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    • 1. 发明授权
    • Probe card
    • 探针卡
    • US08723545B2
    • 2014-05-13
    • US13286858
    • 2011-11-01
    • Duk Kyu LeeChang Min ImSang Bum SimYun Kee Cho
    • Duk Kyu LeeChang Min ImSang Bum SimYun Kee Cho
    • G01R31/00
    • G01R1/07378
    • A probe card facilitates a wiring connection, reducing working time and preventing a working error and includes a main circuit board having an opening in its center. A reinforcement member has a lower end coupled to that opening to prevent deforming the board. A sub-circuit board electrically connected to the main board is seated on an upper side of the reinforcement member. A space transformer is positioned on a lower portion of the opening of the main board. A plurality of wires have both ends inserted into through holes in the sub-circuit board and space transformer to electrically connect them. Probes are provided on a lower portion of the space transformer, each having one end in contact with the wire inserted into the through-hole of the space transformer and the other end in contact with a wafer to be tested.
    • 探针卡有助于接线连接,减少工作时间并防止工作错误,并且包括在其中心具有开口的主电路板。 加强构件具有联接到该开口的下端,以防止板的变形。 电连接到主板的子电路板位于加强构件的上侧。 空间变压器位于主板的开口的下部。 多根导线的两端插入到副电路板和空间变压器的通孔中,以将它们电连接。 探针设置在空间变压器的下部,每个探针的一端与插入空间变压器的通孔的导线接触,另一端与待测试的晶片接触。
    • 2. 发明申请
    • Probe Card
    • 探头卡
    • US20120146677A1
    • 2012-06-14
    • US13286858
    • 2011-11-01
    • Duk Kyu LeeChang Min ImSang Bum SimYun Kee Cho
    • Duk Kyu LeeChang Min ImSang Bum SimYun Kee Cho
    • G01R1/067
    • G01R1/07378
    • A probe card facilitates a wiring connection, reducing working time and preventing a working error and includes a main circuit board having an opening in its center. A reinforcement member has a lower end coupled to that opening to prevent deforming the board. A sub-circuit board electrically connected to the main board is seated on an upper side of the reinforcement member. A space transformer is positioned on a lower portion of the opening of the main board. A plurality of wires have both ends inserted into through holes in the sub-circuit board and space transformer to electrically connect them. Probes are provided on a lower portion of the space transformer, each having one end in contact with the wire inserted into the through-hole of the space transformer and the other end in contact with a wafer to be tested.
    • 探针卡有助于接线连接,减少工作时间并防止工作错误,并且包括在其中心具有开口的主电路板。 加强构件具有联接到该开口的下端,以防止板的变形。 电连接到主板的子电路板位于加强构件的上侧。 空间变压器位于主板的开口的下部。 多根导线的两端插入到副电路板和空间变压器的通孔中,以将它们电连接。 探针设置在空间变压器的下部,每个探针的一端与插入空间变压器的通孔的导线接触,另一端与待测试的晶片接触。