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81. 发明申请

US20130078891A1 DEVICE FOR CUTTING OF GLASS SHEET 有权
标题翻译：玻璃切割装置
公开(公告)号：US20130078891A1
公开(公告)日：2013-03-28
申请号：US13634466
申请日：2011-04-20
申请人： Ho Kyung Lee , Kyu Hwang Lee , Soon Ki Heo
发明人： Ho Kyung Lee , Kyu Hwang Lee , Soon Ki Heo
IPC分类号： G05B15/02 , B24B13/015 , C03B33/02
CPC分类号： B24B13/015 , B24B27/033 , C03B33/02 , C03B33/037 , G01N21/896 , G05B15/02 , Y02P40/57 , Y10T83/0524 , Y10T83/538
摘要： Disclosed herein is a device for cutting a glass sheet, continuously supplied after a melting and solidification process, into quadrangular glass substrates. The glass sheet cutting device includes two or more cutters for cutting a glass sheet into quadrangular glass substrates, a defect inspector for scanning the glass sheet to three-dimensionally check defect positions in a length direction, a width direction and a thickness direction of the glass sheet, a position adjuster for moving at least one of the cutters to a portion of the glass sheet at which few defects are distributed, and a controller for informing the position adjuster of positions of the cutters based on the scanned results received from the defect inspector.
摘要翻译：本文公开了一种用于将在熔融和凝固过程连续供应的玻璃板切割成四边形玻璃基板的装置。玻璃板切割装置包括用于将玻璃板切割成四棱玻璃基板的两个或更多个切割器，用于扫描玻璃板的缺陷检查器三维地检查玻璃的长度方向，宽度方向和厚度方向上的缺陷位置片材，用于将至少一个切割器移动到分布有少量缺陷的玻璃板的一部分的位置调节器，以及用于基于从缺陷检查器接收到的扫描结果向刀具的位置通知位置调节器的控制器。

82. 发明授权

US08325318B2 Information storage/readout device for use in continuously manufacturing system for liquid-crystal display elements, and method and system for producing the same 有权
公开(公告)号：US08325318B2
公开(公告)日：2012-12-04
申请号：US13230470
申请日：2011-09-12
申请人： Kouji Kimura , Kazuo Kitada , Tomokazu Yura , Satoru Koshio , Fumihito Shimanoe , Takuya Nakazono
发明人： Kouji Kimura , Kazuo Kitada , Tomokazu Yura , Satoru Koshio , Fumihito Shimanoe , Takuya Nakazono
IPC分类号： G02F1/13 , G02F1/1335
CPC分类号： B32B41/00 , B32B2457/202 , G01N21/896
摘要： An information storage/readout device for use in a system for continuously manufacturing liquid-crystal display elements comprises an information storage medium which stores therein slitting position information created based on the position of a defect detected by an inspection of a continuous polarizing composite film included in a continuous optical film laminate including a continuous polarizing composite film formed with an adhesive layer and a continuous carrier film releasably laminated on the adhesive layer, to indicate defective-polarizing-sheet slitting positions defining a defective or defect-containing polarizing sheet, and normal-polarizing-sheet slitting positions defining a normal or defect-free polarizing sheet, in the continuous inspected optical film laminate, and a roll of the continuous inspected optical film laminate which is provided with an identification indicia. In continuous manufacturing of liquid-crystal display elements, the present invention can dramatically enhance product accuracy and manufacturing speed and drastically improve product yield.

83. 发明授权

US08184294B2 Apparatus and method for measuring haze of sheet materials or other materials 有权
标题翻译：用于测量片材或其他材料的雾度的装置和方法
公开(公告)号：US08184294B2
公开(公告)日：2012-05-22
申请号：US12400641
申请日：2009-03-09
申请人： Tarja T. Shakespeare , John F. Shakespeare
发明人： Tarja T. Shakespeare , John F. Shakespeare
IPC分类号： G01N21/00
CPC分类号： G01N21/47 , G01N21/59 , G01N21/896 , G01N21/958 , G01N2021/8928
摘要： A method includes illuminating a material with first light and capturing an image of second light transmitted through the material. The method also includes analyzing multiple regions of the image and determining one or more haze measurements associated with the material based on the analyzing. The method further includes storing and/or outputting the one or more haze measurements. Analyzing the multiple regions of the image may include summing pixel values in each region to produce a total pixel value for that region. The multiple regions of the image may include (i) a first region forming a first disc, (ii) a second region forming either a first annular region around the first region or a second disc larger than and including the first disc, and (iii) a third region forming either a second annular region around the second region or a third disc larger than and including the first and second discs.
摘要翻译：一种方法包括用第一光照射材料并捕获通过材料透射的第二光的图像。该方法还包括基于分析来分析图像的多个区域并确定与材料相关联的一个或多个雾度测量。该方法还包括存储和/或输出一个或多个雾度测量。分析图像的多个区域可以包括对每个区域中的像素值求和以产生该区域的总像素值。图像的多个区域可以包括（i）形成第一盘的第一区域，（ii）形成围绕第一区域的第一环形区域或大于并包括第一盘的第二盘的第二区域，以及（iii））形成围绕第二区域的第二环形区域或大于并包括第一和第二盘的第三盘的第三区域。

