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1. 发明授权

US06332790B1 Card connector 有权
标题翻译：卡连接器
公开(公告)号：US06332790B1
公开(公告)日：2001-12-25
申请号：US09739115
申请日：2000-12-19
申请人： Yasuhiro Ishikawa , Masao Suzuki , Hideo Tadokoro , Seiya Amatatsu , Atsushi Nakanishi
发明人： Yasuhiro Ishikawa , Masao Suzuki , Hideo Tadokoro , Seiya Amatatsu , Atsushi Nakanishi
IPC分类号： H01R1362
CPC分类号： G06K13/0856 , H01R13/635
摘要： A card connector 1 comprising a card member 3 having card-side terminals 9 on the leading edge thereof, a card holding member 5 which has mother-apparatus-side terminals on the leading edge thereof and which the card member 3 can be inserted in and extracted from, and a slider 7 which slides inside the card holding member 5 along with the insertion and extraction of the card member 3. An oscillating member 27 which can oscillate freely is provided in the slider 7, an engaging protrusion 29 which engages with the engaging indention on the card member 3 is formed in the mid section of the oscillating member 27, and a cam protrusion 31 is provided at the tip of the oscillating member 27. A cam groove 19 is provided on the inside side wall of the card holding member 5 in opposition to the tip of the cam protrusion 31. By means of the cam mechanism consisting of the cam protrusion 31 and the cam grove 19, the card member 3 is held in the card holding member 5 in the state where the card-side terminals 9 are in contact with the mother-apparatus-side terminals 17 as a result of the card member 3 being pushed into the card holding member 5, and the card member 3 is positioned and held in the position where it can be inserted in and extracted from the card holding member 5.
摘要翻译：一种卡连接器1，包括在其前缘具有卡侧端子9的卡构件3，卡保持构件5，其前缘具有母装置侧端子，卡构件3可插入其中，以及滑动件7，滑动件7与卡片部件3的插入和拔出一起在卡片保持部件5内滑动。滑块7设置有能够自由摆动的摆动部件27，在摆动构件27的中间部分形成卡片构件3上的接合凹槽，并且在摆动构件27的尖端处设置有凸轮突起31.凸轮槽19设置在卡夹持件的内侧壁上构件5与凸轮突起31的尖端相对。通过由凸轮突起31和凸轮槽19构成的凸轮机构，卡构件3在卡片保持构件5的状态下被保持在卡保持构件5中。呃 e端子9由于卡构件3被推入卡保持构件5而与母设备侧端子17接触，并且卡构件3被定位并保持在其可以插入的位置并从卡保持部件5中取出。

2. 发明授权

US5552602A Electron microscope 失效
标题翻译：电子显微镜
公开(公告)号：US5552602A
公开(公告)日：1996-09-03
申请号：US398684
申请日：1995-03-06
申请人： Hiroshi Kakibayashi , Yasuhiro Mitsui , Hideo Tadokoro , Katsuhiro Kuroda , Masanari Koguchi , Kazutaka Tsuji , Tatsuo Makishima , Mikio Ichihashi , Shigeto Isakozawa
发明人： Hiroshi Kakibayashi , Yasuhiro Mitsui , Hideo Tadokoro , Katsuhiro Kuroda , Masanari Koguchi , Kazutaka Tsuji , Tatsuo Makishima , Mikio Ichihashi , Shigeto Isakozawa
IPC分类号： G01N23/04 , G01R31/305 , H01J37/26
CPC分类号： G01R31/305 , G01N23/046 , G01N2223/419 , H01J2237/226
摘要： 3-dimensional observation on the atomic arrangement and atomic species in a thin-film specimen as well as conventional electron microscope observations is carried out at high speed and accuracy by an electron microscope which measures electrons emitted at high angle from the specimen. For that purpose, the present invention provides a scanning transmission electron microscope having an electron detection device comprising a scintillator converting electrons detected thereby to photons, a photoconductive-film converting photons from the scintillator detected thereby to c.a. 1000 times as many electron-hole pairs as these photons (i.d. avalanche multiplication), an electron gun emitting an electron beam toward the photoconductive-film to detect the holes generated therein, and electron deflector electrodes deflecting the electron beam on the photoconductive-film. Avalanche multiplication in the photoconductive-film amplifies the signal of these photons at so high signal-to-noise ratio that the electron microscope in this invention can detect such weak electrons as emitted at high angle from the specimen at high sensitivity and resolution. Therefore this invention enables a scanning transmission electron microscope to obtain for example 3-dimensional image of point defects and impurity elements existing in joint interfaces and contacts in a ULSI device rapidly and accurately.
摘要翻译：通过电子显微镜以高速和准确的方式对薄膜样品中的原子排列和原子种类进行3维观察，以及常规的电子显微镜观察，测量从样品以高角度发射的电子。为此目的，本发明提供了一种具有电子检测装置的扫描透射电子显微镜，该电子检测装置包括将由此检测的电子转化为光子的闪烁体，从其检测的闪烁体的光电导膜转换光子至c.a. 与这些光子（i.d.雪崩乘法）一样多的电子 - 空穴对的1000倍，向光电导膜发射电子束以检测其中产生的空穴的电子枪以及偏转电子束在光电导膜上的电子偏转器电极。光电导膜中的雪崩乘法以如此高的信噪比放大了这些光子的信号，使得本发明的电子显微镜能够以高灵敏度和分辨率从样品中以高角度检测出这样的弱电子。因此，本发明能够使扫描透射电子显微镜能够快速，准确地获得例如存在于ULSI装置的接合界面和触点中的点缺陷和杂质元素的3维图像。

3. 发明授权

US4559718A Method and apparatus for drying semiconductor wafers 失效
标题翻译：用于干燥半导体晶片的方法和设备
公开(公告)号：US4559718A
公开(公告)日：1985-12-24
申请号：US633134
申请日：1984-07-23
申请人： Hideo Tadokoro
发明人： Hideo Tadokoro
IPC分类号： F26B5/08
CPC分类号： H01L21/6838 , F26B5/08 , H01L21/67034 , Y10S414/135 , Y10T279/11
摘要： A semiconductor wafer is held on a first rotating element in a manner having a first portion of one surface of the wafer stuck on the first rotating element. The first rotating element is rotated together with the wafer thus held thereon to remove moisture from surface portions of the wafer other than the first portion. Then, the wafer is held on a second rotating element in a manner having a second portion of the one surface of the wafer stuck on the second rotating element. The second rotating element is rotated together with the wafer thus held thereon to remove moisture from the surfaces of the wafer including at least the first portion thereof, thereby completely drying the wafer.
摘要翻译：半导体晶片以第一旋转元件的一个表面的第一部分粘贴在第一旋转元件上的方式保持在第一旋转元件上。第一旋转元件与被保持在其上的晶片一起旋转以除去除了第一部分之外的晶片的表面部分的水分。然后，将晶片以具有粘贴在第二旋转元件上的晶片的一个表面的第二部分的方式固定在第二旋转元件上。第二旋转元件与如此保持在其上的晶片一起旋转，以从晶片的至少其第一部分的表面除去水分，从而完全干燥晶片。

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