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71. 发明申请

US20110185322A1 METHOD OF IN-PROCESS INTRALAYER YIELD DETECTION, INTERLAYER SHUNT DETECTION AND CORRECTION 有权
标题翻译：进程内部检测方法，中间层检测和校正
公开(公告)号：US20110185322A1
公开(公告)日：2011-07-28
申请号：US12693019
申请日：2010-01-25
申请人： Michael Yu Tak Young , Scott Jong Ho Limb , William S. Wong , Robert A. Street
发明人： Michael Yu Tak Young , Scott Jong Ho Limb , William S. Wong , Robert A. Street
IPC分类号： G06F17/50 , G01R31/26
CPC分类号： G11C29/025 , G01R31/2853 , G11C2029/0403 , H01L22/14 , H01L22/20
摘要： A system and method for in-process yield evaluation and correction in an array type of device are provided. The system and method include measuring electrical resistance between individual GATE lines, DATA lines, a DATA bus I/O pad, and a GATE bus I/O pad; and analyzing the measured electrical resistance to identify at least one of the following: GATE line open defects, GATE line bridge defects, DATA line open defects, DATA line bridge defects, and interlayer shunt defects.
摘要翻译：提供了一种用于阵列型设备中的过程中产量评估和校正的系统和方法。该系统和方法包括测量各个GATE线路，DATA线路，DATA总线I / O焊盘和GATE总线I / O焊盘之间的电阻; 并分析测量的电阻以识别以下至少之一：GATE线路开路缺陷，GATE线路桥梁缺陷，DATA线路开路缺陷，DATA线路桥梁缺陷和层间分流缺陷。

72. 发明申请

US20110083728A1 Disordered Nanowire Solar Cell 审中-公开
标题翻译：无序纳米线太阳能电池
公开(公告)号：US20110083728A1
公开(公告)日：2011-04-14
申请号：US12579379
申请日：2009-10-14
申请人： Robert A. Street , William S. Wong
发明人： Robert A. Street , William S. Wong
IPC分类号： H01L31/0352 , H01L31/00 , H01L31/0376 , H01L31/0232
CPC分类号： H01L31/035227 , H01L31/075 , Y02E10/548
摘要： A disordered nanowire solar cell includes doped silicon nanowires disposed in a disordered nanowire mat, a thin (e.g., 50 nm) p-i-n coating layer formed on the surface of the silicon nanowires, and a conformal conductive layer disposed on the upper (e.g., n-doped) layer of the p-i-n coating layer. The disordered nanowire mat is grown from a seed layer using VLS processing at a high temperature (e.g., 450° C.), whereby the crystalline silicon nanowires assume a random interwoven pattern that enhances light scattering. Light scattered by the nanowires is absorbed by p-i-n layer, causing, e.g., electrons to pass along the nanowires to the first electrode layer, and holes to pass through the conformal conductive layer to an optional upper electrode layer. Fabrication of the disordered nanowire solar cell is large-area compatible.
摘要翻译：无序的纳米线太阳能电池包括设置在无序纳米线垫中的掺杂硅纳米线，形成在硅纳米线表面上的薄（例如50nm）的针涂层，以及设置在上层（例如，掺杂）层。无序纳米线垫在高温（例如450℃）下使用VLS处理从种子层生长，由此晶体硅纳米线呈现增强光散射的随机交织图案。由纳米线散射的光被p-i-n层吸收，导致例如电子沿着纳米线传递到第一电极层，并且空穴通过共形导电层到可选的上电极层。无序纳米线太阳能电池的制造是大面积兼容的。

