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    • 1. 发明授权
    • Shadow mask alignment using variable pitch coded apertures
    • 使用可变间距编码孔的阴影掩模对准
    • US09580792B2
    • 2017-02-28
    • US14812076
    • 2015-07-29
    • ADVANTECH GLOBAL, LTD
    • Nobuhiko Tamura
    • G01B11/00C23C14/04C23C16/04G01B11/27G02B27/30
    • C23C14/042C23C16/042G01B11/27G02B27/30
    • In a shadow mask-substrate alignment method, a substrate and a shadow mask each include a grate having a plurality of bars in spaced relation, wherein for each grate, each pair of spaced bars of each grate is separated by a gap. The spacing between at least three adjacent gaps is different or not of constant pitch, and at least one grate includes a gap that extends therethrough. The grate of the substrate and the grate of the shadow mask are positioned in a light path. Thereafter, the orientation of the substrate, the shadow mask, or both are caused to be adjusted to position the grate of the substrate, the grate of the shadow mask, or both until a predetermined amount of light or range of an amount of light on the light path passing through one or both of the grates is received by a light receiver.
    • 在阴影掩模 - 衬底对准方法中,衬底和荫罩各自包括具有间隔开的多个条的格栅,其中对于每个格栅,每个格栅的每对隔开的条被间隔开。 至少三个相邻间隙之间的间距是不同的或不是恒定的间距,并且至少一个格栅包括延伸穿过其中的间隙。 衬底的格栅和荫罩的格栅位于光路中。 然后,调整基板,荫罩或两者的取向,使基板的格栅,荫罩的格栅或两者均匀,直到预定量的光量或光量范围 通过一个或两个格栅的光路由光接收器接收。
    • 3. 发明申请
    • Transistor Structure for Improved Static Control During Formation of the Transistor
    • 晶体管形成过程中改善静电控制的晶体管结构
    • US20120074471A1
    • 2012-03-29
    • US12888723
    • 2010-09-23
    • Timothy A. Cowen
    • Timothy A. Cowen
    • H01L29/772H01L21/283
    • H01L27/1288H01L27/1214H01L27/1225H01L29/78681
    • A method of forming a shadow mask vapor deposited transistor includes shadow mask vapor depositing a semiconductor segment. An electrically conductive drain contact is shadow mask vapor deposited on a first part of the semiconductor segment and a first insulator is shadow mask vapor deposited on the drain contact. An electrically conductive source contact is shadow mask vapor deposited on a second part of the semiconductor segment spaced from the drain contact and a second insulator is shadow mask vapor deposited on the source contact. A third insulator is shadow mask vapor deposited over at least part of each of the first and second insulators and the semiconductor segment between the drain contact and the source contact. An electrically conductive gate contact is shadow mask vapor deposited on the third insulator and in spaced relation to the semiconductor segment between the drain contact and the source contact.
    • 形成荫罩气相沉积晶体管的方法包括荫罩蒸镀沉积半导体段。 导电漏极接触是沉积在半导体段的第一部分上的阴影掩模,第一绝缘体是沉积在漏极接触上的阴影掩模。 导电源接触是沉积在与漏极接触部分隔开的半导体段的第二部分上的阴影掩模,第二绝缘体是沉积在源极接触上的阴影掩模。 第三绝缘体是沉积在第一绝缘体和第二绝缘体中的每一个的至少一部分上的阴影掩模和漏极接触件和源极接触件之间的半导体段。 导电栅极触点是沉积在第三绝缘体上的阴影掩模,并且与漏极触点和源极触点之间的半导体段间隔开。
    • 5. 发明申请
    • TENSIONED APERTURE MASK AND METHOD OF MOUNTING
    • 张力防护面罩和安装方法
    • US20090151630A1
    • 2009-06-18
    • US12299531
    • 2006-11-01
    • Joseph A. MarcanioJeffrey W. Conrad
    • Joseph A. MarcanioJeffrey W. Conrad
    • B29C65/02B05C11/00
    • C23C14/042H05K3/1225H05K2201/068H05K2203/0169H05K2203/1105
    • In a method of preparing and using an aperture mask, a temperature of an aperture mask is increased to a first, mounting temperature (T1), whereupon the size of the aperture mask increases according to its coefficient of thermal expansion (CTEam), until at least one dimension thereof is of a first desired extent. The temperature of a frame is also increased to T1, whereupon the size of the frame grows according to its coefficient of thermal expansion (CTEf), which is lower than CTEam. The aperture mask is fixedly mounted to the frame at T1. The frame mounted aperture mask is then used for depositing a material on a substrate at a deposition temperature T2 that is less than T1, whereupon the frame holds the shadow mask in tension with the one dimension at a second desired extent.
    • 在制备和使用孔径掩模的方法中,孔径掩模的温度增加到第一安装温度(T1),于是孔径掩模的尺寸根据其热膨胀系数(CTEam)而增加,直到在 其至少一个维度具有第一期望的程度。 框架的温度也增加到T1,因此,框架的尺寸根据其低于CTEam的热膨胀系数(CTEf)而增长。 光圈掩模在T1固定安装到框架上。 然后将框架安装的孔径掩模用于在小于T1的沉积温度T2下将材料沉积在基板上,于是该框架以相反的尺寸在一个维度上保持荫罩的张力。