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1. 发明授权

US07302624B2 Adaptive fault diagnosis of compressed test responses 有权
标题翻译：压缩测试响应的自适应故障诊断
公开(公告)号：US07302624B2
公开(公告)日：2007-11-27
申请号：US11213327
申请日：2005-08-25
申请人： Janusz Rajski , Grzegorz Mrugalski , Artur Pogiel , Jerzy Tyszer , Chen Wang
发明人： Janusz Rajski , Grzegorz Mrugalski , Artur Pogiel , Jerzy Tyszer , Chen Wang
IPC分类号： G01R31/28
CPC分类号： G01R31/318547 , G01R31/31703 , G01R31/318536 , G01R31/318566 , G01R31/318583 , G01R31/31921 , G11C29/40 , G11C29/48 , G11C2029/3202
摘要： Methods, apparatus, and systems for diagnosing failing scan cells from compressed test responses are disclosed herein. For example, in one nonlimiting exemplary embodiment, one or more signatures are received that indicate the presence of one or more errors in one or more corresponding compressed test responses. Scan cells in the circuit-under-test that caused the errors are identified by analyzing the signatures. In this exemplary embodiment, the analysis includes selecting a scan cell candidate that potentially caused an error in a compressed test response based at least partially on a weight value associated with the scan cell candidate, the weight value being indicative of the likelihood that the scan cell candidate caused the error. Tangible computer-readable media comprising computer-executable instructions for causing a computer to perform any of the disclosed methods are also provided. Tangible computer-readable media comprising lists of failing scan cells identified by any of the disclosed methods are also provided.
摘要翻译：本文公开了用于诊断来自压缩测试响应的故障扫描单元的方法，装置和系统。例如，在一个非限制性示例性实施例中，接收指示在一个或多个对应的压缩测试响应中存在一个或多个错误的一个或多个签名。通过分析签名来识别导致错误的电路不足测试中的扫描单元。在该示例性实施例中，分析包括选择至少部分地基于与扫描小区候选者相关联的权重值来潜在地引起压缩测试响应中的错误的扫描小区候选，该权重值表示扫描单元候选人造成错误。还提供了包括用于使计算机执行任何所公开的方法的计算机可执行指令的有形计算机可读介质。还提供了包括由任何所公开的方法识别的故障扫描单元的列表的有形计算机可读介质。

2. 发明申请

US20060041814A1 Fault diagnosis of compressed test responses having one or more unknown states 有权
标题翻译：具有一个或多个未知状态的压缩测试响应的故障诊断
公开(公告)号：US20060041814A1
公开(公告)日：2006-02-23
申请号：US11213672
申请日：2005-08-25
申请人： Janusz Rajski , Grzegorz Mrugalski , Artur Pogiel , Jerzy Tyszer , Chen Wang
发明人： Janusz Rajski , Grzegorz Mrugalski , Artur Pogiel , Jerzy Tyszer , Chen Wang
IPC分类号： G01R31/28 , G06F11/00
CPC分类号： G01R31/318547 , G01R31/31703 , G01R31/318536 , G01R31/318566 , G01R31/318583 , G01R31/31921 , G11C29/40 , G11C29/48 , G11C2029/3202
摘要： Methods, apparatus, and systems for diagnosing failing scan cells from compressed test responses are disclosed herein. For example, in one nonlimiting exemplary embodiment, a compactor for compacting test responses in a circuit-under-test is disclosed. In this embodiment, the compactor includes an injector network comprising combinational logic and includes injector-network outputs and injector-network inputs. At least some of the injector-network inputs are logically coupled to two or more injector-network outputs according to respective injector polynomials. The exemplary compactor further comprises a selection circuit that includes selection-circuit outputs coupled to the injector-network inputs and selection-circuit inputs coupled to scan-chain outputs of the circuit-under-test. The selection circuit is configured to selectively route signals from the scan-chain outputs to the injector-network inputs according to one of plural different input configurations.
摘要翻译：本文公开了用于诊断来自压缩测试响应的故障扫描单元的方法，装置和系统。例如，在一个非限制性示例性实施例中，公开了一种用于在被测电路中压实测试响应的压实机。在该实施例中，压实机包括包括组合逻辑的喷射器网络，并且包括喷射器 - 网络输出和喷射器 - 网络输入。至少一些注射器 - 网络输入根据相应的注射器多项式在逻辑上耦合到两个或更多个注射器 - 网络输出。示例性压实机还包括选择电路，其包括耦合到注射器 - 网络输入的选择电路输出和耦合到被测电路的扫描链输出的选择电路输入。选择电路被配置为根据多个不同的输入配置中的一个有选择地将信号从扫描链输出传送到喷射器 - 网络输入。

