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    • 2. 发明授权
    • Programmable local clock buffer
    • 可编程本地时钟缓冲器
    • US07719315B2
    • 2010-05-18
    • US11554666
    • 2006-10-31
    • Hung C. NgoJente B. KuangJames D. WarnockDieter F. Wendel
    • Hung C. NgoJente B. KuangJames D. WarnockDieter F. Wendel
    • H03K19/00
    • G06F1/10G01R31/318552
    • A programmable clock generator circuit receives control signals and a global clock and generates a pulsed data clock and a scan clock in response to gating signals. The clock generator has data clock and scan clock feed-forward paths and a single feedback path. Delay control signals program delay elements in the feedback path and logic gates reshape and generate a feedback clock signal. The global clock and the feedback clock signal are combined to generates a pulsed local clock signal. A scan clock feed-forward circuit receives the local clock and generates the scan clock. A data clock feed-forward circuit receives the local clock and generates the data clock with a logic controlled delay relative to the local clock signal. The feedback clock is generated with controlled delay thereby modifying the pulse width of the data and scan clocks independent of the controlled delay of the data clock feed-forward path.
    • 可编程时钟发生器电路接收控制信号和全局时钟,并响应门控信号产生脉冲数据时钟和扫描时钟。 时钟发生器具有数据时钟和扫描时钟前馈路径和单个反馈路径。 延迟控制信号在反馈路径中的程序延迟元件和逻辑门重新形成并产生反馈时钟信号。 全局时钟和反馈时钟信号被组合以产生脉冲本地时钟信号。 扫描时钟前馈电路接收本地时钟并产生扫描时钟。 数据时钟前馈电路接收本地时钟并产生相对于本地时钟信号的逻辑控制延迟的数据时钟。 以受控的延迟产生反馈时钟,从而修改数据的脉冲宽度和扫描时钟,而与数据时钟前馈路径的受控延迟无关。
    • 3. 发明申请
    • PULSED LOCAL CLOCK BUFFER (LCB) CHARACTERIZATION RING OSCILLATOR
    • 脉冲本地时钟缓冲器(LCB)特征振荡器
    • US20080100360A1
    • 2008-05-01
    • US11553014
    • 2006-10-26
    • Hung C. NgoJente B. KuangJames D. WarnockDieter F. Wendel
    • Hung C. NgoJente B. KuangJames D. WarnockDieter F. Wendel
    • H03K3/017
    • H03K3/017G01R31/31727G06F1/10H03K3/0315H03K5/133H03K5/135H03K5/156
    • In an exemplary embodiment of the present invention, a local clock buffer (LCB) fabricated in a semiconductor receives a global clock signal as input. The LCB implements a pulse width controller that is operationally coupled to the LCB and an output driver forming a ring oscillator. The output driver outputs a pulse width adjusted signal. The pulse width of the pulse width adjusted signal is adjustable by way of the pulse width controller and is related in frequency to the global clock signal. A second ring oscillator (also referred to as the nclk loop) can also be implemented to server as the global clock signal. The pulse width controller can be used to precisely adjust the pulse width of the pulse width adjusted signal. A pulse width multiplier can be implemented to allow direct observation and measurement of the pulse width of the pulse width adjusted signal.
    • 在本发明的示例性实施例中,在半导体中制造的本地时钟缓冲器(LCB)接收全局时钟信号作为输入。 LCB实现了可操作地耦合到LCB的脉冲宽度控制器和形成环形振荡器的输出驱动器。 输出驱动器输出脉宽调整信号。 脉冲宽度调整信号的脉冲宽度可通过脉冲宽度控制器进行调节,并与频率相关于全局时钟信号。 第二个环形振荡器(也称为nclk回路)也可以实现为服务器作为全局时钟信号。 脉冲宽度控制器可用于精确调整脉宽调整信号的脉宽。 可以实现脉冲宽度乘法器,以便直接观察和测量脉冲宽度调整信号的脉冲宽度。
    • 4. 发明授权
    • Pulsed local clock buffer (LCB) characterization ring oscillator
    • 脉冲本地时钟缓冲器(LCB)表征环形振荡器
    • US07459950B2
    • 2008-12-02
    • US11553014
    • 2006-10-26
    • Hung C. NgoJente B. KuangJames D. WarnockDieter F. Wendel
    • Hung C. NgoJente B. KuangJames D. WarnockDieter F. Wendel
    • H03K3/017
    • H03K3/017G01R31/31727G06F1/10H03K3/0315H03K5/133H03K5/135H03K5/156
    • In an exemplary embodiment of the present invention, a local clock buffer (LCB) fabricated in a semiconductor receives a global clock signal as input. The LCB implements a pulse width controller that is operationally coupled to the LCB and an output driver forming a ring oscillator. The output driver outputs a pulse width adjusted signal. The pulse width of the pulse width adjusted signal is adjustable by way of the pulse width controller and is related in frequency to the global clock signal. A second ring oscillator (also referred to as the nclk loop) can also be implemented to server as the global clock signal. The pulse width controller can be used to precisely adjust the pulse width of the pulse width adjusted signal. A pulse width multiplier can be implemented to allow direct observation and measurement of the pulse width of the pulse width adjusted signal.