84. 发明授权

US07969560B2 Optical property sensor 有权
标题翻译：光学性能传感器
公开(公告)号：US07969560B2
公开(公告)日：2011-06-28
申请号：US12663788
申请日：2008-07-01
申请人： Gregory D. Kostuch , David L. Hofeldt
发明人： Gregory D. Kostuch , David L. Hofeldt
IPC分类号： G01N21/00
CPC分类号： G01N21/896 , G01N21/59
摘要： An apparatus that can measure both haze and clarity on a web moving at conventional manufacturing speeds. The apparatus uses an integrating sphere and a novel mirror arrangement. With this arrangement, the invention can utilize a calibration curve created using known samples over the range of measurement desired to convert in real time, and the response of two photo detectors that measure the wide and low angle scattering signals, to deduce the desired optical property values. This approach significantly increases the speed and response of sensor and enables either on-line single point or full web scanning for uniformity measurement and control.
摘要翻译：可以测量以传统制造速度移动的幅材上的雾度和透明度的装置。该装置使用积分球和新颖的反射镜装置。利用这种布置方式，本发明可以利用在期望实时转换的测量范围内使用已知样品产生的校准曲线，以及测量宽和低角度散射信号的两个光电检测器的响应，以推导所需的光学特性价值观。这种方法显着提高了传感器的速度和响应，并可实现在线单点扫描或全幅扫描以进行均匀性测量和控制。

85. 发明申请

US20110083791A1 INFORMATION STORING, READOUT AND CALCULATION SYSTEM FOR USE IN A SYSTEM FOR CONTINUOUSLY MANUFACTURING LIQUID-CRYSTAL DISPLAY ELEMENTS, AND METHOD FOR PRODUCING THE SAME 有权
标题翻译：用于连续制造液晶显示元件的系统中的信息存储，读出和计算系统及其生产方法
公开(公告)号：US20110083791A1
公开(公告)日：2011-04-14
申请号：US12903937
申请日：2010-10-13
申请人： Takuya NAKAZONO , Seiji UMEMOTO , Fumihito SHIMANOE
发明人： Takuya NAKAZONO , Seiji UMEMOTO , Fumihito SHIMANOE
IPC分类号： B32B38/00 , B32B37/00 , B32B37/12
CPC分类号： G02F1/133528 , G01N21/21 , G01N21/8914 , G01N21/896 , G01N2021/9513 , G02F1/1303 , G02F2203/69 , Y10T156/1056 , Y10T156/1057
摘要： An information storage-readout-calculation system for use in a continuous manufacturing system of liquid-crystal display elements, comprising information storage medium for storing information of defects detected through a preliminary inspection of a continuous polarizing composite film included in a continuous optical film laminate, a roll of a continuous inspected optical film laminate being provided with identification means and a slitting position calculation means for determining defective-polarizing-sheet slitting positions to define defect-containing polarizing sheets having defects and normal-polarizing-sheet slitting positions to define defect-free polarizing sheets by using defect position information read out from the information storage medium based on the identification means, an, a method for manufacturing the information storage-readout-calculation system.
摘要翻译：一种在液晶显示元件的连续制造系统中使用的信息存储读出计算系统，包括：信息存储介质，用于存储通过连续的光学膜层叠体中包含的连续偏振复合膜的预备检查检测到的缺陷的信息; 一卷连续检查的光学膜层压板设置有识别装置和切割位置计算装置，用于确定不合格的薄片切割位置以限定具有缺陷的缺陷偏振片和正常偏振片分切位置，通过使用基于识别装置从信息存储介质读出的缺陷位置信息的自由偏振片，a，用于制造信息存储读出计算系统的方法。

