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    • 4. 发明授权
    • Lighting for detention facility
    • 拘留设施照明
    • US07325939B2
    • 2008-02-05
    • US11250672
    • 2005-10-14
    • Brad WilsonTim Scharnagle
    • Brad WilsonTim Scharnagle
    • F21S8/00
    • F21V17/12F21S8/033F21V3/00F21V15/005F21V15/01F21V17/107F21Y2103/00
    • A detention facility lighting fixture includes an elongate unibody housing having a flat back wall, four sidewalls including symmetrically sloped and opposed lengthwise sidewalls and trapezoidally shaped end sidewalls, at least one top wall, and welded seams at each of four corners, a door having a lens frame, a lens, and at least two Z-channels securing the lens to the lens frame, and a hinge secured to the housing, where the door and housing are adapted so that the top surface of the door, when closed, is essentially flush with the at least one top wall. A method includes providing a lighting fixture having a unibody housing with a flat back portion and beveled sidewalls, the housing being structured to receive a lens-holding door, and sealing a perimeter of the lighting fixture to the wall or ceiling with a continuous bead of security caulk.
    • 拘留设施照明器具包括具有平坦的后壁的细长一体式壳体,四个侧壁,包括对称倾斜和相对的纵向侧壁和梯形端部侧壁,至少一个顶壁和四个角中的每一个处的焊接接缝,门具有 透镜框架,透镜以及将透镜固定到透镜框架的至少两个Z形通道,以及固定到壳体的铰链,其中门和壳体被适配成使得当关闭时门的顶部表面基本上是 与至少一个顶壁齐平。 一种方法包括提供具有一体式壳体的照明器具,所述单体壳体具有平坦的背部部分和倾斜的侧壁,所述壳体被构造成容纳透镜保持门,并且用照明器具的周边将墙壁或天花板用连续的珠 安全填缝
    • 9. 发明申请
    • AMBIENT REFLECTIVITY ABSORPTION SYSTEM FOR IDENTIFYING PRECIOUS OR SEMI-PRECIOUS MATERIALS AND ASSOCIATED METHODS
    • 用于识别重要或半密度材料和相关方法的环境反射吸收系统
    • US20130135461A1
    • 2013-05-30
    • US13479934
    • 2012-05-24
    • Dorn SchmidtBrad Wilson
    • Dorn SchmidtBrad Wilson
    • G01N21/55
    • G01N21/55G01N21/314G01N21/3151G01N21/87G01N2021/3155G01N2021/3177G01N2021/3181G01N2201/0616
    • A reflectivity absorption system for identifying a target precious or semi-precious material can include a detector, a filter system, and an output display. The detector system is capable of detecting a reflected electromagnetic radiation at a primary wavelength and a secondary wavelength. The reflected electromagnetic radiation can be produced from sunlight or other light source. The primary wavelength corresponds to an upper reflectivity of the target material while the secondary wavelength corresponds to a lower reflectivity of the target material. Reflectivity is a function of wavelength such that identifiable variations in wavelength can be observed for certain materials over specific wavelength ranges which are then compared to a known standard reflectivity response for the indicated wavelengths. These systems can be used in portable, handheld, or stationary configurations and can identify exposed target materials in real-time.
    • 用于识别目标珍贵或半珍贵材料的反射吸收系统可以包括检测器,过滤器系统和输出显示器。 检测器系统能够检测主波长和次波长的反射电磁辐射。 反射的电磁辐射可以由阳光或其他光源产生。 主波长对应于目标材料的上反射率,而次波长对应于目标材料的较低反射率。 反射率是波长的函数,使得在特定波长范围内可以观察到某些材料的波长的可识别变化,然后将其与所指示的波长的已知标准反射率响应进行比较。 这些系统可用于便携式,手持式或固定式配置,并可实时识别曝光的目标材料。