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    • 82. 发明授权
    • Program verify operation in a memory device
    • 在存储设备中进行程序验证操作
    • US08879329B2
    • 2014-11-04
    • US12949876
    • 2010-11-19
    • Violante MoschianoGiovanni SantinMichele Incarnati
    • Violante MoschianoGiovanni SantinMichele Incarnati
    • G11C11/34G11C16/06G11C16/34G11C11/56
    • G11C16/3459G11C11/5628G11C16/26
    • Methods for program verifying, program verify circuits, and memory devices are disclosed. One such method for program verifying includes generating a ramped voltage for a plurality of count values. The ramped voltage is applied to a control gate of a memory cell being program verified. At least a portion of each count value is compared to an indication of a target threshold voltage for the memory cell. When the at least a portion of the count value is equal to the indication of the target threshold voltage indication, sense circuitry is used to check if the memory cell has been activated by the voltage generated by the count. If the memory cell has been activated, an inhibit latch is set to inhibit further programming of the memory cell. If the memory cell has not been activated by the voltage, the memory cell is biased with another programming pulse.
    • 公开了用于程序验证,程序验证电路和存储器件的方法。 用于程序验证的一种这样的方法包括为多个计数值生成斜坡电压。 斜坡电压被施加到被程序验证的存储器单元的控制栅极。 将每个计数值的至少一部分与存储器单元的目标阈值电压的指示进行比较。 当计数值的至少一部分等于目标阈值电压指示的指示时,感测电路用于检查存储器单元是否已被计数产生的电压激活。 如果存储单元已被激活,则设置禁止锁存器以禁止存储器单元的进一步编程。 如果存储单元没有被电压激活,则存储单元被另一编程脉冲偏置。
    • 86. 发明授权
    • Flash memory and associated methods
    • 闪存和相关方法
    • US08391061B2
    • 2013-03-05
    • US12643610
    • 2009-12-21
    • Daniel ElmhurstGiovanni SantinMichele IncarnatiViolante MoschianoErcole Diiorio
    • Daniel ElmhurstGiovanni SantinMichele IncarnatiViolante MoschianoErcole Diiorio
    • G11C16/04
    • G11C16/0483G11C16/26G11C16/3454G11C16/3459
    • In a method of operation, a flash memory cell coupled to a bit-line is programmed, a word-line voltage is coupled to the flash memory cell, a first voltage pulse is coupled to a bias transistor coupled between the bit-line and a sense capacitance at a first time to couple the bit-line to the sense capacitance to generate data to indicate the state of the flash memory cell, a second voltage pulse is coupled to the bias transistor at a second time having a second magnitude that is different from a first magnitude of the first voltage pulse, and a third voltage pulse is coupled to the bias transistor at a third time having a third magnitude that is different from the second magnitude of the second voltage pulse. In a method of operation, the second voltage pulse occurs a first delay period after the first voltage pulse and the third voltage pulse occurs a second delay period after the second voltage pulse, the second delay period being different from the first delay period.
    • 在一种操作方法中,与位线耦合的快闪存储器单元被编程,字线电压耦合到闪存单元,第一电压脉冲耦合到耦合在位线和 在第一时间感测电容以将位线耦合到感测电容以产生指示闪存单元的状态的数据,第二电压脉冲在具有不同的第二大小的第二时间耦合到偏置晶体管 并且第三电压脉冲在第三时间与具有与第二电压脉冲的第二幅度不同的第三幅度耦合到偏置晶体管。 在一种操作方法中,第二电压脉冲在第一电压脉冲和第三电压脉冲在第二电压脉冲之后发生第二延迟时段之后的第一延迟时段,第二延迟周期不同于第一延迟周期。
    • 89. 发明申请
    • PROGRAM VERIFY OPERATION IN A MEMORY DEVICE
    • 存储器件中的程序验证操作
    • US20120127794A1
    • 2012-05-24
    • US12949876
    • 2010-11-19
    • Violante MoschianoGiovanni SantinMichele Incarnati
    • Violante MoschianoGiovanni SantinMichele Incarnati
    • G11C16/34G11C16/04
    • G11C16/3459G11C11/5628G11C16/26
    • Methods for program verifying, program verify circuits, and memory devices are disclosed. One such method for program verifying includes generating a ramped voltage for a plurality of count values. The ramped voltage is applied to a control gate of a memory cell being program verified. At least a portion of each count value is compared to an indication of a target threshold voltage for the memory cell. When the at least a portion of the count value is equal to the indication of the target threshold voltage indication, sense circuitry is used to check if the memory cell has been activated by the voltage generated by the count. If the memory cell has been activated, an inhibit latch is set to inhibit further programming of the memory cell. If the memory cell has not been activated by the voltage, the memory cell is biased with another programming pulse.
    • 公开了用于程序验证,程序验证电路和存储器件的方法。 用于程序验证的一种这样的方法包括为多个计数值生成斜坡电压。 斜坡电压被施加到被程序验证的存储器单元的控制栅极。 将每个计数值的至少一部分与存储器单元的目标阈值电压的指示进行比较。 当计数值的至少一部分等于目标阈值电压指示的指示时,感测电路用于检查存储器单元是否已被计数产生的电压激活。 如果存储单元已被激活,则设置禁止锁存器以禁止存储器单元的进一步编程。 如果存储单元没有被电压激活,则存储单元被另一编程脉冲偏置。