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    • 2. 发明授权
    • Memory device having reconfigurable refresh timing
    • 具有可重新配置的刷新时序的存储器件
    • US08874996B2
    • 2014-10-28
    • US13597416
    • 2012-08-29
    • Bu-Il Jung
    • Bu-Il Jung
    • G11C29/00G06F11/10H03M13/29G11C11/00
    • G06F11/1048G11C11/00G11C11/406G11C2029/0411G11C2211/4061G11C2211/4062H03M13/29
    • A memory device comprises a normal storage area comprising first and second subsets configured to store first and second normal data, respectively, an error code storage area configured to store first and second error codes corresponding to the first and second normal data, an error detector configured to receive the first and second normal data and the first and second error codes, and further configured to detect the presence or absence of one or more errors in the first and second normal data or the first and second error codes, and a refresh controller configured to set respective refresh cycle times of the first and second subsets to different values according to the presence or absence of one or more errors in the first and second normal data or error codes.
    • 存储装置包括:正常存储区域,包括分别存储第一和第二正常数据的第一和第二子集;错误代码存储区域,被配置为存储对应于第一和第二正常数据的第一和第二错误代码;配置的错误检测器 接收第一和第二正常数据以及第一和第二错误代码,并且还被配置为检测第一和第二正常数据或第一和第二错误代码中是否存在一个或多个错误,并且配置有刷新控制器 根据第一和第二正常数据或错误代码中存在或不存在一个或多个错误,将第一和第二子集的各个刷新循环时间设置为不同的值。
    • 3. 发明申请
    • MEMORY DEVICE, MEMORY SYSTEM, AND OPERATING METHODS THEREOF
    • 存储器件,存储器系统及其操作方法
    • US20130304982A1
    • 2013-11-14
    • US13836659
    • 2013-03-15
    • Bu Il JUNGSo Young KIM
    • Bu Il JUNGSo Young KIM
    • G11C11/403
    • G11C11/403G11C11/40615G11C11/40622
    • A memory device, a memory system, and operating methods thereof are provided. The method of operating the memory device, which includes a first memory cell and a second memory cell neighboring the first memory cell, includes counting a disturbance value of the second memory cell each time the first memory cell is accessed, updating a disturbance count value of the second memory cell based on the counting, adjusting a refresh schedule based on the disturbance count value of the second memory cell, a desired threshold and a maximum disturbance count value, and resetting the disturbance count value of the second memory cell and the maximum disturbance count value when the second memory cell is refreshed according to the adjusted refresh schedule.
    • 提供了存储器件,存储器系统及其操作方法。 包括与第一存储单元相邻的第一存储器单元和第二存储单元的存储器件的操作方法包括:在每次访问第一存储器单元时对第二存储器单元的干扰值进行计数,更新第二存储单元的扰动计数值 所述第二存储单元基于所述计数,基于所述第二存储单元的干扰计数值,期望阈值和最大扰动计数值来调整刷新调度,以及重置所述第二存储单元的扰动计数值和所述最大扰动 根据调整后的刷新时间表刷新第二存储单元时的计数值。
    • 4. 发明申请
    • Delay circuit for semiconductor device
    • 半导体器件延迟电路
    • US20060170478A1
    • 2006-08-03
    • US11344844
    • 2006-02-01
    • Bu-Il Jung
    • Bu-Il Jung
    • H03H11/26
    • H03H11/265
    • A delay circuit for a semiconductor device includes a variable resistor unit having a resistance value adjusted in response to a control signal, and a variable load unit having a capacitance value adjusted in response to the control signal. The delay circuit of the present invention includes a variable resistor unit having a variable resistance value and a variable load unit having a variable capacitance value. The delay circuit for a semiconductor device can precisely adjust the delay time of a signal. Further, the capacitance of the variable load unit is very low in an operation mode in which the delay circuit of the present invention is controlled so that it has a short delay time. Therefore, the delay time can be adjusted to a short time by the delay circuit of the present invention.