3. 发明授权

US08356222B2 Fault diagnosis for non-volatile memories 有权
标题翻译：非易失性存储器的故障诊断
公开(公告)号：US08356222B2
公开(公告)日：2013-01-15
申请号：US12718822
申请日：2010-03-05
申请人： Nilanjan Mukherjee , Artur Pogiel , Janusz Rajski , Jerzy Tyszer
发明人： Nilanjan Mukherjee , Artur Pogiel , Janusz Rajski , Jerzy Tyszer
IPC分类号： G01R31/28
CPC分类号： G11C29/40 , G11C16/04 , G11C17/14 , G11C29/20 , G11C29/56 , G11C29/56008 , G11C2029/0401 , G11C2029/1208 , G11C2029/5606
摘要： Fault diagnosis techniques for non-volatile memories are disclosed. The techniques are based on deterministic partitioning of rows and/or columns of cells in a memory array. Through deterministic partitioning, signatures are generated for identification of failing rows, columns and single memory cells. A row/column selector or a combined row and column selector may be built on chip to implement the process of deterministic partitioning. An optional shadow register may be used to transfer obtained signatures to an automated test equipment (ATE).
摘要翻译：公开了用于非易失性存储器的故障诊断技术。这些技术基于对存储器阵列中的单元格行和/或列的确定性划分。通过确定性分区，生成签名以识别失败的行，列和单个存储单元。行/列选择器或组合的行和列选择器可以构建在芯片上以实现确定性分区的过程。可以使用可选的影子寄存器将获得的签名转移到自动测试设备（ATE）。

4. 发明授权

US07370254B2 Compressing test responses using a compactor 有权
标题翻译：使用压实机压缩测试响应
公开(公告)号：US07370254B2
公开(公告)日：2008-05-06
申请号：US10778950
申请日：2004-02-13
申请人： Janusz Rajski , Jerzy Tyszer , Chen Wang , Grzegorz Mrugalski , Artur Pogiel
发明人： Janusz Rajski , Jerzy Tyszer , Chen Wang , Grzegorz Mrugalski , Artur Pogiel
IPC分类号： G01R31/28
CPC分类号： G01R31/318566 , G01R31/31703 , G01R31/318536 , G01R31/318583 , G01R31/31921 , G11C29/40 , G11C29/48 , G11C2029/3202
摘要： The present disclosure describes embodiments of a compactor for compressing test results in an integrated circuit and methods for using and designing such embodiments. The disclosed compactors can be utilized, for example, as part of any scan-based design. Moreover, any of the disclosed compactors can be designed, simulated, and/or verified in a computer-executed application, such as an electronic-design-automation (“EDA”) software tool. Embodiments of a method for diagnosing faults in the disclosed compactor embodiments are also described.
摘要翻译：本公开描述了用于压缩集成电路中的测试结果的压实机的实施例以及用于使用和设计这些实施例的方法。所公开的压实机可以例如用作任何基于扫描的设计的一部分。此外，任何公开的压实机可以在诸如电子设计自动化（“EDA”）软件工具的计算机执行的应用中被设计，模拟和/或验证。还描述了在公开的压实机实施例中用于诊断故障的方法的实施例。