73. 发明授权

US07838865B2 Method for aligning elongated nanostructures 有权
标题翻译：用于对准细长纳米结构的方法
公开(公告)号：US07838865B2
公开(公告)日：2010-11-23
申请号：US11644070
申请日：2006-12-22
申请人： Michael L. Chabinyc , William S. Wong
发明人： Michael L. Chabinyc , William S. Wong
IPC分类号： H01L29/12
CPC分类号： B82Y10/00 , H01L51/0047 , H01L51/0048 , H01L51/0525 , Y10S977/762 , Y10T428/24802
摘要： A method of depositing elongated nanostructures that allows accurate positioning and orientation is described. The method involves printing or otherwise depositing elongated nanostructures in a carrier solution. The deposited droplets are also elongated, usually by patterning the surface upon which the droplets are deposited. As the droplet evaporates, the fluid flow within the droplets is controlled such that the nanostructures are deposited either at the edge of the elongated droplet or the center of the elongated droplet. The described deposition technique has particular application in forming the active region of a transistor.
摘要翻译：描述了允许精确定位和取向的细长纳米结构的沉积方法。该方法涉及在载体溶液中印刷或以其它方式沉积细长的纳米结构。沉积的液滴也是细长的，通常通过图案化沉积有液滴的表面。当液滴蒸发时，控制液滴内的流体流动，使得纳米结构沉积在细长液滴的边缘或细长液滴的中心。所描述的沉积技术特别适用于形成晶体管的有源区。

74. 发明申请

US20100231638A1 Method For The Printing Of Homogeneous Electronic Material With A Multi-Ejector Print Head 有权
标题翻译：使用多功能喷头打印头打印均匀电子材料的方法
公开(公告)号：US20100231638A1
公开(公告)日：2010-09-16
申请号：US12787371
申请日：2010-05-25
申请人： Steven E. Ready , William S. Wong
发明人： Steven E. Ready , William S. Wong
IPC分类号： B41J29/393
CPC分类号： H05K3/125 , H01L21/288 , H01L21/76838 , H01L23/544 , H01L2924/0002 , H01L2924/00
摘要： Printing systems are disclosed that produce homogenous, smooth edged printed patterns (such as integrated circuit (IC) patterns) by separating pattern layouts into discrete design layers having only parallel layout features, and by printing each design layer using individual print solution droplets deposited onto the substrate. A printhead alignment operation includes positioning the printhead and printing a spot onto the substrate from each ejector, determining a vertical offset between an expected location of each spot along a vertical axis and the actual location of the spot along the vertical axis, calculating a linear fit line for the vertical offset of each spot plotted against an expected location of the spot along a horizontal axis, calculating the slope of the linear fit line, and rotating the printhead relative to the substrate according to an angle defined by the slope of the linear fit line.
摘要翻译：打印系统被公开，通过分离图案布局成离散的设计层仅具有平行布局特征产生均匀，平滑边缘的印刷图案（诸如集成电路（IC）图案），并且通过使用沉积到各个打印溶液液滴打印每个设计层基质。打印头对准操作包括定位打印头并从每个喷射器将斑点印刷到基板上，确定沿着垂直轴线的每个光点的预期位置与光点沿着垂直轴的实际位置之间的垂直偏移，计算线性拟合每个点的垂直偏移的线对应于点沿水平轴的预期位置，计算线性拟合线的斜率，并且根据由线性拟合的斜率限定的角度相对于基底旋转打印头线。

75. 发明申请

US20100231637A1 Method For The Printing Of Homogeneous Electronic Material With A Multi-Ejector Print Head 有权
标题翻译：使用多功能喷头打印头打印均匀电子材料的方法
公开(公告)号：US20100231637A1
公开(公告)日：2010-09-16
申请号：US12787367
申请日：2010-05-25
申请人： Steven E. Ready , William S. Wong
发明人： Steven E. Ready , William S. Wong
IPC分类号： B41J29/393
CPC分类号： H05K3/125 , H01L21/288 , H01L21/76838 , H01L23/544 , H01L2924/0002 , H01L2924/00
摘要： Printing systems are disclosed that produce homogenous, smooth edged printed patterns (such as integrated circuit (IC) patterns) by separating pattern layouts into discrete design layers having only parallel layout features, and by printing each design layer using individual print solution droplets deposited onto the substrate. A printhead alignment operation includes printing a first spot from a first printhead ejector on a first substrate location, positioning a second ejector over the first substrate location and printing a second spot, measuring a distance between the first spot and the second spot, adjusting a rotational orientation between the print head and the substrate to reduce the distance between the first spot and the second spot, and then repeating the printing, measuring and adjusting processes until the first and second spots are separated by a predefined threshold value apart. The design layers are then printed.
摘要翻译：公开了印刷系统，其通过将图案布局分离成仅具有平行布局特征的离散设计层，并且通过使用沉积在该图案上的各个印刷液滴印刷每个设计层来产生均匀的平滑边缘印刷图案（例如集成电路（IC）图案）基质。打印头对准操作包括在第一基板位置上从第一打印头喷射器打印第一斑点，将第二喷射器定位在第一基板位置上并打印第二光斑，测量第一光斑和第二光点之间的距离，打印头和基板之间的取向以减小第一点和第二点之间的距离，然后重复打印，测量和调整过程，直到第一和第二点间隔一预定阈值。然后打印设计图层。

