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    • 84. 发明授权
    • Programmable pulse generator using inverter chain
    • 可编程脉冲发生器采用逆变链
    • US08669784B1
    • 2014-03-11
    • US13448176
    • 2012-04-16
    • Kai Wu
    • Kai Wu
    • H03K19/00H03K3/017
    • H03K5/05
    • In one embodiment, a method includes generating a first signal based on a clock signal and generating a second signal based on a programmable delayed clock signal. The method then generates a reset signal based on the first signal and the second signal. The clock signal is delayed using an inverter chain to generate a delayed version of the clock signal. An output signal is generated based on the delayed version of the clock signal and the reset signal. When a pulse width of the output signal is greater than a data duration determined from the clock signal, the pulse width of the output signal is reset to the pulse width of the data duration.
    • 在一个实施例中,一种方法包括基于时钟信号产生第一信号并基于可编程延迟时钟信号产生第二信号。 该方法然后基于第一信号和第二信号产生复位信号。 使用反相器链延迟时钟信号以产生时钟信号的延迟版本。 基于延迟版本的时钟信号和复位信号产生输出信号。 当输出信号的脉冲宽度大于从时钟信号确定的数据持续时间时,输出信号的脉冲宽度被重置为数据持续时间的脉冲宽度。
    • 89. 发明申请
    • METHOD FOR MEASURING THE FILM ELEMENT USING OPTICAL MULTI-WAVELENGTH INTERFEROMETRY
    • 使用光学多波长干涉测量薄膜元件的方法
    • US20120140235A1
    • 2012-06-07
    • US13152902
    • 2011-06-03
    • Cheng-Chung LEEKai Wu
    • Cheng-Chung LEEKai Wu
    • G01B9/02
    • G01B11/0675
    • A method for measuring the film element using optical multi-wavelength interferometry is revealed. The invention uses reflection coefficients of thin films at different wavelengths to measure the thickness and optical constants of thin films. The phase difference coming from the phase difference between test and reference surfaces is distinguished from the phase difference from the spatial path difference between reference and test beams by doing measurements on different wavelengths, because they change in different ways as the measuring wavelength changes. The phase is then acquired. Combining with the measured reflectance of thin film, the reflection coefficient of thin film is obtained. Collecting the reflection coefficients of each point, the thin film thickness and optical constants distribution in 2 dimensions are calculated. The surface profile is known through the spatial path differences between reference and test beams. These can be measured in a interferometer to avoid the vibration influence.
    • 揭示了使用光学多波长干涉测量法测量薄膜元件的方法。 本发明使用不同波长的薄膜的反射系数来测量薄膜的厚度和光学常数。 来自测试和参考表面之间的相位差的相位差通过对不同波长进行测量而与参考和测试光束之间的空间路径差的相位差进行区分,因为它们随着测量波长的变化而以不同的方式变化。 然后获得相位。 结合薄膜的测量反射率,得到薄膜的反射系数。 收集每个点的反射系数,计算二维的薄膜厚度和光学常数分布。 通过参考和测试光束之间的空间路径差异已知表面轮廓。 这些可以在干涉仪中测量,以避免振动的影响。