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81. 发明授权

US5700726A Multi-layered tungsten depositions for contact hole filling 失效
标题翻译：用于接触孔填充的多层钨沉积
公开(公告)号：US5700726A
公开(公告)日：1997-12-23
申请号：US668992
申请日：1996-06-21
申请人： Yung-Sheng Huang , Nun-Sian Tsai
发明人： Yung-Sheng Huang , Nun-Sian Tsai
IPC分类号： H01L21/768 , H01L21/283 , H01L21/3065
CPC分类号： H01L21/76877 , H01L21/7684
摘要： A process for filling small diameter contact holes, with tungsten, has been developed. This process consists of using two consecutive tungsten depositions. A first tungsten layer, that will exhibit a fast removal rate in a specific dry etch chemistry, such as RIE, is used to coat the sidewalls of the small diameter contact hole. Next a second layer of tungsten, that will exhibit a significantly slower removal rate then the first tungsten layer, is used to completely fill the contact hole. Etchback, to remove unwanted material from areas outside the contact hole, does not significantly attack the second tungsten fill, in the contact hole, thus not aggravating any seams in the second tungsten fill that may have been created during the LPCVD tungsten, contact hole fill process.
摘要翻译：已经开发了用于填充具有钨的小直径接触孔的工艺。该过程包括使用两个连续的钨沉积。使用在特定的干蚀刻化学品（例如RIE）中表现出快速去除速率的第一钨层来涂覆小直径接触孔的侧壁。接下来是第二层钨，其将显示出比第一钨层显着较慢的去除速率，以完全填充接触孔。为了从接触孔以外的区域去除不需要的材料，Etchback不会明显地攻击接触孔中的第二钨填充物，因此不会加剧在LPCVD钨期间可能产生的第二钨填充物中的任何接缝，接触孔填充处理。

82. 发明申请

US20190271744A1 APPARATUS AND METHOD FOR MONITORING THE POWER USAGE STATUS OF A BATTERY UNIT 审中-公开
公开(公告)号：US20190271744A1
公开(公告)日：2019-09-05
申请号：US16415055
申请日：2019-05-17
申请人： Yung-Sheng Huang
发明人： Yung-Sheng Huang
IPC分类号： G01R31/367 , G01R31/371 , G01R31/392
摘要： A method and apparatus is proposed for monitoring the power usage status of a battery unit, including the remaining volume and the remaining capacity of the battery unit as well as the usage and recycling status of the battery unit. The proposed method and apparatus is characterized in that it is capable of detecting the remaining volume and the remaining capacity of the battery unit quickly in a very short instant of time after the startup of the battery unit.

83. 发明授权

US07928735B2 Battery performance monitor 有权
标题翻译：电池性能监视器
公开(公告)号：US07928735B2
公开(公告)日：2011-04-19
申请号：US12071277
申请日：2008-02-19
申请人： Yung-Sheng Huang , Andrew F. Kallfelz
发明人： Yung-Sheng Huang , Andrew F. Kallfelz
IPC分类号： G01N27/416
CPC分类号： G01R31/3662 , B60L11/1857 , B60L11/1861 , B60L2250/10 , B60L2260/46 , B60L2260/56 , G01R31/3679 , G01R31/3689 , G01R31/3693 , G01R31/3696 , H01M10/42 , Y02T10/7005 , Y02T10/7044 , Y02T10/705 , Y02T90/16
摘要： Improvements both in the methods whereby existing techniques for determining the condition of a battery are communicated to a user (for example, to the owner of a private vehicle, or to the service manager of a fleet of vehicles), or the vehicle's operating system, and in the methods for evaluating the condition of the battery are disclosed. It has been discovered by the inventors that the difference in internal resistance of a fully charged battery as measured during charging and as measured after charging is greater for a battery in poor condition than for a new battery. The invention relates in part to instruments and corresponding methods for evaluating the condition of a battery utilizing this discovery.
摘要翻译：在确定电池状况的现有技术的方法中的改进，例如，向用户（例如，私人车辆的所有者，车队的服务管理者）或车辆的操作系统传达，并且公开了用于评估电池状态的方法。发明人已经发现，在充电期间测量的充满电的电池的内部电阻与充电后测量的电池的差异对于电池处于劣于新电池的电池的差异更大。本发明部分地涉及用于评估使用该发现的电池的状况的仪器和相应的方法。

