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1. 发明授权

US6014032A Micro probe ring assembly and method of fabrication 失效
标题翻译：微型探针环组件及其制造方法
公开(公告)号：US6014032A
公开(公告)日：2000-01-11
申请号：US940915
申请日：1997-09-30
申请人： John Thomas Maddix , Anthony Michael Palagonia , Paul Joseph Pikna , David Paul Vallett
发明人： John Thomas Maddix , Anthony Michael Palagonia , Paul Joseph Pikna , David Paul Vallett
IPC分类号： G01R1/067 , G01R1/073 , G01R31/02
CPC分类号： G01R1/06711 , G01R1/07342
摘要： A multi-probe ring assembly including integral fine probe tips, conductive lines with terminal connection for testing semiconductor devices and a method of construction of the multi-probe ring assembly is described. The method of construction described utilizes the step of etching pits into silicon wafers to produce molds for forming the probe points. Semiconductor machining processes are used to complete the probe ring assembly.
摘要翻译：描述了包括整体精细探针尖端，具有用于测试半导体器件的端子连接的导线以及多探针环组件的构造方法的多探针环组件。所描述的结构的方法利用将凹坑蚀刻到硅晶片中以形成用于形成探针点的模具的步骤。半导体加工工艺用于完成探头环组件。

2. 发明授权

US06650768B1 Using time resolved light emission from VLSI circuit devices for navigation on complex systems 失效
标题翻译：使用VLSI电路设备的时间分辨光发射在复杂系统上进行导航
公开(公告)号：US06650768B1
公开(公告)日：2003-11-18
申请号：US09026288
申请日：1998-02-19
申请人： Richard James Evans , Jeffrey Alan Kash , Daniel Ray Knebel , Phillip J Nigh , Pia Naoko Sanda , James Chen-Hsiang Tsang , David Paul Vallett
发明人： Richard James Evans , Jeffrey Alan Kash , Daniel Ray Knebel , Phillip J Nigh , Pia Naoko Sanda , James Chen-Hsiang Tsang , David Paul Vallett
IPC分类号： G06K900
CPC分类号： G01R31/311
摘要： A system and method for determining the location of a particular device on an integrated circuit chip is described. The system and method utilize apparatus for detecting the emission of light during switching events of devices in the circuit during the circuit's processing of an input calculated to actuate the device whose location is desired. Light emissions from the circuit can be temporally and spatially indexed so as to allow deduction, in combination with the a priori knowledge of the logical operation of the circuit, of the location of the desired element. In another embodiment of the invention, a series of images of the circuit can be accumulated, representing the circuit's response to a series of different input signals, each input signal being designed to result in the switching of the desired element. The series of images can be compared to determine the location of the desired element. Also in accordance with the invention, the elements to be located can be either actual functional circuit elements, or fiducials added to the chip for test purposes.
摘要翻译：描述用于确定集成电路芯片上的特定装置的位置的系统和方法。该系统和方法利用在电路处理计算出的驱动所需位置的装置的输入的处理期间检测电路中装置的切换事件期间发光的装置。来自电路的光发射可以在时间上和空间上被索引，以便结合对电路的逻辑操作的先验知识来扣除所需元件的位置。在本发明的另一个实施例中，可以累积电路的一系列图像，表示电路对一系列不同输入信号的响应，每个输入信号被设计成导致期望元件的切换。可以比较一系列图像以确定所需元素的位置。同样根据本发明，待设置的元件可以是实际的功能电路元件，或者为了测试目的添加到芯片的基准。

3. 发明授权

US06232143B1 Micro probe ring assembly and method of fabrication 失效
标题翻译：微型探针环组件及其制造方法
公开(公告)号：US06232143B1
公开(公告)日：2001-05-15
申请号：US09448110
申请日：1999-11-23
申请人： John Thomas Maddix , Anthony Michael Palagonia , Paul Joseph Pikna , David Paul Vallett
发明人： John Thomas Maddix , Anthony Michael Palagonia , Paul Joseph Pikna , David Paul Vallett
IPC分类号： H01L2144
CPC分类号： G01R1/06711 , G01R1/07342
摘要： A multi-probe ring assembly including integral fine probe tips, conductive lines with terminal connection for testing semiconductor devices and a method of construction of the multi-probe ring assembly is described. The method of construction described utilizes the step of etching pits into silicon wafers to produce molds for forming the probe points. Semiconductor machining processes are used to complete the probe ring assembly.
摘要翻译：描述了包括整体精细探针尖端，具有用于测试半导体器件的端子连接的导线以及多探针环组件的构造方法的多探针环组件。所描述的结构的方法利用将凹坑蚀刻到硅晶片中以形成用于形成探针点的模具的步骤。半导体加工工艺用于完成探头环组件。

4. 发明授权

US06304668B1 Using time resolved light emission from VLSI circuit devices for navigation on complex systems 失效
公开(公告)号：US06304668B1
公开(公告)日：2001-10-16
申请号：US09026288
申请日：1998-02-19
申请人： Richard James Evans , Jeffrey Alan Kash , Daniel Ray Knebel , Phillip J Nigh , Pia Naoko Sanda , James Chen-Hsiang Tsang , David Paul Vallett
发明人： Richard James Evans , Jeffrey Alan Kash , Daniel Ray Knebel , Phillip J Nigh , Pia Naoko Sanda , James Chen-Hsiang Tsang , David Paul Vallett
IPC分类号： G06K900
摘要： A system and method for determining the location of a particular device on an integrated circuit chip is described. The system and method utilize apparatus for detecting the emission of light during switching events of devices in the circuit during the circuit's processing of an input calculated to actuate the device whose location is desired. Light emissions from the circuit can be temporally and spatially indexed so as to allow deduction, in combination with the a priori knowledge of the logical operation of the circuit, of the location of the desired element. In another embodiment of the invention, a series of images of the circuit can be accumulated, representing the circuit's response to a series of different input signals, each input signal being designed to result in the switching of the desired element. The series of images can be compared to determine the location of the desired element. Also in accordance with the invention, the elements to be located can be either actual functional circuit elements, or fiducials added to the chip for test purposes.

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