5. 发明授权

US07962820B2 Fault diagnosis of compressed test responses 有权
标题翻译：压缩测试响应的故障诊断
公开(公告)号：US07962820B2
公开(公告)日：2011-06-14
申请号：US12405828
申请日：2009-03-17
申请人： Janusz Rajski , Grzegorz Mrugalski , Artur Pogiel , Jerzy Tyszer , Chen Wang
发明人： Janusz Rajski , Grzegorz Mrugalski , Artur Pogiel , Jerzy Tyszer , Chen Wang
IPC分类号： G01R31/3193 , G01R31/40
CPC分类号： G01R31/318547 , G01R31/31703 , G01R31/318536 , G01R31/318566 , G01R31/318583 , G01R31/31921 , G11C29/40 , G11C29/48 , G11C2029/3202
摘要： Methods, apparatus, and systems for diagnosing failing scan cells from compressed test responses are disclosed herein. For example, in one nonlimiting exemplary embodiment, at least one error signature comprising multiple bits (including one or more error bits) is received. Plural potential-error-bit-explaining scan cell candidates are evaluated using a search tree. A determination is made as to whether one or more of the evaluated scan cell candidates explain the error bits in the error signature and thereby constitute one or more failing scan cells. An output is provided of any such one or more failing scan cells determined. Tangible computer-readable media comprising computer-executable instructions for causing a computer to perform any of the disclosed methods are also provided. Tangible computer-readable media comprising lists of failing scan cells identified by any of the disclosed methods are also provided.
摘要翻译：本文公开了用于诊断来自压缩测试响应的故障扫描单元的方法，装置和系统。例如，在一个非限制性示例性实施例中，接收包括多个比特（包括一个或多个错误比特）的至少一个错误签名。使用搜索树来评估多个潜在错误位解释扫描单元候选。确定所评估的扫描单元候选中的一个或多个是否解释错误签名中的错误位，从而构成一个或多个故障扫描单元。由确定的任何这样的一个或多个故障扫描单元提供输出。还提供了包括用于使计算机执行任何所公开的方法的计算机可执行指令的有形计算机可读介质。还提供了包括由任何所公开的方法识别的故障扫描单元的列表的有形计算机可读介质。

6. 发明申请

US20100257417A1 COMPRESSING TEST RESPONSES USING A COMPACTOR 有权
标题翻译：使用压缩机压缩测试响应
公开(公告)号：US20100257417A1
公开(公告)日：2010-10-07
申请号：US12818941
申请日：2010-06-18
申请人： Janusz Rajski , Jerzy Tyszer , Chen Wang , Grzegorz Mrugalski , Artur Pogiel
发明人： Janusz Rajski , Jerzy Tyszer , Chen Wang , Grzegorz Mrugalski , Artur Pogiel
IPC分类号： G01R31/3177 , G06F11/25
CPC分类号： G01R31/318566 , G01R31/31703 , G01R31/318536 , G01R31/318583 , G01R31/31921 , G11C29/40 , G11C29/48 , G11C2029/3202
摘要： The present disclosure describes embodiments of a compactor for compressing test results in an integrated circuit and methods for using and designing such embodiments. The disclosed compactors can be utilized, for example, as part of any scan-based design. Moreover, any of the disclosed compactors can be designed, simulated, and/or verified in a computer-executed application, such as an electronic-design-automation (“EDA”) software tool. Embodiments of a method for diagnosing faults in the disclosed compactor embodiments are also described.
摘要翻译：本公开描述了用于压缩集成电路中的测试结果的压实机的实施例以及用于使用和设计这些实施例的方法。所公开的压实机可以例如用作任何基于扫描的设计的一部分。此外，任何公开的压实机可以在诸如电子设计自动化（“EDA”）软件工具的计算机执行的应用中被设计，模拟和/或验证。还描述了在公开的压实机实施例中用于诊断故障的方法的实施例。