84. 发明申请

US20090027056A1 Battery performance monitor 有权
标题翻译：电池性能监视器
公开(公告)号：US20090027056A1
公开(公告)日：2009-01-29
申请号：US12071277
申请日：2008-02-19
申请人： Yung-Sheng Huang , Andrew F. Kallfelz
发明人： Yung-Sheng Huang , Andrew F. Kallfelz
IPC分类号： H02J7/00 , G01N27/02
CPC分类号： G01R31/3662 , B60L11/1857 , B60L11/1861 , B60L2250/10 , B60L2260/46 , B60L2260/56 , G01R31/3679 , G01R31/3689 , G01R31/3693 , G01R31/3696 , H01M10/42 , Y02T10/7005 , Y02T10/7044 , Y02T10/705 , Y02T90/16
摘要： Improvements both in the methods whereby existing techniques for determining the condition of a battery are communicated to a user (for example, to the owner of a private vehicle, or to the service manager of a fleet of vehicles), or the vehicle's operating system, and in the methods for evaluating the condition of the battery are disclosed. It has been discovered by the inventors that the difference in internal resistance of a fully charged battery as measured during charging and as measured after charging is greater for a battery in poor condition than for a new battery. The invention relates in part to instruments and corresponding methods for evaluating the condition of a battery utilizing this discovery.
摘要翻译：在确定电池状况的现有技术的方法中的改进，例如，向用户（例如，私人车辆的所有者，车队的服务管理者）或车辆的操作系统传达，并且公开了用于评估电池状态的方法。发明人已经发现，在充电期间测量的充满电的电池的内部电阻与充电后测量的电池的差异对于电池处于劣于新电池的电池的差异更大。本发明部分地涉及用于评估使用该发现的电池的状况的仪器和相应的方法。

85. 发明申请

US20080174927A1 ESD PROTECTION SCHEME FOR SEMICONDUCTOR DEVICES HAVING DUMMY PADS 审中-公开
标题翻译：具有DUMMY PADS的半导体器件的ESD保护方案
公开(公告)号：US20080174927A1
公开(公告)日：2008-07-24
申请号：US11736769
申请日：2007-04-18
申请人： Shih-Hsorng Shen , Yu-Ting Lin , Yung-Sheng Huang
发明人： Shih-Hsorng Shen , Yu-Ting Lin , Yung-Sheng Huang
IPC分类号： H02H9/04 , H01L21/768
CPC分类号： H01L27/0255
摘要： A semiconductor device formed in a semiconductor substrate for dissipating electrostatic discharge and/or accumulated charge in an integrated circuit is provided. In one embodiment, the device comprises a semiconductor substrate; a plurality of layers of metal lines formed overlying the substrate; a plurality of via plugs through intermetal dielectric layers between the layers of metal lines and wherein the via plugs interconnect the metal lines; and a dummy pad formed over the plurality of layers of metal lines, the dummy pad having a diode connected thereto and to ground for providing a discharge path for the electrostatic discharge and/or accumulated charge.
摘要翻译：提供了形成在用于在集成电路中消散静电放电和/或累积电荷的半导体衬底中的半导体器件。在一个实施例中，该器件包括半导体衬底; 形成在衬底上的多层金属线; 多个通孔插塞穿过所述金属线层之间的金属间电介质层，并且其中所述通孔插塞互连金属线; 以及形成在所述多个金属线层上的虚拟焊盘，所述虚设焊盘具有连接到其上的二极管并接地以提供用于静电放电和/或累积电荷的放电路径。

86. 发明申请

US20070194791A1 Method and apparatus for monitoring the condition of a battery by measuring its internal resistance 审中-公开
标题翻译：通过测量电池的内阻来监测电池状态的方法和装置
公开(公告)号：US20070194791A1
公开(公告)日：2007-08-23
申请号：US11356117
申请日：2006-02-17
申请人： Yung-Sheng Huang
发明人： Yung-Sheng Huang
IPC分类号： G01N27/416
CPC分类号： G01R31/389 , G01R31/3647 , G01R31/3648
摘要： A method comprises coupling a first power transistor as a first external load in series with the battery, coupling a second power transistor as a second external load in series with the battery, conducting each power transistor to supply a transient large current to the battery for sampling a group of sampled reference voltages and sampled load voltages in a very transient sampling time for a plurality of times and thus obtaining an internal resistance of the battery. The internal resistance of the battery can then be compared with a predetermined warning value thereof so as to determine whether the former is equal to or larger than the warning value or not, and issuing a warning through an I/O if the determination is affirmative. The invention enables a driver to correctly know the actual condition of the battery in substantially real time while consuming a minimum amount of power.
摘要翻译：一种方法包括将作为第一外部负载的第一功率晶体管与电池串联耦合，将作为第二外部负载的第二功率晶体管与电池串联耦合，将每个功率晶体管导通以向电池提供瞬态大电流以进行采样一组采样的参考电压和采样的负载电压在非常短暂的采样时间内多次，从而获得电池的内部电阻。然后可以将电池的内部电阻与其预定的警告值进行比较，以便确定前者是否等于或大于警告值，并且如果确定是肯定的则通过I / O发出警告。本发明使驾驶员能够在消耗最小功率的情况下基本上实时地正确地了解电池的实际状况。

