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    • 1. 发明申请
    • ELECTROSTATIC CHUCK DEVICE
    • 静电切割装置
    • US20080062609A1
    • 2008-03-13
    • US11834957
    • 2007-08-07
    • Shinji HIMORIShoichiro MATSUYAMAAtsushi MATSUURAHiroshi INAZUMACHIMamoru KOSAKAI
    • Shinji HIMORIShoichiro MATSUYAMAAtsushi MATSUURAHiroshi INAZUMACHIMamoru KOSAKAI
    • H01L21/683
    • H01L21/6833
    • An electrostatic chuck device includes: an electrostatic chuck section including a substrate, which has a main surface serving as a mounting surface on which a plate-like sample is mounted and an electrostatic-adsorption inner electrode built therein, and a power supply terminal for applying a DC voltage to the electrostatic-adsorption inner electrode; and a metal base section that is fixed to the other main surface of the electrostatic chuck section so as to be incorporated into a body and that serves as a high frequency generating electrode. Here, the electrostatic-adsorption inner electrode has one or more electrode portions, and a resistance value of a distance between a point corresponding to a center axis of the substrate or a point closest to the center axis and a point most distant from the center axis among distances between two points in the electrode portion is in the range of 102Ω to 1010Ω.
    • 静电吸盘装置包括:静电吸盘部,其具有基板,其具有作为安装有板状试样的安装面的主面和内置有静电吸附内部电极的基板,以及用于施加电力的端子 到静电吸附内部电极的DC电压; 以及固定在静电卡盘部的另一个主面上的金属基部,以结合到主体中并作为高频发生电极。 这里,静电吸附内电极具有一个或多个电极部分,并且与基板的中心轴线相对应的点或最靠近中心轴线的点之间的距离的电阻值和最远离中心轴线的点 在电极部分的两点之间的距离之间的距离在10欧姆到10微米的范围内。
    • 2. 发明授权
    • Susceptor device
    • 受体装置
    • US06838646B2
    • 2005-01-04
    • US10644292
    • 2003-08-20
    • Hiroshi InazumachiMamoru Kosakai
    • Hiroshi InazumachiMamoru Kosakai
    • H01L21/00H01L21/687H05B3/68G23C16/00
    • H01L21/67109H01J37/32724H01J2237/2001H01L21/67103H01L21/68785
    • A susceptor device comprises a susceptor base body, a temperature controlling section, an adhesive layer which attaches the susceptor base body and the temperature controlling section unitarily, an O-ring which is disposed near a peripheral section of the adhesive layer, a circular O-ring which is disposed on a bottom surface of the temperature controlling section, an O-ring supporting section which surrounds the temperature controlling section and compresses the O-rings on the temperature controlling section, and pushup screws which push up and fix the O-ring supporting section toward the temperature controlling section. By doing this, it is possible to protect the adhesive layer from an external environment. Also, it is possible to provide a susceptor device having a superior temperature controlling characteristics for the plate sample, operational stability, and durability.
    • 感受器装置包括基座主体,温度控制部,将基座主体和温度控制部一体地安装的粘合层,设置在粘合剂层的周边部附近的O形环,圆形O形环, 环,设置在温度控制部的底面上,O形环支撑部,其围绕温度控制部并压缩温度控制部上的O形环;以及推压螺钉,其向上并固定O形环 支撑部分朝向温度控制部分。 通过这样做,可以保护粘合剂层免受外部环境的影响。 此外,可以提供一种具有优异的板样品温度控制特性的基座装置,操作稳定性和耐久性。
    • 3. 发明授权
    • Electrostatic chuck
    • 静电吸盘
    • US07619870B2
    • 2009-11-17
    • US11834994
    • 2007-08-07
    • Shinji HimoriShoichiro MatsuyamaAtsushi MatsuuraHiroshi InazumachiMamoru KosakaiYukio MiuraKeigo Maki
    • Shinji HimoriShoichiro MatsuyamaAtsushi MatsuuraHiroshi InazumachiMamoru KosakaiYukio MiuraKeigo Maki
    • H01T23/00
    • H01L21/6833
    • An electrostatic chuck device includes an electrostatic chuck section including a substrate and a power supply terminal for applying a DC voltage to an electrostatic-adsorption inner electrode; and a metal base section fixed to the other main surface of the electrostatic chuck section. Here, a concave portion is formed in the main surface of the metal base section facing the electrostatic chuck section and a dielectric plate is fixed to the concave portion. The dielectric plate and the electrostatic chuck section are adhesively bonded to each other with an insulating adhesive bonding layer interposed therebetween. The dielectric plate and the concave portion are adhesively bonded to each other with an insulating adhesive bonding layer interposed therebetween. The dielectric constant of the insulating adhesive bonding layer is smaller than that of any one of the dielectric plate and the substrate.