86. 发明申请

US20110057120A1 Apparatus for determining the element occupancy on a surface by means of fluorescence 审中-公开
标题翻译：用于通过荧光确定表面上元素占有率的装置
公开(公告)号：US20110057120A1
公开(公告)日：2011-03-10
申请号：US12593092
申请日：2009-06-05
申请人： Heinrich Ostendarp , Siegfried Piontek
发明人： Heinrich Ostendarp , Siegfried Piontek
IPC分类号： G01N21/64 , G01N21/958
CPC分类号： G01N21/645 , G01N21/896 , G01N21/94 , G01N2201/0624 , G01N2201/0625
摘要： An apparatus for determining element occupancy on a surface includes a UV beam source comprising at least one UV light-emitting diode whose UV radiation excites the element to fluorescence and a detector unit for the detection of fluorescence radiation. The apparatus, in accordance with the invention, is characterized in that beam guidance is configured by alignment of the UV beam source and the detector unit relative to the surface and/or by using a wavelength-selective beam splitter in the beam path in such a manner that the UV radiation back-reflected from the surface is kept away from the detector unit.
摘要翻译：用于确定表面上的元件占用的装置包括UV束源，其包括至少一个紫外线发射二极管，其UV辐射将元件激发到荧光，以及用于检测荧光辐射的检测器单元。根据本发明的装置的特征在于，通过UV光源和检测器单元相对于表面的对准和/或通过在波束路径中使用波长选择性分束器来配置光束引导使得从表面反向反射的UV辐射远离检测器单元的方式。

87. 发明授权

US07830502B2 Substrate inspection device and substrate inspection method 有权
标题翻译：基板检查装置和基板检查方法
公开(公告)号：US07830502B2
公开(公告)日：2010-11-09
申请号：US12540825
申请日：2009-08-13
申请人： Susumu Iwai , Noboru Kato
发明人： Susumu Iwai , Noboru Kato
IPC分类号： G01N21/88
CPC分类号： G01N21/896
摘要： A substrate inspection method includes the following steps. Substrates are sequentially moved while an optical system including a light-projecting system and a light-receiving system are moved in a direction orthogonal to the moving direction of each substrate, so as to change the scanned area of each substrate which is scanned with an inspection light having a specific width in the direction orthogonal to the moving direction of the substrate from the light-projecting system; data of the inspected defects of the substrates in the scanned areas are stored for each scanned area; and the stored data of the defects of the substrates in the scanned areas are updated with newly inspected data of the defects of the substrates in the same scanned areas for each substrate, and defect data of one substrate are produced based on the data of the defects of the substrates in a plurality of scanned areas.
摘要翻译：基板检查方法包括以下步骤。基板依次移动，同时包括投光系统和光接收系统的光学系统在与每个基板的移动方向正交的方向上移动，以便通过检查来改变扫描的每个基板的扫描区域光从与投影系统的基板的移动方向正交的方向上具有特定宽度的光; 对于每个扫描区域存储扫描区域中的基板的检查缺陷的数据; 并且利用对每个基板的相同扫描区域中的基板的缺陷的新检查数据更新存储的扫描区域中的基板的缺陷数据，并且基于缺陷的数据产生一个基板的缺陷数据的多个扫描区域中的基板。

88. 发明授权

US07769223B2 Surface defect inspector and method of inspecting surface defect 有权
标题翻译：表面缺陷检查员和检查表面缺陷的方法
公开(公告)号：US07769223B2
公开(公告)日：2010-08-03
申请号：US11655212
申请日：2007-01-19
申请人： Hiroaki Shinohara , Minoru Matsuura
发明人： Hiroaki Shinohara , Minoru Matsuura
IPC分类号： G06K9/00
CPC分类号： G01N21/896 , G01N2021/8854
摘要： Wrinkles on polymer film as surface defect are inspected. The film is transported on an inspecting surface having a color for absorbing light. A dot pattern having dots on a transparent test chart sheet, facing the film, is photographed by image pickup upon reflection of the dot pattern on the film positioned on the inspecting surface. A length of the dots being photographed is measured according to image data, to obtain length information of 1-5. A length data table of the dots is created by arranging the length information of 1-5 at locations of the dots. Occurrence of a wrinkle is determined at one of the locations if a difference between the dots occurs in the length information of 1-5 in the length data table. To a rear of the test chart sheet, inspecting light is applied, passes through, and becomes incident upon the film.
摘要翻译：检查聚合物膜表面缺陷的皱纹。该膜在具有吸收光的颜色的检查表面上运送。在位于检查表面上的胶片上的点图案反射时，通过图像拾取来拍摄在透明测试图表上具有面向薄膜的点的点阵图形。根据图像数据测量被拍摄的点的长度，以获得1-5的长度信息。通过在点的位置排列1-5的长度信息来创建点的长度数据表。如果在长度数据表中长度信息为1-5的点出现差异，则在其中一个位置确定皱纹的发生。在测试图表的后面，检查光线被施加，通过，并入射到胶片上。