87. 发明申请

US20060001429A1 Method of monitoring motor vehicle's electric power by comparing internal resistance of battery with a predeterminated warning resistance thereof and apparatus therefor 有权
标题翻译：通过比较电池的内部电阻和预先确定的警告电阻来监测机动车辆电力的方法及其装置
公开(公告)号：US20060001429A1
公开(公告)日：2006-01-05
申请号：US10882196
申请日：2004-07-02
申请人： Yung-Sheng Huang
发明人： Yung-Sheng Huang
IPC分类号： G01N27/416
CPC分类号： G01R31/3662 , B60L11/1861 , B60L2240/547 , B60L2240/549 , Y02T10/7005 , Y02T10/7044 , Y02T10/705
摘要： The method comprises coupling an external load having a predetermined resistance directly in series with the battery, conducting a power transistor to supply a transient large current to the battery for sampling voltage of the battery in a set very short period of time, and determining the internal resistance of the battery. The internal resistance of the battery can then be compared with a predetermined warning value of internal resistance of the battery so as to determine whether the former is equal to or larger than the warning value, and displaying a warning on a display if the determination is affirmative. The invention enables a driver to correctly know the condition of the battery in substantially real time while consuming a minimum amount of current.
摘要翻译：该方法包括将具有预定电阻的外部负载直接与电池串联耦合，导通功率晶体管以在非常短的时间段内为电池提供瞬时大电流以对电池进行采样电压，以及确定内部电池的电阻。然后可以将电池的内部电阻与电池的内部电阻的预定警告值进行比较，以便确定前者是否等于或大于警告值，并且如果确定是肯定的，则在显示器上显示警告。本发明使驾驶员能够在消耗最小量的电流的情况下基本上实时地正确地知道电池的状况。

88. 发明授权

US06704629B2 Device for monitoring motor vehicle's electric power and method therefor 有权
标题翻译：监测机动车电力的装置及其方法
公开(公告)号：US06704629B2
公开(公告)日：2004-03-09
申请号：US09996813
申请日：2001-11-30
申请人： Yung-Sheng Huang
发明人： Yung-Sheng Huang
IPC分类号： G06F700
CPC分类号： G01R31/3648 , G01R31/007 , G01R31/3606
摘要： A method and a device for monitoring a motor vehicle's electric power, in which the method comprises the steps of sampling, calculating, comparing, displaying results, and counting intervals, and the device comprises a stabilizing circuit, a CPU, a voltage sampling circuit, a current control circuit, and a color lamp display circuit. The step of sampling is performed when the load and power transistor are enabled (i.e., there is a great amount of current) and with a very short sampling time so that the invention can inform a driver about a status of a battery by consuming very little power.
摘要翻译：一种用于监测机动车辆电力的方法和装置，其中该方法包括采样，计算，比较，显示结果和计数间隔的步骤，并且该装置包括稳定电路，CPU，电压采样电路，电流控制电路和彩色显示电路。当负载和功率晶体管被使能（即，存在大量电流）并且具有非常短的采样时间时，执行采样步骤，使得本发明可以通过消耗很少的信息通知驾驶员电池的状态功率。