    • 静电吸盘装置包括:静电吸盘部,其包括基板和用于向静电吸附内部电极施加直流电压的电源端子; 以及固定在静电吸盘部的另一个主面上的金属基部。 这里,在面向静电卡盘部的金属基部的主面上形成有凹部,电介质板固定在凹部。 电介质板和静电卡盘部分之间插入绝缘粘合剂粘合层彼此粘合。 电介质板和凹部通过绝缘性粘合剂层粘合而彼此接合。 绝缘粘合剂接合层的介电常数小于介质板和基板中的任何一种的介电常数。
    • 5. 发明申请
    • ELECTROSTATIC CHUCK DEVICE
    • 静电切割装置
    • US20100002354A1
    • 2010-01-07
    • US12310094
    • 2007-08-01
    • Hiroshi InazumachiMamoru KosakaiMiura YukioKeigo Maki
    • Hiroshi InazumachiMamoru KosakaiMiura YukioKeigo Maki
    • H01L21/683
    • H01L21/6833H02N13/00Y10T279/23
    • An electrostatic chuck device which enables to perform a plasma process having high in-plane uniformity to a plane-like sample by improving the in-plane uniformity of the electric field intensity in a plasma when applied to a plasma processing apparatus. Specifically disclosed is an electrostatic chuck device (21) including an electrostatic chuck section (22), a metal base section (23) serving as a high-frequency generating electrode, and an insulating plate (24). The electrostatic chuck section (22) is composed of a dielectric plate (31) whose top surface (31a) serves as a mounting surface on which a plate-like sample (W) is placed, a supporting plate (32), an electrostatic-adsorption inner electrode (25), and an insulating layer (33). The electrostatic-adsorption inner electrode (25) is made of a composite sintered body containing an insulating ceramic and silicon carbide, while having a volumetric resistance of not less than 1.0×10−1 Ωcm but not more than 1.0×108 Ωcm.
    • 一种静电吸盘装置,其能够通过提高施加到等离子体处理装置时等离子体中的电场强度的面内均匀性,而对平面状样品进行具有高面内均匀性的等离子体处理。 具体公开了一种静电卡盘装置(21),包括静电卡盘部(22),作为高频发生电极的金属基部(23)和绝缘板(24)。 静电吸盘部(22)由电极板(31)构成,电介质板(31)的顶面(31a)作为其上放置有板状样品(W)的安装面,支撑板(32) 吸附内电极(25)和绝缘层(33)。 静电吸附内部电极(25)由含有绝缘陶瓷和碳化硅的复合烧结体构成,体积电阻为1.0×10 -1Ω〜1.0×10 8Ω·cm以上。
    • 9. 发明授权
    • Electrostatic chuck device
    • 静电吸盘装置
    • US08264813B2
    • 2012-09-11
    • US12310094
    • 2007-08-01
    • Hiroshi InazumachiMamoru KosakaiYukio MiuraKeigo Maki
    • Hiroshi InazumachiMamoru KosakaiYukio MiuraKeigo Maki
    • H02H1/00
    • H01L21/6833H02N13/00Y10T279/23
    • An electrostatic chuck device which enables to perform a plasma process having high in-plane uniformity to a plane-like sample by improving the in-plane uniformity of the electric field intensity in a plasma when applied to a plasma processing apparatus. Specifically disclosed is an electrostatic chuck device (21) including an electrostatic chuck section (22), a metal base section (23) serving as a high-frequency generating electrode, and an insulating plate (24). The electrostatic chuck section (22) is composed of a dielectric plate (31) whose top surface (31a) serves as a mounting surface on which a plate-like sample (W) is placed, a supporting plate (32), an electrostatic-adsorption inner electrode (25), and an insulating layer (33). The electrostatic-adsorption inner electrode (25) is made of a composite sintered body containing an insulating ceramic and silicon carbide, while having a volumetric resistance of not less than 1.0×10−1 Ωcm but not more than 1.0×108 Ωcm.
    • 一种静电吸盘装置,其能够通过提高施加到等离子体处理装置时等离子体中的电场强度的面内均匀性,而对平面状样品进行具有高面内均匀性的等离子体处理。 具体公开了一种静电卡盘装置(21),包括静电卡盘部(22),作为高频发生电极的金属基部(23)和绝缘板(24)。 静电吸盘部(22)由电极板(31)构成,电介质板(31)的顶面(31a)作为其上放置有板状样品(W)的安装面,支撑板(32) 吸附内电极(25)和绝缘层(33)。 静电吸附内部电极(25)由含有绝缘陶瓷和碳化硅的复合烧结体构成,体积电阻为1.0×10 -1以上且OHgr cm以上且1.0×10 8Ω以下。 厘米。