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    • 71. 发明申请
    • METHOD OF MANUFACTURING WIRING SUBSTRATE
    • 制造接线基板的方法
    • US20130146220A1
    • 2013-06-13
    • US13762791
    • 2013-02-08
    • SHINKO ELECTRIC INDUSTRIES CO., LTD.
    • Tatsuya NakamuraTomoko Yamada
    • H05K3/46
    • H05K3/46H05K3/0097H05K3/025H05K3/108H05K3/4652H05K3/4682H05K2201/09509H05K2201/096H05K2203/0152H05K2203/1536Y10T156/11Y10T156/1195
    • Two stacked bodies, each having a metal layer provided on a first metallic foil with carrier via a first insulating layer, are prepared. The first metallic foil with carrier has a metallic foil provided on a carrier plate via a peeling layer. A joined body is formed by jointing the stacked bodies such that the carrier plates are joined via a joining layer. First conductor patterns are formed by patterning the metal layers on both sides of the joined body. Second metallic foils with carrier are provided to the first conductor patterns of the joined body such that the first conductor patterns are opposed to the metallic foils via second insulating layers. Two substrates are formed by peeling the carrier plates with carrier from the peeling layers. Second conductor patterns which are connected electrically to the first conductor patterns are formed from the metallic foils of the substrate.
    • 准备两个层叠体,每个层叠体通过第一绝缘层具有设置在具有载体的第一金属箔上的金属层。 具有载体的第一金属箔具有通过剥离层设置在载体板上的金属箔。 通过接合层叠体形成接合体,使得承载板通过接合层接合。 第一导体图案通过在接合体的两侧上构图金属层而形成。 具有载体的第二金属箔被提供到接合体的第一导体图案,使得第一导体图案经由第二绝缘层与金属箔相对。 通过用载体从剥离层剥离载体板来形成两个基板。 与第一导体图案电连接的第二导体图案由基板的金属箔形成。
    • 76. 发明申请
    • PROBER UNIT
    • 探索单位
    • US20110204911A1
    • 2011-08-25
    • US12712734
    • 2010-02-25
    • Gunsei KIMOTO
    • Gunsei KIMOTO
    • G01R31/02
    • G01R31/2886G01R1/06727H05K1/0268H05K1/11H05K1/144H05K3/46H05K2201/041H05K2201/09472H05K2201/096H05K2201/09709
    • To facilitate connection between a narrow-pitched probe assembly and a coarse-pitched printed circuit board. A prober unit in which probes are brought into contact with to-be-tested semiconductor chips to establish electrical connection between the semiconductor chips and a test unit via the probes, in which: a probe assembly and a plurality of wiring boards are prepared, the probe assembly including output terminals to be connected directly to the probes, the probe assembly being constituted by integrated regularly-arranged multiple probe groups including the output terminals, and each of the wiring boards including wiring adhering to a surface of a non-conductive film; and an n-th row of an output terminal group of the probe assembly is brought into contact with a land group provided at an end of an n-th wiring board, and a wiring terminal provided at the other end of the n-th wiring board is connected to one of a wiring board of the test unit and a connector to establish electrical connection between the to-be-tested semiconductor chips and the test unit.
    • 为了便于窄间距探针组件和粗调印刷电路板之间的连接。 探针单元,其中探针与待测试的半导体芯片接触,以通过探针在半导体芯片和测试单元之间建立电连接,其中:准备探针组件和多个布线板, 探针组件,其包括要直接连接到探针的输出端子,探针组件由包括输出端的集成的规则排列的多个探针组构成,并且每个布线板包括附着在非导电膜表面上的布线; 并且探针组件的输出端子组的第n行与设置在第n布线板的端部的平台组接触,并且设置在第n布线的另一端的布线端子 板连接到测试单元的布线板之一和连接器,以在待测半导体芯片和测试单元之间建立电连接。
    • 80. 发明授权
    • Multilayer circuit including stacked layers of insulating material and conductive sections
    • 多层电路包括堆叠的绝缘材料层和导电部分
    • US07205655B2
    • 2007-04-17
    • US10806269
    • 2004-03-23
    • Mika Sippola
    • Mika Sippola
    • H01L23/12
    • H05K3/46H01F17/0013H01F27/2804H01F27/2847H01F41/041H01F2027/2861H05K1/118H05K1/165H05K3/4084H05K3/4092H05K2201/0379H05K2201/0394H05K2201/0397H05K2201/055
    • The invention relates to the manufacturing of a multilayer structure and especially it relates to the manufacturing of a three-dimensional structure and its use as an electronics assembly substrate and as a winding for transformers and inductors. When a multilayer structure is manufactured by folding a conductor-insulator-conductor laminate, where the conductor layers to be separated from each other follow each other on opposite sides of the conductor-insulator-conductor laminate in the sections following each other and where the insulator has been removed from the places where the conductor layers are to be connected together after folding, it is possible to manufacture a wide range of three-dimensional multilayer structures where the volume occupied by the windings over the total volume can be maximized. Alternatively, by using the method it is also possible to manufacture a multilayer structure where components have been buried inside. The method makes it also possible to make connections between layers in a flexible manner. Among other issues, the method can be easily automated for mass-production.
    • 本发明涉及多层结构的制造,特别涉及三维结构的制造及其作为电子组装基板和用于变压器和电感器的绕组的用途。 当通过折叠导体 - 绝缘体 - 导体层叠体来制造多层结构时,彼此分离的导体层在彼此相邻的部分中的导体 - 绝缘体 - 导体层叠体的相对侧彼此相对,并且绝缘体 已经从折叠后导体层要连接在一起的地方去除,可以制造宽范围的三维多层结构,其中绕组占用的体积可以最大化。 或者,通过使用该方法,也可以制造其中已经将部件埋入其中的多层结构。 该方法还可以以灵活的方式在层之间进行连接。 除了其他问题之外,该方法可以容易地自动化进行批量生产。