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    • 2. 发明申请
    • STRUCTURE AND METHOD FOR PERFORMANCE IMPROVEMENT IN VERTICAL BIPOLAR TRANSISTORS
    • 垂直双极晶体管性能改进的结构和方法
    • US20070200201A1
    • 2007-08-30
    • US11741436
    • 2007-04-27
    • James DUNNDavid HARAMEJeffrey JOHNSONAlvin JOSEPH
    • James DUNNDavid HARAMEJeffrey JOHNSONAlvin JOSEPH
    • H01L27/082
    • H01L29/7371H01L27/0823H01L29/66242
    • A method of forming a semiconductor device having two different strains therein is provided. The method includes forming a strain in a first region with a first straining film, and forming a second strain in a second region with a second straining film. Either of the first or second strains may be either tensile or compressive. Additionally the strains may be formed at right angles to one another and may be additionally formed in the same region. In particular a vertical tensile strain may be formed in a base and collector region of an NPN bipolar transistor and a horizontal compressive strain may be formed in the extrinsic base region of the NPN bipolar transistor. A PNP bipolar transistor may be formed with a compression strain in the base and collector region in the vertical direction and a tensile strain in the extrinsic base region in the horizontal direction.
    • 提供了形成其中具有两个不同应变的半导体器件的方法。 该方法包括在具有第一应变膜的第一区域中形成应变,并且在第二区域中用第二应变膜形成第二应变。 第一或第二应变中的任一种可以是拉伸的或压缩的。 此外,菌株可以彼此成直角形成,并且可以另外形成在相同的区域中。 特别地,可以在NPN双极晶体管的基极和集电极区域中形成垂直拉伸应变,并且可以在NPN双极晶体管的非本征基极区域中形成水平压缩应变。 PNP双极晶体管可以在垂直方向的基极和集电极区域中形成压缩应变,并且在水平方向上在外部基极区域中形成拉伸应变。
    • 3. 发明申请
    • STRUCTURE AND METHOD FOR PERFORMANCE IMPROVEMENT IN VERTICAL BIPOLAR TRANSISTORS
    • 垂直双极晶体管性能改进的结构和方法
    • US20060249813A1
    • 2006-11-09
    • US10908361
    • 2005-05-09
    • James DunnDavid HarameJeffrey JohnsonAlvin Joseph
    • James DunnDavid HarameJeffrey JohnsonAlvin Joseph
    • H01L27/082
    • H01L29/7371H01L27/0823H01L29/66242
    • A method of forming a semiconductor device having two different strains therein is provided. The method includes forming a strain in a first region with a first straining film, and forming a second strain in a second region with a second straining film. Either of the first or second strains may be either tensile or compressive. Additionally the strains may be formed at right angles to one another and may be additionally formed in the same region. In particular a vertical tensile strain may be formed in a base and collector region of an NPN bipolar transistor and a horizontal compressive strain may be formed in the extrinsic base region of the NPN bipolar transistor. A PNP bipolar transistor may be formed with a compression strain in the base and collector region in the vertical direction and a tensile strain in the extrinsic base region in the horizontal direction.
    • 提供了形成其中具有两个不同应变的半导体器件的方法。 该方法包括在具有第一应变膜的第一区域中形成应变,并且在第二区域中用第二应变膜形成第二应变。 第一或第二应变中的任一种可以是拉伸的或压缩的。 此外,菌株可以彼此成直角形成,并且可以另外形成在相同的区域中。 特别地,可以在NPN双极晶体管的基极和集电极区域中形成垂直拉伸应变,并且可以在NPN双极晶体管的非本征基极区域中形成水平压缩应变。 PNP双极晶体管可以在垂直方向的基极和集电极区域中形成压缩应变,并且在水平方向上在外部基极区域中形成拉伸应变。
    • 4. 发明申请
    • STRUCTURE AND METHOD FOR PERFORMANCE IMPROVEMENT IN VERTICAL BIPOLAR TRANSISTORS
    • 垂直双极晶体管性能改进的结构和方法
    • US20080014705A1
    • 2008-01-17
    • US11760288
    • 2007-06-08
    • James DUNNDavid HARAMEJeffrey JOHNSONAlvin JOSEPH
    • James DUNNDavid HARAMEJeffrey JOHNSONAlvin JOSEPH
    • H01L21/331
    • H01L29/7371H01L27/0823H01L29/66242
    • A method of forming a semiconductor device having two different strains therein is provided. The method includes forming a strain in a first region with a first straining film, and forming a second strain in a second region with a second straining film. Either of the first or second strains may be either tensile or compressive. Additionally the strains may be formed at right angles to one another and may be additionally formed in the same region. In particular a vertical tensile strain may be formed in a base and collector region of an NPN bipolar transistor and a horizontal compressive strain may be formed in the extrinsic base region of the NPN bipolar transistor. A PNP bipolar transistor may be formed with a compression strain in the base and collector region in the vertical direction and a tensile strain in the extrinsic base region in the horizontal direction.
    • 提供了形成其中具有两个不同应变的半导体器件的方法。 该方法包括在具有第一应变膜的第一区域中形成应变,并且在第二区域中用第二应变膜形成第二应变。 第一或第二应变中的任一种可以是拉伸的或压缩的。 此外,菌株可以彼此成直角形成,并且可以另外形成在相同的区域中。 特别地,可以在NPN双极晶体管的基极和集电极区域中形成垂直拉伸应变,并且可以在NPN双极晶体管的非本征基极区域中形成水平压缩应变。 PNP双极晶体管可以在垂直方向的基极和集电极区域中形成压缩应变,并且在水平方向上在外部基极区域中形成拉伸应变。