89. 发明授权

US06242813B1 Deep-submicron integrated circuit package for improving bondability 有权
标题翻译：深亚微米集成电路封装，用于改善粘合性
公开(公告)号：US06242813B1
公开(公告)日：2001-06-05
申请号：US09590122
申请日：2000-06-09
申请人： Yung-Sheng Huang , Hung-Chang Hsieh , Han-Chang Hsieh
发明人： Yung-Sheng Huang , Hung-Chang Hsieh , Han-Chang Hsieh
IPC分类号： H01L2348
CPC分类号： H01L24/85 , H01L24/03 , H01L24/05 , H01L24/48 , H01L2224/02166 , H01L2224/04042 , H01L2224/05073 , H01L2224/05093 , H01L2224/05187 , H01L2224/05556 , H01L2224/05557 , H01L2224/05624 , H01L2224/05647 , H01L2224/4807 , H01L2224/48453 , H01L2224/48463 , H01L2224/78301 , H01L2224/85045 , H01L2224/85201 , H01L2224/85203 , H01L2224/85205 , H01L2224/85399 , H01L2924/00014 , H01L2924/01013 , H01L2924/01014 , H01L2924/01022 , H01L2924/01029 , H01L2924/01039 , H01L2924/01074 , H01L2924/01327 , H01L2924/04941 , H01L2924/10253 , H01L2924/14 , H01L2924/04953 , H01L2224/78 , H01L2224/45099 , H01L2924/00
摘要： A method is adapted to form wire interconnect pads on integrated circuit devices and includes the steps of providing a semiconductor substrate having an aluminum-copper top metal layer, and a titanium nitride layer covering the aluminum-copper top metal layer, and a photoresist coating applied to the titanium nitride layer. The photoresist coating is partially exposed and partially developed to form openings for etching an array of submicron size holes. Etching through the titanium nitride layer to the aluminum-copper layer, by way of the partially developed photoresist, forms a rough textured surface profile in the array of cavities, with diameters of less than 0.3 um, etched in the aluminum copper layer. After stripping of the photoresist and depositing a passivation film, windows are formed delineating improved bond pads for wire bonding. The textured cavities increase the surface area of the bond pads and provide improved bondability for the 0.35 and 0.3 um IC devices.
摘要翻译：一种适于在集成电路器件上形成导线互连焊盘的方法，包括以下步骤：提供具有铝 - 铜顶层金属层的半导体衬底和覆盖铝 - 铜顶层金属层的氮化钛层和涂覆有光致抗蚀剂涂层到氮化钛层。光致抗蚀剂涂层被部分曝光并部分显影以形成用于蚀刻亚微米尺寸孔阵列的开口。通过部分显影的光致抗蚀剂将氮化钛层蚀刻到铝 - 铜层上，在铝铜层中蚀刻直径小于0.3μm的空腔阵列中形成粗糙的纹理表面轮廓。在剥离光致抗蚀剂并沉积钝化膜之后，形成窗口，描绘改进的用于引线接合的接合焊盘。纹理的空腔增加了接合焊盘的表面积，并为0.35和0.3um IC器件提供了改进的粘合性。

90. 发明授权

US6140603A Micro-cleavage method for specimen preparation 有权
标题翻译：样品制备的微裂解法
公开(公告)号：US6140603A
公开(公告)日：2000-10-31
申请号：US283000
申请日：1999-03-31
申请人： Ruey-Lian Hwang , Yung-Sheng Huang
发明人： Ruey-Lian Hwang , Yung-Sheng Huang
IPC分类号： B23K26/40 , H01L21/304 , B23K26/00
CPC分类号： H01L21/3043 , B23K26/362 , B23K26/40 , B23K2203/50
摘要： A micro-cleavage method for preparing a semiconductor specimen for examination by an optical or electron microscopic is disclosed. The method can be carried out by hand and thus no expensive equipment such as a polishing machine is necessary. In the method, at least two bird's beak marks are cut in a top surface of a silicon wafer that contains a target, i.e., a defect or a circuit to be examined. The bird's beak marks are formed by a wide scribe line and a narrow scribe line overlapped together. The wide scribe line of the bird's beak mark is used for visual alignment with the edge of a rigid substrate, while the fine scribe line is utilized for initiating a crack when a bending stress is applied on the bird's beak mark. The bird's beak mark can be made by using a laser cutter after a wafer slice which contains the target area is first cleaved by mechanical means such as a diamond knife. A first bird's beak mark is formed at the cleaved edge of the slice and a second bird's beak mark is formed with its fine scribe line oriented toward the target. When a bending stress is applied on the top surface of the silicon slice, stress concentrates on the bird's beak marks and creates a fine crack to propagate along a crystallographic plane in the wafer toward the target thus exposing the target in a fractured surface.
摘要翻译：公开了一种通过光学或电子显微镜制备用于检查的半导体样品的微裂纹方法。该方法可以手工进行，因此不需要昂贵的设备如抛光机。在该方法中，在包含目标物，即缺陷或待检查的电路的硅晶片的顶表面中切割至少两个鸟的喙标记。鸟的喙标记由宽的划线和狭窄的划线重叠在一起形成。鸟喙标记的宽划线用于与刚性基底的边缘的视觉对准，而当在鸟的喙标记上施加弯曲应力时，细切割线用于引发裂纹。可以通过使用激光切割机在包含目标区域的晶片切片之后首先用诸如金刚石刀等机械手段切割来制作鸟的喙标记。在切片的切割边缘处形成第一只鸟的喙标记，并且形成第二个鸟的喙标记，其细的划线朝向目标。当在硅片的顶表面上施加弯曲应力时，应力集中在鸟的喙痕上，并产生细小的裂纹，沿着晶片中的晶面朝向靶传播，从而将目标暴露在断裂的表面中。

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