89. 发明申请

US20100007887A1 GLAZING INSPECTION 审中-公开
标题翻译：玻璃检查
公开(公告)号：US20100007887A1
公开(公告)日：2010-01-14
申请号：US12523642
申请日：2008-02-15
申请人： Simon Peter Aldred
发明人： Simon Peter Aldred
IPC分类号： G01N21/958
CPC分类号： G01N3/307 , G01N21/896 , G01N21/958 , G01N33/386
摘要： A method of inspecting the fragmentation pattern of a single ply of toughened glass, following a fragmentation test carried out in accordance with ECE R43 involves illuminating a first portion of the ply of glass in transmission using a strip light source located on a first side of the transparent support. An image of the first portion of the ply of glass is captured using an image capture device located on a second side of the transparent support means, aligned with and fixed in a relative position to the strip light source. A series of images of the glass are collected and analyzed to produce an image of the fragmentation pattern. Imaging can be performed using an apparatus for carrying out the imaging.
摘要翻译：在根据ECE R43进行的碎片化试验之后检查单层钢化玻璃的碎裂图案的方法包括使用位于第一侧的带状光源照射传输中的玻璃层的第一部分透明支持。使用位于透明支撑装置的第二侧上的图像捕获装置捕获玻璃层的第一部分的图像，该图像捕获装置与条形光源相对准并固定在相对位置。收集并分析玻璃的一系列图像以产生碎裂图案的图像。可以使用用于执行成像的装置来执行成像。

90. 发明申请

US20090288754A1 LAYERED FILM FABRICATION METHOD, LAYERED FILM DEFECT DETECTION METHOD, LAYERED FILM DEFECT DETECTION DEVICE, LAYERED FILM, AND IMAGE DISPLAY DEVICE 有权
标题翻译：层状膜制造方法，层状膜缺陷检测方法，层状膜缺陷检测装置，层状膜和图像显示装置
公开(公告)号：US20090288754A1
公开(公告)日：2009-11-26
申请号：US12159928
申请日：2007-01-10
申请人： Takamasa Kobayashi , Michihiro Hagiwara , Yuuki Yano , Kouji Shizen
发明人： Takamasa Kobayashi , Michihiro Hagiwara , Yuuki Yano , Kouji Shizen
IPC分类号： G01J4/00 , B32B37/00
CPC分类号： G01N21/8422 , G01N21/21 , G01N21/896
摘要： When inspecting a defect of a layered film having a polarizer by using an inspection polarizing filter or an inspection phase difference filter, members to be arranged in the imaging optical path are arranged in an appropriate order. A defect detection method of a layered film (11) having a polarizing plate (1) and an optical compensation layer includes: a step of applying light from a light source arranged at the polarizing plate layer side of the film surface of the layered film (11); a step of imaging a transmitting light image of the layered film (11) by an imaging unit (12) arranged at the optical compensation layer side of the film surface; and a defect detection step for detecting a defect existing on the layered film (11) according to the transmitting light image captured by the imaging unit (12). The imaging unit (12) performs imaging via an inspection polarizing filter (15) arranged on the optical path between the light source (13) and the imaging unit (12) and adjacent to the imaging unit (12); and an inspection phase difference filter (16) arranged on the optical path between the light source (13) and the imaging unit (12) and between the inspection polarizing filter (15) and the layered film (11).
摘要翻译：当通过使用检查偏振滤光器或检查相位差滤波器检查具有偏振器的分层膜的缺陷时，要以布置在成像光路中的构件以适当的顺序排列。具有偏振板（1）和光学补偿层的层状膜（11）的缺陷检测方法包括：从层叠膜的膜表面的偏振片层侧配置的光源施加光 11）; 通过布置在膜表面的光学补偿层侧的成像单元（12）对层状膜（11）的透射光图像进行成像的步骤; 以及缺陷检测步骤，用于根据由成像单元（12）捕获的透射光图像来检测存在于层状膜（11）上的缺陷。成像单元（12）经由布置在光源（13）和成像单元（12）之间的光路上并与成像单元（12）相邻的检查偏振滤光器（15）进行成像; 以及布置在光源（13）和成像单元（12）之间的光路之间以及检查偏振滤光器（15）和分层膜（11）之间的检查相位差滤波器（16）。

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