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    • 2. 发明授权
    • Push-pull output circuit
    • 推挽输出电路
    • US4611178A
    • 1986-09-09
    • US732168
    • 1985-05-08
    • Jimmy R. NaylorDavid F. Mietus
    • Jimmy R. NaylorDavid F. Mietus
    • H03M1/66H03F3/30
    • H03F3/3096
    • A low voltage sixteen bit digital-to-analog converter operable between +5 and -5 volt power supplies and capable of providing output voltage levels to within about 1.4 volts of +V.sub.CC and -V.sub.CC includes a push-pull output stage with only a pullup transistor and a pulldown transistor connected in series between the positive and negative supply voltages. The output stage includes circuitry that reduces the base voltage of the pullup transistor or pulldown transistor enough to reduce its collector current to near zero, greatly increasing its effective collector-to-emitter breakdown voltage.
    • 一个低电压十六位数模转换器可在+5和-5伏特电源之间工作,能够将输出电压电平提供到+ VCC左右的1.4伏,-VCC包括一个只有上拉电阻的推挽输出级 晶体管和串联连接在正电源电压和负电源电压之间的下拉晶体管。 输出级包括减小上拉晶体管或下拉式晶体管的基极电压的电路,足以将其集电极电流降至接近零,大大增加其有效的集电极 - 发射极击穿电压。
    • 3. 发明授权
    • Programmable current source and methods of use
    • 可编程电流源和使用方法
    • US07012378B1
    • 2006-03-14
    • US10773962
    • 2004-02-06
    • Michael A. WellsDavid F. Mietus
    • Michael A. WellsDavid F. Mietus
    • G05F1/00
    • G09G3/32G09G2300/0809G09G2310/0272
    • A programmable multiple current source includes a plurality of current source circuits each having current level data storage circuitry. A current level data input terminal and a control input terminal are connected to each current source circuit to supply current level data to the storage circuitry. Peak detector and storage circuitry is coupled to each of the output terminals of the current source circuits. Each associated current source circuit includes a master digital-to-analog converter coupled to the current level data storage circuitry, a driver circuit coupled to the digital-to-analog converter and to the associated current source circuit, comparator and storage circuitry having a first input coupled to the peak detector and storage circuitry and a second input coupled to the driver circuit, and current level adjustment circuitry coupled to the comparator and storage circuitry and the driver circuit.
    • 可编程多电流源包括多个电流源电路,每个电流源电路具有电流数据存储电路。 电流电平数据输入端子和控制输入端子连接到每个电流源电路以将电流电平数据提供给存储电路。 峰值检测器和存储电路耦合到电流源电路的每个输出端子。 每个相关联的电流源电路包括耦合到当前电平数据存储电路的主数模转换器,耦合到数 - 模转换器的驱动电路和相关联的电流源电路,比较器和存储电路,其具有第一 耦合到峰值检测器和存储电路的输入和耦合到驱动器电路的第二输入以及耦合到比较器和存储电路和驱动器电路的电流电平调整电路。
    • 4. 发明授权
    • Input/output electrostatic discharge protection circuit for an
integrated circuit
    • 用于集成电路的输入/输出静电放电保护电路
    • US5610425A
    • 1997-03-11
    • US384047
    • 1995-02-06
    • John H. QuigleyDavid F. Mietus
    • John H. QuigleyDavid F. Mietus
    • H01L29/74H01L21/822H01L27/02H01L27/04H01L29/749H01L29/866H02H7/20H05F3/02H01L23/62
    • H01L27/0262H01L27/0251H01L2924/0002
    • An Input/Output (I/O) circuit (11) for an integrated circuit including Electrostatic Discharge Protection (ESD) circuitry is disclosed. A Silicon Controlled Rectifier SCR (30) is triggered by a transistor (36) which is scaled to an output transistor (24) of the I/O circuit (11) to shunt an ESD event. The SCR (30) couples between a pad (12) and a power supply line V.sub.SS. The transistor (36) is disabled. The triggering mechanism is voltage breakdown of the transistor (36) due to an ESD event. The SCR protection mechanism is process independent since the triggering mechanism is formed similarly to the output transistor (24) and thus breaks-down similarly. Zener diodes (26-29) are coupled to gates of the I/O circuit (11) and between the power supply lines. A phosphorous doping less than 5.0 E18 per cubic centimeter is used to form the cathode of zener diodes (26-29).
    • 公开了一种用于包括静电放电保护(ESD)电路的集成电路的输入/输出(I / O)电路(11)。 硅控整流器SCR(30)由晶体管(36)触发,晶体管(36)被缩放到I / O电路(11)的输出晶体管(24)以分流ESD事件。 SCR(30)耦合在焊盘(12)和电源线VSS之间。 晶体管(36)被禁止。 触发机制是由于ESD事件引起的晶体管(36)的电压击穿。 SCR保护机制是独立于过程的,因为触发机制类似于输出晶体管(24)形成并因此类似地分解。 齐纳二极管(26-29)耦合到I / O电路(11)的栅极和电源线之间。 使用小于5.0E18 /立方厘米的磷掺杂形成齐纳二极管(26-29)的阴极。
    • 7. 发明授权
    • Sensing circuit and method
    • 感应电路及方法
    • US5898617A
    • 1999-04-27
    • US859962
    • 1997-05-21
    • Thomas P. BusheyJames S. CaravellaDavid F. Mietus
    • Thomas P. BusheyJames S. CaravellaDavid F. Mietus
    • G11C16/28G11C16/06
    • G11C16/28
    • A circuit (28) and method of sensing data stored in a memory circuit provide a reference current (I.sub.REF) that tracks memory cell current (I.sub.BIT) over a range of temperatures and power supply voltages. A comparator circuit (66) senses the memory cell current with respect to the reference current to produce the stored data (V.sub.DATA) By sensing current rather than voltage, the voltage swing on a high capacitance bitline (39) can be reduced to improve speed. The reference current is set during testing of the circuit by applying programming voltages (V.sub.WELL, V.sub.CG, V.sub.BL) to a reference device (52) that matches a storage device (36) in the memory cell (30).
    • 检测存储在存储器电路中的数据的电路(28)和方法提供在温度范围和电源电压上跟踪存储单元电流(IBIT)的参考电流(IREF)。 比较器电路(66)相对于参考电流感测存储单元电流以产生存储的数据(VDATA)通过感测电流而不是电压,可以减小高电容位线(39)上的电压摆幅以提高速度。 通过将编程电压(VWELL,VCG,VBL)应用于与存储单元(30)中的存储装置(36)匹配的参考装置(52),在电路测试期间设置参考电流。