    • 半导体器件的延迟电路包括具有响应于控制信号调整的电阻值的可变电阻器单元和具有响应于控制信号调整的电容值的可变负载单元。 本发明的延迟电路包括具有可变电阻值的可变电阻器单元和具有可变电容值的可变负载单元。 半导体器件的延迟电路可以精确地调整信号的延迟时间。 此外,在本发明的延迟电路被控制为具有短的延迟时间的操作模式中,可变负载单元的电容非常低。 因此,可以通过本发明的延迟电路将延迟时间调整到短时间。
    • 5. 发明授权
    • Memory device, memory system, and operating methods thereof
    • 存储器件,存储器系统及其操作方法
    • US09257169B2
    • 2016-02-09
    • US13836659
    • 2013-03-15
    • Bu Il JungSo Young Kim
    • Bu Il JungSo Young Kim
    • G11C11/40G11C11/403G11C11/406
    • G11C11/403G11C11/40615G11C11/40622
    • A memory device, a memory system, and operating methods thereof are provided. The method of operating the memory device, which includes a first memory cell and a second memory cell neighboring the first memory cell, includes counting a disturbance value of the second memory cell each time the first memory cell is accessed, updating a disturbance count value of the second memory cell based on the counting, adjusting a refresh schedule based on the disturbance count value of the second memory cell, a desired threshold and a maximum disturbance count value, and resetting the disturbance count value of the second memory cell and the maximum disturbance count value when the second memory cell is refreshed according to the adjusted refresh schedule.
    • 提供了存储器件,存储器系统及其操作方法。 包括与第一存储单元相邻的第一存储器单元和第二存储单元的存储器件的操作方法包括:在每次访问第一存储器单元时对第二存储器单元的干扰值进行计数,更新第二存储单元的扰动计数值 所述第二存储单元基于所述计数,基于所述第二存储单元的干扰计数值,期望阈值和最大扰动计数值来调整刷新调度,以及重置所述第二存储单元的扰动计数值和所述最大扰动 根据调整后的刷新时间表刷新第二存储单元时的计数值。
    • 7. 发明授权
    • Power supply apparatus and method
    • 电源装置及方法
    • US07586360B2
    • 2009-09-08
    • US11708353
    • 2007-02-21
    • Bu-Il Jung
    • Bu-Il Jung
    • G05F1/10
    • H02M3/07H02M1/36
    • The apparatus may include a non-pumping power supply unit configured to generate a supply voltage from a power source voltage and/or configured to output the supply voltage. The apparatus may include a pumping power supply unit and/or a control circuit. The pumping power supply unit may be configured to generate a pump voltage based on the power source voltage and/or configured to output the pump voltage. The control circuit may boost the supply voltage with the pump voltage after a level of the supply voltage reaches the first target voltage level.
    • 该装置可以包括被配置为从电源电压产生电源电压和/或被配置为输出电源电压的非泵浦电源单元。 该装置可以包括泵送电源单元和/或控制电路。 泵送电源单元可以被配置为基于电源电压产生泵电压和/或被配置为输出泵电压。 在电源电压达到第一目标电压电平之后,控制电路可以用泵电压升高电源电压。
    • 8. 发明申请
    • Power supply apparatus and method
    • 电源装置及方法
    • US20070200612A1
    • 2007-08-30
    • US11708353
    • 2007-02-21
    • Bu-Il Jung
    • Bu-Il Jung
    • H03K17/00
    • H02M3/07H02M1/36
    • The apparatus may include a non-pumping power supply unit configured to generate a supply voltage from a power source voltage and/or configured to output the supply voltage. The apparatus may include a pumping power supply unit and/or a control circuit. The pumping power supply unit may be configured to generate a pump voltage based on the power source voltage and/or configured to output the pump voltage. The control circuit may boost the supply voltage with the pump voltage after a level of the supply voltage reaches the first target voltage level.
    • 该装置可以包括被配置为从电源电压产生电源电压和/或被配置为输出电源电压的非泵浦电源单元。 该装置可以包括泵送电源单元和/或控制电路。 泵送电源单元可以被配置为基于电源电压产生泵电压和/或被配置为输出泵电压。 在电源电压达到第一目标电压电平之后,控制电路可以用泵电压升高电源电压。