会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 78. 发明授权
    • High resolution positioner
    • 高分辨率定位器
    • US6088107A
    • 2000-07-11
    • US176043
    • 1998-10-20
    • Peter M. Livingston
    • Peter M. Livingston
    • G01B11/03G01S17/46G01S17/66G01B11/14
    • G01S17/66G01S17/46
    • The present invention relates to a high resolution positioner that may be used to measure the lateral displacement between one object, such as a beam compactor, relative to another object, such as a rear cone, which are separated over a moderate distance. The positioner includes a relatively small laser mounted on one of the objects, such as the beam compactor, which is dithered in orthogonal directions creating a Lissajous pattern. The Lissajous pattern is detected by a pinhole detector on a separate object, such as a rear cone. With such a system, displacement of one object, such as a rear cone bench, relative to another object, such as a beam compactor bench, can be relatively accurately determined and used to develop an error signal providing closed loop alignment of the two objects relative to each other.
    • 高分辨率定位器技术领域本发明涉及一种高分辨率定位器,其可用于测量相对于在中等距离上分离的另一物体(例如后锥体)的一个物体(例如光束压实器)之间的横向位移。 定位器包括安装在其中一个物体上的相对较小的激光器,例如在紧密方向上颤动产生利萨如图案的光束压实器。 Lissajous图案由针孔检测器在单独的物体(例如后锥体)上检测。 通过这样的系统,可以相对精确地确定一个物体(例如后锥台)相对于另一个物体(例如光束压实台)的位移,以产生提供两个物体相对的闭环对准的误差信号 对彼此。
    • 80. 发明授权
    • Device for non-contact measurement of the surface of a three dimensional
object
    • 用于非接触式测量三维物体表面的装置
    • US6055056A
    • 2000-04-25
    • US180344
    • 1999-06-17
    • Peter KuehmstedtWolfgang SchreiberGunther Notni
    • Peter KuehmstedtWolfgang SchreiberGunther Notni
    • G01B11/03G01B11/25G01B11/24
    • G01B11/2504
    • This invention concerns a device for non-contact measurement of the surface of a three dimensional object in a measuring chamber with a projection device which projects a strip structure on the surface of an object, an observing device for recording the strip structure at measuring points on the surface of the object, a device for moving the object together with the observing device around a first axis of rotation, and an evaluation unit for determining the co-ordinates of the measuring points using the phase values of the strip structure in a predetermined co-ordinate system. A device (8) for moving the object about at least a second axis of rotation (D2) independent of the first axis of rotation (D1) and a calibration unit are provided, where the calibration unit (10) can determine the position of the second rotational axis (D2) in the predetermined co-ordinate system.
    • PCT No.PCT / DE97 / 00896 Sec。 371日期1999年6月17日第 102(e)日期1999年6月17日PCT提交1997年4月30日PCT公布。 出版物WO97 / 42464 PCT 日期1997年11月13日本发明涉及一种用于在测量室中对三维物体的表面进行非接触测量的装置,其具有将物体的表面上的带状结构投射的投影装置,用于记录条带的观察装置 在物体表面上的测量点处的结构,用于围绕第一旋转轴线与观察装置一起移动物体的装置,以及用于使用条带的相位值确定测量点的坐标的评估单元 结构在预定的坐标系。 提供用于围绕与第一旋转轴线(D1)无关的至少第二旋转轴线(D2)移动物体的装置(8)和校准单元,其中校准单元(10)可以确定 第二旋转轴(D2)在预定坐标系中。