductor device with less variation is provided. A photomask includes an auxiliary pattern at a corner portion of a light-blocking portion, and (k+1) sides (k is a natural number of 3 or more) form k obtuse angles in the auxiliary pattern. Alternatively, a photomask includes an auxiliary pattern at a corner portion of a light-blocking portion, and the auxiliary pattern includes a zigzag curve.
    • 提供了一种光掩模,利用该光掩模可以在光刻步骤中减小抗蚀剂掩模的角部的圆度。 此外,提供了一种具有较小变化的半导体器件的制造方法。 光掩模在遮光部分的角部包括辅助图案,并且辅助图案中的(k + 1)边(k是3以上的自然数)形成k个钝角。 或者,光掩模在遮光部分的角部包括辅助图案,并且辅助图案包括锯齿形曲线。
    • 7. 发明授权
    • Laser irradiation apparatus, laser irradiation method, and manufacturing method of semiconductor device
    • 激光照射装置,激光照射方法以及半导体装置的制造方法
    • US08455790B2
    • 2013-06-04
    • US11636596
    • 2006-12-11
    • Koichiro TanakaHirotada Oishi
    • Koichiro TanakaHirotada Oishi
    • H01L21/428H01L21/426
    • H01L21/268B23K26/066B23K26/082H01L21/0237H01L21/0268H01L21/02691
    • To provide a laser irradiation apparatus and a laser irradiation method in which a region formed with microcrystals in a region irradiated with laser beams is decreased by disposing a slit in an optical system using a deflector, and laser processing can be favorably conducted to a semiconductor film. Further to provide a semiconductor manufacturing apparatus using the above-described laser irradiation apparatus and the laser irradiation method. In the optical system, an f-θ lens having an image space telecentric characteristic or a slit the shape of which is changed in accordance with the incidence angle of a laser beam, is used. The slit is disposed between the f-θ lens and an irradiation surface, and an image at a slit opening portion is projected onto the irradiation surface by a projection lens. By the above-described structure, laser irradiation can be uniformly conducted to a whole region scanned with laser beams.
    • 为了提供一种激光照射装置和激光照射方法,其中通过在使用偏转器的光学系统中设置狭缝来减少在激光束照射的区域中形成微晶的区域,并且可以有利地对半导体膜进行激光加工 。 此外,提供使用上述激光照射装置的半导体制造装置和激光照射方法。 在光学系统中,使用具有图像空间远心特性的f-theta透镜或其形状根据激光束的入射角而改变的狭缝。 狭缝设置在f-theta透镜和照射面之间,并且通过投影透镜将狭缝开口部分的图像投影到照射表面上。 通过上述结构,可以将激光照射均匀地传导到用激光束扫描的整个区域。