7. 发明申请

US20100229055A1 Fault Diagnosis For Non-Volatile Memories 有权
标题翻译：非易失性记忆故障诊断
公开(公告)号：US20100229055A1
公开(公告)日：2010-09-09
申请号：US12718822
申请日：2010-03-05
申请人： NILANJAN MUKHERJEE , Artur Pogiel , Janusz Rajski , Jerzy Tyszer
发明人： NILANJAN MUKHERJEE , Artur Pogiel , Janusz Rajski , Jerzy Tyszer
IPC分类号： G11C29/04 , G06F11/22
CPC分类号： G11C29/40 , G11C16/04 , G11C17/14 , G11C29/20 , G11C29/56 , G11C29/56008 , G11C2029/0401 , G11C2029/1208 , G11C2029/5606
摘要： Fault diagnosis techniques for non-volatile memories are disclosed. The techniques are based on deterministic partitioning of rows and/or columns of cells in a memory array. Through deterministic partitioning, signatures are generated for identification of failing rows, columns and single memory cells. A row/column selector or a combined row and column selector may be built on chip to implement the process of deterministic partitioning. An optional shadow register may be used to transfer obtained signatures to an automated test equipment (ATE).
摘要翻译：公开了用于非易失性存储器的故障诊断技术。这些技术基于对存储器阵列中的单元格行和/或列的确定性划分。通过确定性分区，生成签名以识别失败的行，列和单个存储单元。行/列选择器或组合的行和列选择器可以构建在芯片上以实现确定性分区的过程。可以使用可选的影子寄存器将获得的签名转移到自动测试设备（ATE）。

8. 发明授权

US07509550B2 Fault diagnosis of compressed test responses 有权
标题翻译：压缩测试响应的故障诊断
公开(公告)号：US07509550B2
公开(公告)日：2009-03-24
申请号：US11213316
申请日：2005-08-25
申请人： Janusz Rajski , Grzegorz Mrugalski , Artur Pogiel , Jerzy Tyszer , Chen Wang
发明人： Janusz Rajski , Grzegorz Mrugalski , Artur Pogiel , Jerzy Tyszer , Chen Wang
IPC分类号： G01R31/3193 , G01R31/40
CPC分类号： G01R31/318547 , G01R31/31703 , G01R31/318536 , G01R31/318566 , G01R31/318583 , G01R31/31921 , G11C29/40 , G11C29/48 , G11C2029/3202
摘要： Methods, apparatus, and systems for diagnosing failing scan cells from compressed test responses are disclosed herein. For example, in one nonlimiting exemplary embodiment, at least one error signature comprising multiple bits (including one or more error bits) is received. Plural potential-error-bit-explaining scan cell candidates are evaluated using a search tree. A determination is made as to whether one or more of the evaluated scan cell candidates explain the error bits in the error signature and thereby constitute one or more failing scan cells. An output is provided of any such one or more failing scan cells determined. Tangible computer-readable media comprising computer-executable instructions for causing a computer to perform any of the disclosed methods are also provided. Tangible computer-readable media comprising lists of failing scan cells identified by any of the disclosed methods are also provided.
摘要翻译：本文公开了用于诊断来自压缩测试响应的故障扫描单元的方法，装置和系统。例如，在一个非限制性示例性实施例中，接收到包括多个比特（包括一个或多个错误比特）的至少一个错误签名。使用搜索树来评估多个潜在错误位解释扫描单元候选。确定所评估的扫描单元候选中的一个或多个是否解释错误签名中的错误位，从而构成一个或多个故障扫描单元。由确定的任何这样的一个或多个故障扫描单元提供输出。还提供了包括用于使计算机执行任何所公开的方法的计算机可执行指令的有形计算机可读介质。还提供了包括由任何所公开的方法识别的故障扫描单元的列表的有形计算机可读介质。

