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1. 发明申请

US20130118779A1 CLEARANCE FILLING PRINTED CIRCUIT BOARD AND METHOD OF MANUFACTURING THE SAME 审中-公开
标题翻译：透明印刷电路板及其制造方法
公开(公告)号：US20130118779A1
公开(公告)日：2013-05-16
申请号：US13416029
申请日：2012-03-09
申请人： Duke Kyu LEE , Chang Min IM , Sang Bum SIM , Yun Kee CHO , Hyun-Soo JEON
发明人： Duke Kyu LEE , Chang Min IM , Sang Bum SIM , Yun Kee CHO , Hyun-Soo JEON
IPC分类号： H05K1/02 , H05K3/22
CPC分类号： H05K1/11 , H05K3/22 , H05K2201/09881 , H05K2203/025
摘要： A clearance filling PCB includes pin contact units on a surface of the external layer of the PCB and clearance filling units formed by molding a clearance between the pin contact units and polishing an insulating layer so that the height of the insulating layer becomes equal to the height of the pin contact units in order to prevent the sliding of a fine pitch circuit with a pin and induce accurate contact between the fine pitch circuit and the pin, and a method of manufacturing the same. The height of the insulating layer is made equal to the height of the pin contact units by molding the clearance between the pin contact units on the surface of the external layer of the PCB, and the sliding of a fine pitch circuit, requiring contacts, with a pin can be prevented.
摘要翻译：间隙填充PCB包括在PCB的外层的表面上的销接触单元和通过在引脚接触单元之间模制间隙并抛光绝缘层而形成的间隙填充单元，使得绝缘层的高度等于高度的引脚接触单元及其制造方法，以防止精细间距电路与引脚的滑动并引起精细间距电路和引脚之间的精确接触。绝缘层的高度通过模制PCB的外部层的表面上的引脚接触单元之间的间隙和需要触点的细间距电路的滑动而使引脚接触单元的高度等于可以防止引脚。

2. 发明授权

US08723545B2 Probe card 失效
标题翻译：探针卡
公开(公告)号：US08723545B2
公开(公告)日：2014-05-13
申请号：US13286858
申请日：2011-11-01
申请人： Duk Kyu Lee , Chang Min Im , Sang Bum Sim , Yun Kee Cho
发明人： Duk Kyu Lee , Chang Min Im , Sang Bum Sim , Yun Kee Cho
IPC分类号： G01R31/00
CPC分类号： G01R1/07378
摘要： A probe card facilitates a wiring connection, reducing working time and preventing a working error and includes a main circuit board having an opening in its center. A reinforcement member has a lower end coupled to that opening to prevent deforming the board. A sub-circuit board electrically connected to the main board is seated on an upper side of the reinforcement member. A space transformer is positioned on a lower portion of the opening of the main board. A plurality of wires have both ends inserted into through holes in the sub-circuit board and space transformer to electrically connect them. Probes are provided on a lower portion of the space transformer, each having one end in contact with the wire inserted into the through-hole of the space transformer and the other end in contact with a wafer to be tested.
摘要翻译：探针卡有助于接线连接，减少工作时间并防止工作错误，并且包括在其中心具有开口的主电路板。加强构件具有联接到该开口的下端，以防止板的变形。电连接到主板的子电路板位于加强构件的上侧。空间变压器位于主板的开口的下部。多根导线的两端插入到副电路板和空间变压器的通孔中，以将它们电连接。探针设置在空间变压器的下部，每个探针的一端与插入空间变压器的通孔的导线接触，另一端与待测试的晶片接触。

3. 发明申请

US20120146677A1 Probe Card 失效
标题翻译：探头卡
公开(公告)号：US20120146677A1
公开(公告)日：2012-06-14
申请号：US13286858
申请日：2011-11-01
申请人： Duk Kyu Lee , Chang Min Im , Sang Bum Sim , Yun Kee Cho
发明人： Duk Kyu Lee , Chang Min Im , Sang Bum Sim , Yun Kee Cho
IPC分类号： G01R1/067
CPC分类号： G01R1/07378
摘要： A probe card facilitates a wiring connection, reducing working time and preventing a working error and includes a main circuit board having an opening in its center. A reinforcement member has a lower end coupled to that opening to prevent deforming the board. A sub-circuit board electrically connected to the main board is seated on an upper side of the reinforcement member. A space transformer is positioned on a lower portion of the opening of the main board. A plurality of wires have both ends inserted into through holes in the sub-circuit board and space transformer to electrically connect them. Probes are provided on a lower portion of the space transformer, each having one end in contact with the wire inserted into the through-hole of the space transformer and the other end in contact with a wafer to be tested.
摘要翻译：探针卡有助于接线连接，减少工作时间并防止工作错误，并且包括在其中心具有开口的主电路板。加强构件具有联接到该开口的下端，以防止板的变形。电连接到主板的子电路板位于加强构件的上侧。空间变压器位于主板的开口的下部。多根导线的两端插入到副电路板和空间变压器的通孔中，以将它们电连接。探针设置在空间变压器的下部，每个探针的一端与插入空间变压器的通孔的导线接触，另一端与待测试的晶片接触。

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