76. 发明申请

US20100158548A1 FLEXIBLE NANOWIRE SENSORS AND FIELD-EFFECT DEVICES FOR TESTING TONER 有权
标题翻译：灵活的纳米传感器和用于测试墨粉的场效应器件
公开(公告)号：US20100158548A1
公开(公告)日：2010-06-24
申请号：US12338310
申请日：2008-12-18
申请人： William S. Wong , Michael L. Chabinyc , Sanjiv Sambandan , Pengfei Qi
发明人： William S. Wong , Michael L. Chabinyc , Sanjiv Sambandan , Pengfei Qi
IPC分类号： G03G15/08
CPC分类号： G03G15/0848 , G03G15/08 , G03G15/5062 , G03G2215/0604
摘要： A system, including an improved sensor, for determining toner particle uniformity is described. The sensor measures toner particle charge, typically be having the charge on the toner particle control a current flow through the channel of a thin film transistor. By measuring the charge on many toner particles, the system determines whether sufficient toner degradation has occurred that the toner should be replaced. The sensor is particularly suitable for being formed on a thin diagnostic sheet that is input through the paper path of a printing system.
摘要翻译：描述了一种用于确定调色剂颗粒均匀性的系统，包括改进的传感器。传感器测量调色剂颗粒电荷，通常使调色剂颗粒上的电荷控制通过薄膜晶体管的通道的电流。通过测量许多调色剂颗粒上的电荷，系统确定是否发生了调色剂应该被更换的调色剂降解。传感器特别适合于形成在通过打印系统的纸张路径输入的薄诊断纸上。

77. 发明授权

US07649205B2 Self-aligned thin-film transistor and method of forming same 有权
标题翻译：自对准薄膜晶体管及其形成方法
公开(公告)号：US07649205B2
公开(公告)日：2010-01-19
申请号：US12130347
申请日：2008-05-30
申请人： Rene Lujan , William S. Wong
发明人： Rene Lujan , William S. Wong
IPC分类号： H01L29/04 , H01L31/00
CPC分类号： H01L29/42384 , H01L29/4908 , H01L29/66757
摘要： A method of manufacturing a thin-film transistor or like structure provides conductive “tails” below an overhang region formed by a top gate structure. The tails increase in thickness as they extend outward from a point under the overhang to the source and drain contacts. The tails provide a low resistance conduction path between the source and drain regions and the channel, with low parasitic capacitance. The thickness profile of the tails is controlled by the deposition of material over and on the lateral side surfaces of the gate structure.
摘要翻译：制造薄膜晶体管或类似结构的方法在由顶栅结构形成的突出部分下方提供导电“尾”。尾部的厚度随着它们从伸出的点向外延伸到源极和漏极触点而增加。尾部在源极和漏极区域和沟道之间提供低电阻传导路径，具有低寄生电容。尾部的厚度分布通过在栅极结构的上侧和外侧表面上沉积材料来控制。

78. 发明申请

US20090298240A1 SELF-ALIGNED THIN-FILM TRANSISTOR AND METHOD OF FORMING SAME 失效
标题翻译：自对准薄膜晶体管及其形成方法
公开(公告)号：US20090298240A1
公开(公告)日：2009-12-03
申请号：US12403309
申请日：2009-03-12
申请人： Rene Lujan , William S. Wong
发明人： Rene Lujan , William S. Wong
IPC分类号： H01L21/336
CPC分类号： H01L29/42384 , H01L29/4908 , H01L29/66757
摘要： A method of manufacturing a thin-film transistor or like structure provides conductive “tails” below an overhang region formed by a top gate structure. The tails increase in thickness as they extend outward from a point under the overhang to the source and drain contacts. The tails provide a low resistance conduction path between the source and drain regions and the channel, with low parasitic capacitance. The thickness profile of the tails is controlled by the deposition of material over and on the lateral side surfaces of the gate structure.
摘要翻译：制造薄膜晶体管或类似结构的方法在由顶栅结构形成的突出部分下方提供导电“尾”。尾部的厚度随着它们从伸出的点向外延伸到源极和漏极触点而增加。尾部在源极和漏极区域和沟道之间提供低电阻传导路径，具有低寄生电容。尾部的厚度分布通过在栅极结构的上侧和外侧表面上沉积材料来控制。

