会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 9. 发明授权
    • Film bulk acoustic resonator having an air gap and a method for manufacturing the same
    • 具有气隙的薄膜体声共振器及其制造方法
    • US07119638B2
    • 2006-10-10
    • US10827348
    • 2004-04-20
    • Chan-bong JunO-gweon Seo
    • Chan-bong JunO-gweon Seo
    • H03H9/15H03H3/02
    • H03H9/173H03H3/02H03H2003/021Y10T29/42
    • A film bulk acoustic resonator (FBAR) includes a resistance layer deposited on the upper surface of a semiconductor substrate and having a recess therein, a membrane layer on the upper surfaces of the resistance layer and the recess, thereby forming an air gap between the membrane layer and the semiconductor substrate, and a resonator having a lower electrode, a piezoelectric layer, and an upper electrode deposited on the membrane layer. The resistance layer may include first and second resistance layers, the first resistance layer having the recess therein and the second resistance layer being deposited on the upper surfaces of the recess. Thus, the air gap is formed without etching the semiconductor substrate, enhancing the resonant characteristics of the FBAR. Active and/or passive devices can be formed underneath the air gap to be integrated with the FBAR.
    • 薄膜体声波谐振器(FBAR)包括沉积在半导体衬底的上表面上并具有凹部的电阻层,电阻层的上表面上的膜层和凹部,从而在膜之间形成气隙 层和半导体衬底,以及具有沉积在膜层上的下电极,压电层和上电极的谐振器。 电阻层可以包括第一和第二电阻层,第一电阻层具有凹部,第二电阻层沉积在凹部的上表面上。 因此,在不蚀刻半导体衬底的情况下形成气隙,增强了FBAR的谐振特性。 有源和/或无源器件可以形成在气隙下面以与FBAR集成。