9. 发明申请

US20110055646A1 FAULT DIAGNOSIS IN A MEMORY BIST ENVIRONMENT 审中-公开
标题翻译：记忆环境中的故障诊断
公开(公告)号：US20110055646A1
公开(公告)日：2011-03-03
申请号：US12678747
申请日：2008-09-18
申请人： Nilanjan Mukherjee , Artur Pogiel , Janusz Rajski , Jerzy Tyszer
发明人： Nilanjan Mukherjee , Artur Pogiel , Janusz Rajski , Jerzy Tyszer
IPC分类号： G11C29/12 , G06F11/27
CPC分类号： G11C29/56 , G11C29/40 , G11C29/44 , G11C29/56008 , G11C2029/1208
摘要： Disclosed are methods and devices for temporally compacting test response signatures of failed memory tests in a memory built-in self-test environment, to provide the ability to carry on memory built-in self-test operations even with the detection of multiple time related memory test failures. In some implementations of the invention, the compacted test response signatures are provided to an automated test equipment device along with memory location information. According to various implementations of the invention, an integrated circuit with embedded memory (204) and a memory BIST controller (206) also includes a linear feed-back structure (410) for use as a signature register that can temporally compact test response signatures from the embedded memory array during a test step of a memory test. In various implementations the integrated circuit may also include a failing words counter (211), a failing column indicator (213), and/or a failing row indicator (214) to collect memory location information for a failing test response.
摘要翻译：公开的是用于在存储器内置自检环境中暂时压缩失败存储器测试的测试响应签名的方法和设备，以提供即使在多个时间相关存储器的检测中进行存储器内置自检操作的能力测试失败。在本发明的一些实施方案中，将压实的测试响应签名与存储器位置信息一起提供给自动测试设备设备。根据本发明的各种实施方式，具有嵌入式存储器（204）和存储器BIST控制器（206）的集成电路还包括用作签名寄存器的线性反馈结构（410），其可以临时压缩来自在内存测试的测试步骤中的嵌入式存储器阵列。在各种实现中，集成电路还可以包括故障字计数器（211），故障列指示器（213）和/或故障行指示器（214），以收集故障测试响应的存储器位置信息。

10. 发明申请

US20090249147A1 FAULT DIAGNOSIS OF COMPRESSED TEST RESPONSES 有权
标题翻译：压力测试反应的故障诊断
公开(公告)号：US20090249147A1
公开(公告)日：2009-10-01
申请号：US12405828
申请日：2009-03-17
申请人： Janusz Rajski , Grzegorz Mrugalski , Artur Pogiel , Jerzy Tyszer , Chen Wang
发明人： Janusz Rajski , Grzegorz Mrugalski , Artur Pogiel , Jerzy Tyszer , Chen Wang
IPC分类号： G01R31/3183 , G06F11/263
CPC分类号： G01R31/318547 , G01R31/31703 , G01R31/318536 , G01R31/318566 , G01R31/318583 , G01R31/31921 , G11C29/40 , G11C29/48 , G11C2029/3202
摘要： Methods, apparatus, and systems for diagnosing failing scan cells from compressed test responses are disclosed herein. For example, in one nonlimiting exemplary embodiment, at least one error signature comprising multiple bits (including one or more error bits) is received. Plural potential-error-bit-explaining scan cell candidates are evaluated using a search tree. A determination is made as to whether one or more of the evaluated scan cell candidates explain the error bits in the error signature and thereby constitute one or more failing scan cells. An output is provided of any such one or more failing scan cells determined. Tangible computer-readable media comprising computer-executable instructions for causing a computer to perform any of the disclosed methods are also provided. Tangible computer-readable media comprising lists of failing scan cells identified by any of the disclosed methods are also provided.
摘要翻译：本文公开了用于诊断来自压缩测试响应的故障扫描单元的方法，装置和系统。例如，在一个非限制性示例性实施例中，接收到包括多个比特（包括一个或多个错误比特）的至少一个错误签名。使用搜索树来评估多个潜在错误位解释扫描单元候选。确定所评估的扫描单元候选中的一个或多个是否解释错误签名中的错误位，从而构成一个或多个故障扫描单元。由确定的任何这样的一个或多个故障扫描单元提供输出。还提供了包括用于使计算机执行任何所公开的方法的计算机可执行指令的有形计算机可读介质。还提供了包括由任何所公开的方法识别的故障扫描单元的列表的有形计算机可读介质。

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