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    • 82. 发明授权
    • Ion guide array
    • 离子导向阵列
    • US08384027B2
    • 2013-02-26
    • US13119264
    • 2009-09-17
    • John B. HoyesDavid Langridge
    • John B. HoyesDavid Langridge
    • H01J49/42
    • H01J49/062G01N27/622H01J49/02H01J49/065
    • An ion guide array is disclosed comprising a first ion guide section and a second ion guide section and optionally further ion guide sections. Each ion guide section may comprise a plurality of electrodes having an aperture through which ions are transmitted in use. A transfer section is arranged at the exit of the first ion guide section and ions are transmitted radially from the first ion guide section into the second ion guide section. The electrodes in the transfer section may have a radial aperture enabling ions to be transmitted radially from the first ion guide section to the second ion guide section.
    • 公开了一种离子导向阵列,其包括第一离子引导部分和第二离子引导部分以及任选的其它离子引导部分。 每个离子引导部分可以包括具有孔的多个电极,在使用中离子通过该孔传播。 在第一离子引导部的出口设置有转印部,离子从第一离子引导部径向地传递到第二离子引导部。 转印部分中的电极可以具有使得离子能够从第一离子导向部径向地传递到第二离子引导部的径向孔。
    • 88. 发明申请
    • SYSTEMS AND METHODS FOR CALCULATING ION FLUX IN MASS SPECTROMETRY
    • 用于在大量光谱中计算离子通量的系统和方法
    • US20070152149A1
    • 2007-07-05
    • US11619858
    • 2007-01-04
    • Gordana IvosevNic Bloomfield
    • Gordana IvosevNic Bloomfield
    • B01D59/44
    • H01J49/40H01J49/0031H01J49/0036H01J49/02H01J49/025
    • Systems and methods for calculating ion flux. In one embodiment, a mass spectrometer includes an ion source for emitting a beam of ions from a sample through a plurality of pulses during an analysis period, and a detector positioned downstream of said ion source. A clock is provided which is configured to determine a repeatable series of bins, wherein each bin in the repeatable series will correspond to a corresponding pulse time segment in every pulse. Additionally a controller is provided which is operatively coupled to the detector and to the clock and configured to determine the total number of pulses during the analysis period. The controller is further configured to determine for at least one bin in the repeatable series, the number of corresponding pulse time segments in which no ion impact was detected during the analysis period. The controller is also configured to calculate the ion flux corresponding to the at least one bin and wherein said ion flux is calculated to be correlated to the probability of not detecting an ion impact during pulse time segments which correspond to the at least one bin in the repeatable series.
    • 用于计算离子通量的系统和方法。 在一个实施例中,质谱仪包括离子源,用于在分析周期期间通过多个脉冲从样品发射离子束,以及位于所述离子源下游的检测器。 提供时钟,其被配置为确定可重复的一系列存储区,其中可重复序列中的每个仓对应于每个脉冲中的相应脉冲时间段。 另外,提供控制器,其可操作地耦合到检测器和时钟并且被配置为在分析周期期间确定总脉冲数。 控制器还被配置为确定可重复序列中的至少一个箱,在分析周期期间没有检测到离子冲击的相应脉冲时间段的数量。 控制器还被配置为计算对应于至少一个仓的离子通量,并且其中计算所述离子通量与在脉冲时间段期间不检测离子冲击的概率相关联,所述脉冲时间段对应于所述至少一个仓 可重复系列。
    • 90. 发明申请
    • Optical bench for a mass spectrometer system
    • 光谱仪系统的光学台
    • US20060076483A1
    • 2006-04-13
    • US11205758
    • 2005-08-16
    • Adi ScheidemannMark McGrawClare LongGottfried Kibelka
    • Adi ScheidemannMark McGrawClare LongGottfried Kibelka
    • B01D59/44
    • H01J49/02H01J49/28H05K1/0271H05K1/0284H05K2201/2009
    • Mass spectrometer systems for measuring mass/charge ratios of analytes are described. A mass spectrometer system includes a vacuum flange, a PCB base plate coupled to the vacuum flange, and an ion optic assembly coupled to the PCB base plate. The PCB base plate may include signal-processing electronics. The system may include an electrical cable coupled to the PCB base plate for supplying power, control, and I/O to the ion optic assembly and the signal processing electronics. Alternatively, a mass spectrometer system includes a PCB base plate and an ion optic assembly. The PCB base plate has a sealant portion and an electrical portion. The ion optic assembly is coupled to the electrical portion. The system may include a vacuum housing for enclosing the ion optic assembly. The vacuum housing is coupled to the sealant portion of the PCB base plate for sustaining a vacuum while the system is in operation.
    • 描述了用于测量分析物质量/电荷比的质谱仪系统。 质谱仪系统包括真空法兰,联接到真空法兰的PCB基板和耦合到PCB基板的离子光学组件。 PCB基板可以包括信号处理电子器件。 该系统可以包括耦合到PCB基板的电缆,用于向离子光学组件和信号处理电子器件供电,控制和I / O。 或者,质谱仪系统包括PCB基板和离子光学组件。 PCB基板具有密封剂部分和电气部分。 离子光学组件耦合到电气部分。 该系统可以包括用于封闭离子光学组件的真空壳体。 真空壳体联接到PCB基板的密封剂部分,以在系统运行时维持真空。