    • 在本发明的示例性实施例中,在半导体中制造的本地时钟缓冲器(LCB)接收全局时钟信号作为输入。 LCB实现了可操作地耦合到LCB的脉冲宽度控制器和形成环形振荡器的输出驱动器。 输出驱动器输出脉宽调整信号。 脉冲宽度调整信号的脉冲宽度可通过脉冲宽度控制器进行调节,并与频率相关于全局时钟信号。 第二个环形振荡器(也称为nclk回路)也可以实现为服务器作为全局时钟信号。 脉冲宽度控制器可用于精确调整脉宽调整信号的脉宽。 可以实现脉冲宽度乘法器,以便直接观察和测量脉冲宽度调整信号的脉冲宽度。
    • 5. 发明授权
    • System and method for testing self-timed memory arrays
    • 用于测试自定时存储器阵列的系统和方法
    • US5896399A
    • 1999-04-20
    • US763493
    • 1996-12-11
    • George McNeil LattimoreMichael Kevin CiraulaDieter F. WendelManoj KumarFriedrich-Christian Wernicke
    • George McNeil LattimoreMichael Kevin CiraulaDieter F. WendelManoj KumarFriedrich-Christian Wernicke
    • G11C29/14G11C29/00
    • G11C29/14
    • The present invention applies a Static Evaluate technique to a memory array in a selective manner that allows some parts of the array to use the technique, and yet keeps the array area and timing unaffected for normal operation. The present invention allows the decode functions of the memory array to become pseudo-static during a first part of a clock cycle. In addition, if a write function is being performed, the write data is also held pseudo-static and is not written until a second part of a clock cycle when all addresses and data have stabilized. The invention can be used for system debug, product bring-up, or burn-in, even if there are non-functional race paths. A system and method of testing and burning in self-timed memory arrays includes a Static Evaluate circuit applied to the decoding function and the writing function of the array, a circuit for holding an address or write data inactive for the first part of a cycle, a circuit for activating the address or write data for the second part of a cycle, and a circuit for ensuring that the array resets correctly.
    • 本发明以选择性方式将静态评估技术应用于存储器阵列,其允许阵列的某些部分使用该技术,并且仍保持阵列区域和定时不受正常操作的影响。 本发明允许存储器阵列的解码功能在时钟周期的第一部分期间变为伪静态。 此外,如果正在执行写入功能,则写入数据也保持为伪静态,并且在所有地址和数据均已稳定时,不会写入时钟周期的第二部分。 即使存在非功能性赛跑路径,本发明也可用于系统调试,产品开机或老化。 在自定时存储器阵列中测试和刻录的系统和方法包括应用于解码功能的静态评估电路和阵列的写入功能,用于保持地址或写入对于循环的第一部分无效的数据的电路, 用于激活用于周期的第二部分的地址或写入数据的电路,以及用于确保阵列正确复位的电路。
    • 8. 发明授权
    • Scannable dynamic logic latch circuit
    • 可扫描动态逻辑锁存电路
    • US07372305B1
    • 2008-05-13
    • US11554685
    • 2006-10-31
    • Hung C. NgoJente B. KuangJames D. WarnockDieter F. Wendel
    • Hung C. NgoJente B. KuangJames D. WarnockDieter F. Wendel
    • H03K19/096
    • H03K19/096G01R31/318541
    • A scannable latch incorporates a logic front end that has at least one dynamic logic gate that has a logic tree that perform the normal Boolean logic operation. The dynamic logic gate is combined a scan pull-down logic tree that is coupled to a scan hold latch output and to the dynamic node of the dynamic logic gate. A scan clock and a normal clock determine whether the logic circuitry is in the normal logic mode or in the scan test mode. A static output latch has at least one input that is responsive logic state of a dynamic node. The evaluated state of the dynamic node is set by either the logic tree of the dynamic logic gate or the scan pull-down logic tree of the scan circuitry in response to the logic state of the scan clock or the normal clock.
    • 可扫描的锁存器包含具有至少一个具有执行正常布尔逻辑运算的逻辑树的动态逻辑门的逻辑前端。 动态逻辑门被组合成扫描下拉逻辑树,其被耦合到扫描保持锁存器输出和动态逻辑门的动态节点。 扫描时钟和正常时钟确定逻辑电路是处于正常逻辑模式还是处于扫描测试模式。 静态输出锁存器具有至少一个作为动态节点的响应逻辑状态的输入。 响应于扫描时钟或正常时钟的逻辑状态,动态节点的评估状态由动态逻辑门的逻辑树或扫描电路的扫描下拉逻辑树来设置。
    • 9. 发明申请
    • SCANNABLE DYNAMIC LOGIC LATCH CIRCUIT
    • SCANNABLE动态逻辑锁存电路
    • US20080100344A1
    • 2008-05-01
    • US11554685
    • 2006-10-31
    • Hung C. NgoJente B. KuangJames D. WarnockDieter F. Wendel
    • Hung C. NgoJente B. KuangJames D. WarnockDieter F. Wendel
    • H03K19/096
    • H03K19/096G01R31/318541
    • A scannable latch incorporates a logic front end that has at least one dynamic logic gate that has a logic tree that perform the normal Boolean logic operation. The dynamic logic gate is combined a scan pull-down logic tree that is coupled to a scan hold latch output and to the dynamic node of the dynamic logic gate. A scan clock and a normal clock determine whether the logic circuitry is in the normal logic mode or in the scan test mode. A static output latch has at least one input that is responsive logic state of a dynamic node. The evaluated state of the dynamic node is set by either the logic tree of the dynamic logic gate or the scan pull-down logic tree of the scan circuitry in response to the logic state of the scan clock or the normal clock.
    • 可扫描的锁存器包含具有至少一个具有执行正常布尔逻辑运算的逻辑树的动态逻辑门的逻辑前端。 动态逻辑门被组合成扫描下拉逻辑树,其被耦合到扫描保持锁存器输出和动态逻辑门的动态节点。 扫描时钟和正常时钟确定逻辑电路是处于正常逻辑模式还是处于扫描测试模式。 静态输出锁存器具有至少一个作为动态节点的响应逻辑状态的输入。 响应于扫描时钟或正常时钟的逻辑状态,动态节点的评估状态由动态逻辑门的逻辑树或扫描电路的扫描下拉逻辑树来设置。