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    • 1. 发明授权
    • Memory bit line segment isolation
    • 内存位线隔离
    • US07042765B2
    • 2006-05-09
    • US10912824
    • 2004-08-06
    • James M. SibigtrothGeorge L. EspinorBruce L. Morton
    • James M. SibigtrothGeorge L. EspinorBruce L. Morton
    • G11C16/04
    • G11C7/18G11C7/12G11C16/06G11C16/24G11C2207/005G11C2216/22
    • A single memory array (10) has an isolation circuit for isolating segments of a same bit line (Seg1 BL0, Seg2 BL0) from each other. The isolation circuit (16) permits memory cells located in one segment (12) of an array to be read while memory cells of another segment (14) of the array are being erased. In one example, the isolation circuit (16) electrically couples the segments during a read or program of memory cells located on the second segment (Seg2 BL0). Program information stored in the single memory array may always be accessed while a portion of the same array is erased. Dynamic variation of the size of the isolated bit line segment occurs when multiple isolation circuits are used to create more than two array segments.
    • 单个存储器阵列(10)具有用于隔离相同位线(Seg1BL0,Seg2BL0)的段的隔离电路。 隔离电路(16)允许位于阵列的一个段(12)中的存储器单元被读取,同时阵列的另一段(14)的存储单元被擦除。 在一个示例中,隔离电路(16)在位于第二段(Seg 2 BL 0)上的存储单元的读取或编程期间电耦合该段。 存储在单个存储器阵列中的程序信息可以总是被访问,而同一阵列的一部分被擦除。 当使用多个隔离电路创建两个以上的阵列段时,发生隔离位线段的大小的动态变化。
    • 2. 发明授权
    • Method and apparatus for protecting an integrated circuit from erroneous operation
    • 用于保护集成电路免于错误操作的方法和装置
    • US07187600B2
    • 2007-03-06
    • US10946951
    • 2004-09-22
    • James M. SibigtrothGeorge L. EspinorBruce L. MortonMichael C. Wood
    • James M. SibigtrothGeorge L. EspinorBruce L. MortonMichael C. Wood
    • G11C7/00
    • G11C7/1006G11C5/145G11C7/24G11C16/12G11C2207/104
    • A data processing system (10) has an embedded non-volatile memory (22) that is programmed and erased by use of a high voltage provided by a charge pump (78). In order to prevent the non-volatile memory (22) from being inadvertently programmed or erased during low power supply voltage conditions, the charge pump (78) is disabled and discharged when the power supply voltage drops below a predetermined value. This is accomplished by enabling a low voltage detect circuit (110) in response to a program or erase operation being initiated. A control register (76) will provide a high voltage enable signal to the charge pump (78) only when a power supply valid signal is received. In another embodiment, the low voltage detect circuit (110) may be enabled by another condition to protect the data processing system (10) from an authorized access.
    • 数据处理系统(10)具有通过使用由电荷泵(78)提供的高电压来编程和擦除的嵌入式非易失性存储器(22)。 为了防止在低电源电压条件期间非易失性存储器(22)被无意地编程或擦除,当电源电压降低到预定值以下时,电荷泵(78)被禁用和放电。 这是通过响应于开始的编程或擦除操作启用低电压检测电路(110)来实现的。 仅当接收到电源有效信号时,控制寄存器(76)将向电荷泵(78)提供高电压使能信号。 在另一个实施例中,低电压检测电路(110)可以被另一条件启用,以保护数据处理系统(10)免受授权访问。
    • 4. 发明授权
    • Low voltage detection system
    • 低电压检测系统
    • US07293188B2
    • 2007-11-06
    • US10292323
    • 2002-11-12
    • George L. EspinorWilliam L. LucasMichael C. Wood
    • George L. EspinorWilliam L. LucasMichael C. Wood
    • G06F1/28
    • G06F1/3203G06F1/28G06F1/30
    • A low voltage detection (LVD) system for a logic device includes a first LVD circuit (110) to provide an indicator when a supply pin voltage (109) falls below a first voltage level, and a second LVD circuit (116) to provide an interrupt (118) when the supply pin voltage falls below a second voltage level. In one embodiment, the second LVD circuit consumes more power than the first LVD circuit, and is therefore selectively enabled. In one embodiment, when the supply pin voltage is between the first and second voltage levels and the logic device is in a stop or low power mode, the second LVD circuit is periodically enabled to monitor the supply pin voltage. After the supply pin voltage falls below the second voltage level, the logic device is placed in a safe state where the logic device is inhibited from acknowledging interrupts until the supply pin voltage rises above the first voltage level.
