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    • 2. 发明申请
    • Surface treatment and surface scanning
    • 表面处理和表面扫描
    • US20050280174A1
    • 2005-12-22
    • US11156839
    • 2005-06-20
    • Gerd BinnigWalter HaeberleDorothea Wiesmann
    • Gerd BinnigWalter HaeberleDorothea Wiesmann
    • B29C37/02G01Q10/00G01Q70/16G01Q80/00G11B9/00
    • G11B9/1454G01Q70/06G01Q80/00G11B9/1481
    • Provides surface treatment devices, surface scanning devices, methods of operating a surface treatment device and methods of operating a surface scanning device. An area within a medium comprises at least one sharpening location for sharpening a tip of a probe mechanically. The tip is conically shaped with a radius of an apex smaller than 100 nm. In the case of the surface treatment device the probe is designed for altering the surface of the medium. In the case of the surface scanning device the probe is designed for scanning the medium. The sharpening location is suited for sharpening the tip mechanically. For that purpose the probe and the medium are being moved relative to each other such that the tip is located in the sharpening location. Then the probe and/or the medium are moved relative to each other such, that the tip is mechanically sharpened.
    • 提供表面处理装置,表面扫描装置,操作表面处理装置的方法和操作表面扫描装置的方法。 介质内的区域包括至少一个磨削位置,用于机械地磨削探头的尖端。 尖端圆锥形,顶点的半径小于100nm。 在表面处理装置的情况下,探针设计用于改变介质的表面。 在表面扫描装置的情况下,探针设计用于扫描介质。 磨削位置适用于机械地磨尖。 为此,探针和介质相对于彼此移动,使得尖端位于磨刀位置。 然后探针和/或介质相对于彼此移动,使得尖端被机械地磨削。