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    • 7. 发明授权
    • Method and apparatus for controlled transient cavitation
    • 用于控制瞬态空化的方法和装置
    • US08202369B2
    • 2012-06-19
    • US12119313
    • 2008-05-12
    • Frank HolsteynsKuntack Lee
    • Frank HolsteynsKuntack Lee
    • B08B7/04B08B7/00B08B7/02
    • B08B3/02B08B3/12B08B2203/0288G10K15/043H01L21/02052H01L21/67051H01L21/67057Y10S134/902
    • Methods and apparatus for creating and controlling transient cavitation are disclosed. An example method includes selecting a range of bubble sizes to be created in a liquid and selecting characteristics for an acoustic field to be applied to the liquid. The method further includes creating gas bubbles of the selected range of bubble sizes in the liquid, creating an acoustic field with the selected characteristics and subjecting the liquid to the acoustic field. In the example method, at least one of the range of bubble sizes and the characteristics of the acoustic field is selected in correspondence with the other so as to control transient cavitation in the liquid for the selected range of bubble sizes. Particularly, the methods and apparatus may be used for the cleaning of a surface, such as a semiconductor substrate.
    • 公开了用于创建和控制瞬时空化的方法和装置。 一个示例性方法包括选择要在液体中产生的气泡大小的范围,并选择要施加到液体的声场的特性。 该方法还包括在液体中产生气泡尺寸选定范围的气泡,产生具有选定特性的声场并使液体经受声场。 在该示例性方法中,气泡尺寸范围和声场的特性中的至少一个与另一个对应地选择,以便在所选择的气泡尺寸范围内控制液体中的瞬时空化。 特别地,所述方法和装置可用于清洁表面,例如半导体衬底。
    • 9. 发明授权
    • Method and apparatus for defect detection
    • 缺陷检测方法和装置
    • US07016028B2
    • 2006-03-21
    • US10458405
    • 2003-06-09
    • Frank HolsteynsFrancesca IacopiKaren Maex
    • Frank HolsteynsFrancesca IacopiKaren Maex
    • G01N21/88
    • H01L22/24G01N21/8422G01N21/9501
    • A method for determining the presence of defects in a covering layer overlying an underlying layer in accordance with an embodiment of the invention comprises providing a substrate comprising the covering layer, where the covering layer is at least partially exposed. The covering layer is subjected to a first substance, such as a solvent, and then subjected to a light beam. An optical property of the covering layer is determined and compared with a threshold value. The presence of defects in the covering layer is determined by the difference of the optical property from the threshold value, where the optical property indicates a level of penetration of the first substance through the covering layer.
    • 根据本发明的实施例的用于确定覆盖层的覆盖层中的缺陷的存在的方法包括提供包括覆盖层的基底,其中覆盖层至少部分地暴露。 将覆盖层经受第一物质,例如溶剂,然后经受光束。 确定覆盖层的光学特性并将其与阈值进行比较。 覆盖层中的缺陷的存在由光学性质与阈值的差异决定,其中光学特性表示第一物质穿过覆盖层的穿透水平。