    • 用于逻辑器件的低电压检测(LVD)系统包括第一LVD电路(110),用于当电源引脚电压(109)低于第一电压电平时提供指示器;以及第二LVD电路(116) 当电源引脚电压低于第二电压电平时,中断(118)。 在一个实施例中,第二LVD电路比第一LVD电路消耗更多的功率,因此被选择性地使能。 在一个实施例中,当电源引脚电压处于第一和第二电压电平之间并且逻辑器件处于停止或低功率模式时,周期性地使第二LVD电路监视电源引脚电压。 在电源引脚电压低于第二电压电平之后,逻辑器件处于安全状态,在该状态下,禁止逻辑器件确认中断,直到电源引脚电压升高到高于第一电压电平。
    • 5. 发明授权
    • Method for operating a memory array
    • 操作存储器阵列的方法
    • US5706228A
    • 1998-01-06
    • US603939
    • 1996-02-20
    • Kuo-Tung ChangCraig A. CavinsKo-Min ChangBruce L. MortonGeorge L. Espinor
    • Kuo-Tung ChangCraig A. CavinsKo-Min ChangBruce L. MortonGeorge L. Espinor
    • G11C16/04G11C16/10G11C11/40
    • G11C16/3427G11C16/0433G11C16/10
    • A memory array (25) having a selected memory cell (10) and an unselected memory cell (30) is programmed and read. Each memory cell in the memory array (25) contains an isolation transistor (22) and a floating gate transistor (23). To program the selected memory cell (10), programming voltages are applied to a control gate line (21), a drain line (14), an isolation line (19), and a source line (12). To reduce the effects of the drain disturb problem, a gate terminal (32) of the unselected memory cell (30) is held at a positive voltage. To read selected memory cell (10), a read voltage is applied to an isolation gate line (31) of unselected memory cell (30) which insures that the unselected memory cell (30) does not conduct or contribute to leakage current and power consumption during the read operation.
    • 具有选定的存储单元(10)和未选择的存储单元(30)的存储器阵列(25)被编程和读取。 存储器阵列(25)中的每个存储单元包含隔离晶体管(22)和浮动栅极晶体管(23)。 为了对所选择的存储单元(10)进行编程,将编程电压施加到控制栅极线(21),漏极线(14),隔离线(19)和源极线(12)。 为了减小漏极干扰问题的影响,未选择的存储单元(30)的栅极端子(32)被保持在正电压。 为了读取所选择的存储单元(10),读取电压被施加到未选择存储单元(30)的隔离栅极线(31),其确保未选择的存储单元(30)不导通或有助于漏电流和功耗 在读操作期间。
    • 6. 发明授权
    • Data processor having operating modes selected by at least one mask
option bit and method therefor
    • 具有由至少一个掩码选项位选择的操作模式的数据处理器及其方法
    • US5598569A
    • 1997-01-28
    • US323558
    • 1994-10-17
    • Michael I. CatherwoodGeorge L. Espinor
    • Michael I. CatherwoodGeorge L. Espinor
    • G11C5/00G11C16/20G06F12/16
    • G06F9/30079G11C16/20
    • A data processor (20) includes a nonvolatile memory system (25) which stores not only normal program memory (31), but also mask option bits (32), within a common array (30) of nonvolatile memory cells. A control circuit (40) of the nonvolatile memory system (25) detects when a central processing unit (21) is accessing the program memory (31). In response to either an end of reset signal or a refresh request signal, the control circuit (40) copies the mask option bits (32) into a volatile mask option register (44) only when the central processing unit (21) is not accessing the program memory (31). Otherwise, the control circuit (40) holds off the access to the mask option bits (32). The mask option register (44) provides signals to various circuits (28) to control their operation. Thus, the mask option bits (32) may be stored in nonvolatile form in the same array (30) as the program memory (31), enhancing reliability and reducing integrated circuit size.
    • 数据处理器(20)包括非易失性存储器系统(25),其在非易失性存储器单元的公共阵列(30)内不仅存储正常程序存储器(31),而且存储掩模选项位(32)。 非易失性存储器系统(25)的控制电路(40)检测中央处理单元(21)何时正在访问程序存储器(31)。 响应于复位信号的结束或刷新请求信号,仅当中央处理单元(21)不访问时,控制电路(40)将掩模选项位(32)复制到易失性掩模选项寄存器(44) 程序存储器(31)。 否则,控制电路(40)停止对掩模选项位(32)的访问。 掩模选项寄存器(44)向各种电路(28)提供信号以控制其操作。 因此,掩模选项位(32)可以以与程序存储器(31)相同的阵列(30)以非易失性形式存储,增强了可靠性并降低了集成电路尺寸。