79. 发明授权

US07524768B2 Method using monolayer etch masks in combination with printed masks 失效
标题翻译：使用单层蚀刻掩模与印刷掩模组合的方法
公开(公告)号：US07524768B2
公开(公告)日：2009-04-28
申请号：US11388718
申请日：2006-03-24
申请人： Eugene M. Chow , William S. Wong , Michael Chabinyc , Jeng Ping Lu , Ana Claudia Arias
发明人： Eugene M. Chow , William S. Wong , Michael Chabinyc , Jeng Ping Lu , Ana Claudia Arias
IPC分类号： H01L21/302
CPC分类号： H01L21/302 , H01L21/0271 , H01L21/0273 , H01L27/124 , H01L27/1288 , H01L27/1292 , H01L29/66765
摘要： A method to pattern films into dimensions smaller than the printed pixel mask size. A printed mask is deposited on a thin film on a substrate. The second mask layer is selectively deposited onto the film, but not to the printed mask. A third mask is then printed onto the substrate to pattern a portion of the second mask. Certain solvents are then used to remove the printed mask but not the mask layer on the thin film. The mask layer is then used to form a pattern on the thin film in combination with etching. The features formed in the thin film are smaller than the smallest dimension of the printed mask. The coated mask layer can be a self-assembled mono-layer or other material that selectively binds to the thin film.
摘要翻译：将薄膜图案尺寸小于印刷像素掩模尺寸的方法。印刷的掩模沉积在基底上的薄膜上。第二掩模层选择性地沉积在膜上，而不是印刷在掩模上。然后将第三掩模印刷到基底上以对第二掩模的一部分进行图案化。然后使用某些溶剂去除印刷的掩模，而不是薄膜上的掩模层。然后将掩模层与蚀刻结合在薄膜上形成图案。形成在薄膜中的特征小于印刷掩模的最小尺寸。涂覆的掩模层可以是选择性地结合薄膜的自组装单层或其它材料。

80. 发明授权

US07514114B2 Detecting defective ejector in digital lithography system 失效
标题翻译：在数字光刻系统中检测有缺陷的喷射器
公开(公告)号：US07514114B2
公开(公告)日：2009-04-07
申请号：US11218416
申请日：2005-09-01
申请人： William S. Wong , Steven E. Ready , Ana Claudia Arias
发明人： William S. Wong , Steven E. Ready , Ana Claudia Arias
IPC分类号： C23C16/52 , B05D5/12
CPC分类号： B41J29/393
摘要： A digital lithography system prints a large-area electronic device by dividing the overall device printing process into a series of discrete feature printing sub-processes, where each feature printing sub-process involves printing both a predetermined portion (feature) of the device in a designated substrate area, and an associated test pattern in a designated test area that is remote from the feature. At the end of each feature printing sub-process, the test pattern is analyzed, e.g., using a camera and associated imaging system, to verify that the test pattern has been successfully printed. A primary ejector is used until an unsuccessfully printed test pattern is detected, at which time a secondary (reserve) ejector replaces the primary ejector and reprints the feature associated with the defective test pattern. When multiple printheads are used in parallel, analysis of the test pattern is used to efficiently identify the location of a defective ejector.
摘要翻译：数字光刻系统通过将整个设备打印过程划分成一系列离散特征打印子过程来打印大面积电子设备，其中每个特征打印子过程涉及将设备的预定部分（特征）打印在一个指定的基板区域以及远离该特征的指定测试区域中的关联测试图案。在每个特征打印子过程结束时，分析测试图案，例如使用相机和相关联的成像系统来验证测试图案是否已被成功打印。使用初级喷射器，直到检测到未成功打印的测试图案，此时次要（预留）喷射器取代主喷射器并重印与缺陷测试图案相关的特征。当并行使用多个打印头时，使用测试图案的分析来有效地识别有缺陷的喷射器的位置。

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